• 한국재료학회지
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• 제10권1호
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• pp.21-28
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• 2000

내열금속인 W, Ti와 이들의 질화물인 $W_2$N, TiN 박막을 이용하여 탄화규소 ohmic 접촉을 연구하였다. 열처리 온도에 따른 고온 안정성과 전기적 특성 및 상호 확산 억제 특성을 고찰함으로써 이들 질화물의 고온에서 안정한 ohmic 접촉으로 이용가능성을 조사하였다. 새로운 유기화합물 원료인 bis-trimethylsilylmethane을 이용하여 화학기상 증착법으로 증착한 단결정 $\beta$-SiC 박막과 W이 가장 낮은 접촉 비저항, 2.17$\times$10(sup)-5Ω$\textrm{cm}^2$를 보였으며, Ti 계열은 상대적으로 높은 접촉 비저항 값을 나타내었다. 이들 전극 위에 산화 방지막으로 Pt 박막을 증착함으로써 전극의 산화를 막을 수 있었으며, 질화물 전극은 고온에서 금속접촉에 비해 안정한 전기적 특성을 나타내었고, 상호 확산 방지 특성 면에도 우수한 특성을 지니고 있음을 알 수 있었다.

• 한국전기전자재료학회논문지
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• 제16권12S호
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• pp.1175-1180
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• 2003

Transformer Coupled Plasma Chemical Vapor Deposited (TCP-CVD) silicon nitride (SiNx) is widely used as a gate dielectric material for thin film transistors (TFT). This paper reports the SiNx films, grown by TCP-CVD at the low temperature (30$0^{\circ}C$). Experimental investigations were carried out for the optimization o(SiNx film as a function of $N_2$/SiH$_4$ flow ratio varying ,3 to 50 keeping rf power of 200 W, This paper presents the dielectric studies of SiNx gate in terms of deposition rate, hydrogen content, etch rate and leakage current density characteristics lot the thin film transistor applications. And also, this work investigated means to decrease the leakage current of SiNx film by employing $N_2$ plasma treatment. The insulator layers were prepared by two step process; the $N_2$ plasma treatment and then PECVD SiNx deposition with SiH$_4$, $N_2$gases.

• 센서학회지
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• 제14권2호
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• pp.131-135
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• 2005

This paper describes the ohmic contact formation of single crystalline 3C-SiC thin films heteroepitaxially grown on Si(001) wafers. In this work, a TiW (Titanium-tungsten) film as a contact matieral was deposited by RF magnetron sputter and annealed with the vacuum and RTA (rapid thermal anneal) process respectively. Contact resistivities between the TiW film and the n-type 3C-SiC substrate were measured by the C-TLM (circular transmission line model) method. The contact phases and interface the TiW/3C-SiC were evaulated with XRD (X-ray diffraction), SEM (scanning electron microscope) and AES (Auger electron spectroscopy) depth-profiles, respectively. The TiW film annealed at $1000^{\circ}C$ for 45 sec with the RTA play am important role in formation of ohmic contact with the 3C-SiC substrate and the contact resistance is less than $4.62{\times}10^{-4}{\Omega}{\cdot}cm^{2}$. Moreover, the inter-diffusion at TiW/3C-SiC interface was not generated during before and after annealing, and kept stable state. Therefore, the ohmic contact formation technology of single crystalline 3C-SiC using the TiW film is very suitable for high temperature MEMS applications.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제53권10호
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• pp.505-509
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• 2004

The (Sr/sub 0.9/Ca/sub 0.1/)TiO₃(SCT) thin films are deposited on Pt-coated electrode(Pt/TiN/SiO₂/Si) using RF sputtering method at various substrate temperature. The optimum conditions of RF power and Ar/O₂ ratio were 140[W] and 80/20, respectively. Deposition rate of SCT thin film was about 18.75[Å/min]. The crystallinity of SCT thin films were increased with increase of substrate temperature in the temperature range of 100～500[℃]. The dielectric constant of SCT thin films were increased with the increase of substrate temperature, and changed almost linearly in temperature ranges of -80～+90[℃]. The current-voltage characteristics of SCT thin films showed the increasing leakage current as the substrate temperature increases.

