X-ray Spectroscopy for Planetary Surface Analysis and Future Trend

TX-선을 이용한 행성표면 분석기술과 향후 연구동향

  • Kim, Kyeong-Ja (Geological Research Division, Korea Institute of Geoscience and Mineral Resources) ;
  • Lee, Ju-Hee (Space Application & Future Technology Center, Korea Aerospace Research Institute) ;
  • Lee, Seung-Ryeol (Geological Research Division, Korea Institute of Geoscience and Mineral Resources) ;
  • Sim, Eun-Sup (Space Application & Future Technology Center, Korea Aerospace Research Institute)
  • 김경자 (한국지질자원연구원 국토지질연구본부) ;
  • 이주희 (한국항공우주연구원 우주응용 및 미래기술센터) ;
  • 이승렬 (한국지질자원연구원 국토지질연구본부) ;
  • 심은섭 (한국항공우주연구원 우주응용 및 미래기술센터)
  • Received : 2010.10.23
  • Accepted : 2010.11.19
  • Published : 2010.12.31

Abstract

Technology of surface investigation using X-ray is one of widely used technology nowadays. This technique has been numerously used for planetary surface investigations for both orbital and rover scientific instruments. Korea has a plan to send an orbiter and lander to the Moon by the early 2020s. Therefore, the time has come for Korean researchers to develop major scientific instruments and start to do research on basic research for the Moon. Because of this situation, we firstly investigate X-ray technology, which is essential as one of core techniques of planetary remote sensing from the orbit and ground. This paper presents the current status of planetary exploration using X-ray techniques and new development of worldwide X-ray technology which could be adapted for prospective planetary missions.

오늘날 X-선을 이용한 표면탐사기술은 널리 활용되는 기술의 하나이다. 또한 X-선 측정기술은 행성표면탐사를 위한 연구에서도 궤도선 및 주행장치 탑재용 과학장비로서도 성공적으로 활용된 예가 여러 차례 있었다. 우리나라는 2020년경 궤도선 및 착륙선을 이용한 달 탐사계획을 추진하고 있으며, 이에 맞추어 궤도 및 착륙선 탑재용 우선 순위 과학장비의 개발 및 달에 관한 기초연구를 해야 하는 실정이다. 따라서 X-선 측정기술을 이용한 행성탐사의 현황 및 이 분야의 기술 발전 전망에 대한 고찰을 하였다.

Keywords

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