• 반도체디스플레이기술학회지
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• 제6권3호
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• pp.41-45
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• 2007

The (SrCa)$TiO_3$(SCT) thin films were deposited on Pt-coated electrode(Pt/TiN/$SiO_2$/Si) using RF sputtering method according to the deposition condition. The crystallinity of SCT thin films were increased with increase of deposition temperature in the temperature range of $100{\sim}500[^{\circ}C]$. The optimum conditions of RF power and Ar/$O_2$ ratio were 140[W] and 80/20, respectively. Deposition rate of SCT thin films was about $18.75[{\AA}/min]$ at the optimum condition. The composition of SCT thin films deposited on Si substrate is close to stoichiometry (1.081 in A/B ratio). The maximum dielectric constant of SCT thin film was obtained by annealing at $600[^{\circ}C]$.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
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• pp.160-161
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• 2005

The $(Sr_{1-x}Ca_x)TiO_3$(SCT) thin films are deposited on Pt-coated electrode (Pt/TiN/$SiO_2$/Si) using RF sputtering method with substitutional contents of Ca. The optimum conditions of RF power and $Ar/O_2$ ratio were 140[W] and 80/20, respectively. Deposition rate of SCT thin film was about 18.75$[{\AA}/min]$. The dielectric constant was increased with increasing the substitutional contents of Ca, while it was decreased if the substitutional contents of Ca exceeded over 15[mol%]. All SCT thin films used in this study show the phenomena of dielectric relaxation with the increase of frequency, and the relaxation frequency is observed above 200[kHz].

• 한국진공학회지
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• 제6권S1호
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• pp.154-159
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• 1997

The crystal structure properties of TiN thin films deposited on SKD61 steel and Si(100) substrates by Ion Beam Assisted Deposition have been studied to clarify the thin film growth mechanism by using XRD, RBS, SEM, and AFM. The preferred orientation of TiN thin films changes from (111) to (100) as increasing the assisted energy. This tendency is independent of the substrate structure. The TiN thin film grow with (100) direction having surface free energy minimum as the assisted energy increases.

• 한국결정성장학회지
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• 제6권3호
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• pp.318-326
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• 1996

본 연구는 초고집적회로의 금속 배선으로써 보다 유용할 것으로 기대되는 구리박막의 화학적인 증착기술에 관한 것으로 precursor 물질로는 (hfac)Cu(I)VTMS ; (hevaflouoroacetylacetonate trimethyvinylsilane copper)로 명명된 금속 유기 물질을 사용하였다. 실험시스템의 초기 압력은 $10^{-6}$ Torr를 유지하고, 시스템의 챔버압력과 기판온도가 조정 가능하도록 설계, 제작되었다. 공정 조건에 따른 구리 박막 결정의 성장속도, Grain size, 전기적 성질을 측정하였다. 구리 박막을 증착하기 전에 W(tungsten) 또는 TiN(titanium nitride)이 증착되어 있는 실리콘 웨이퍼를 사용하였다. 본 연구에서는 $250^{\circ}C$이하의 상대적으로 낮은 실리콘 웨이퍼 온도에서의 실험이 가능하였으며 헬륨을 carrier gas로 사용하였는데 연구 결과 구리 박막 증착율이 $220^{\circ}C$에서 최대 $1,800\;{\AA}/분$으로 증가한 반면 표면 거칠기는 $200\;{\AA}$를 갖는 다결정 구리 박막을 관찰하게 되었다. 기판 온도가 $250^{\circ}C$이하일 때의 W(또는 TiN)과 $SiO_{2}$ 기판사이에서 구리 증착 선택성이 관찰되었으며, 최적의 기판 증착 온도는 약 $180^{\circ}C$와 반응용기 압력 0.8 Torr로 나타났다.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제52권10호
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• pp.436-440
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• 2003

The (S $r_{0.85}$C $a_{0.15}$)Ti $O_3$(SCT) thin films were deposited on Pt-coated electrode(Pt/TiN/ $SiO_2$/Si) using RF sputtering method according to the deposition condition. The optimum conditions of RF power and Ar/ $O_2$ ratio were 140[W] and 80/20, respectively. Deposition rate of SCT thin films was about 18.75[$\AA$/min] at the optimum condition. The composition of SCT thin films deposited on Si substrate is close to stoichiometry (1.102 in A/B ratio). The capacitance characteristics had a stable value within $\pm$4[%]. The drastic decrease of dielectric constant and increase of dielectric loss in SCT thin films were observed above 200[kHz]. SCT thin films used in this study showed the phenomena of dielectric relaxation with the increase of frequency.ncy.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2005년도 춘계학술대회 논문집
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• pp.106-109
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• 2005

The $(Sr_{1-x}Ca_x)TiO_3$(SCT) thin films are deposited on Pt-coated electrode (Pt/TiN/$SiO_2$/Si) using RF sputtering method with substitutional contents of Ca. The optimum conditions of RF power and Ar/$O_2$ ratio were 140[W] and 80/20, respectively. Deposition rate of SCT thin film was about 18.75[$\AA$/min]. The dielectric constant was increased with increasing the substitutional contents of Ca, while it was decreased if the substitutional contents of Ca exceeded over 15[mol%]. The capacitance characteristics had a stable value within ${\pm}4$[%] in temperature ranges of -80~+90[$^{\circ}C$].