• Title/Summary/Keyword: Van der Waals forces

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FGM micro-gripper under electrostatic and intermolecular Van-der Waals forces using modified couple stress theory

  • Jahangiri, Reza;Jahangiri, Hadi;Khezerloo, Hamed
    • Steel and Composite Structures
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    • v.18 no.6
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    • pp.1541-1555
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    • 2015
  • In this paper mechanical behavior of the functional gradient materials (FGM) micro-gripper under thermal load and DC voltage is numerically investigated taking into account the effect of intermolecular forces. In contrary to the similar previous works, which have been conducted for homogenous material, here, the FGM material has been implemented. It is assumed that the FGM micro-gripper is made of metal and ceramic and that material properties are changed continuously along the beam thickness according to a given function. The nonlinear governing equations of the static and dynamic deflection of microbeams have been derived using the coupled stress theory. The equations have been solved using the Galerkin based step-by-step linearization method (SSLM). The solution procedure has been evaluated against available data of literature showing good agreement. A parametric study has been conducted, focusing on the combined effects of important parameters included DC voltage, temperature variation, geometrical dimensions and ceramic volume concentration on the dynamic response and stability of the FGM micro-gripper.

Disjoining Process Isotherms for oil-water-oil Emulsion Films (오일-물-오일 에멜젼막의 Disjoining Pressure에 관한 연구)

  • 조완구
    • Journal of the Society of Cosmetic Scientists of Korea
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    • v.23 no.2
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    • pp.71-96
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    • 1997
  • We have used a novel liquid surface forces apparatus to determine the variation of disjoining pressure with film thickness for dodecane-water-dodecane emulsion films. The LSFA allows measurement of film thicknesses in the range 5-100 nm and disjoining pressure from 0-1500 Pa. Disjoining pressure isotherms are given for films stabilised by the nonionic surfactnat n-dodecyl pentaoxyethylene glycol ether$(C_{12}E_5)$ and n-decyl-$\beta$-D-glucopyranoside($C_{10}- $\beta$-Glu)$ and the anionic surfactant sodium bis(2-ethylhexyl) sulphosuccinate(AOT) in the presense of added electrolyte. For $C_{12}E_5$ and AOT, the emulsion films are indefinitely stable even for the highest concentration of NaCl tested (136.7 Nm) whereas the $C_{10}-{eta}-Glu$ film shows coalescence at this salt concentration. For film thicknesses greater than approximately 20 nm with all three surfactants, the disjoining pressure isotherms are reasonably well described in terms of electrostatic and van der Waals, forces. For the nonionic surfactant emulsion films, the charge properties of the monolayers are qualitatively similar to those seen for foam films. For AOT emulsion films, the monolayer surface potentials estimated by fitting the isotherms are similar to the values of the zeta potential measured for AOT stabilised emulsion droplets. For thin emulsion films certain systems showed isotherms which suggested the presence of an additional repulsive force with a range of approximately 20 nm.

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A Study on the Zeta Potential Measurement and the Stability Analysis of Nano Fluids using a Particle Image Processing System (입자 영상 처리 시스템을 이용한 콜로이드 입자의 제타포텐셜 측정 및 나노유체 분산 특성 연구)

  • Lee, J.K.;Kim, S.C.;Kim, H.J.;Lee, C.G.;Ju, C.H.;Lee, L.C.
    • Journal of ILASS-Korea
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    • v.8 no.1
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    • pp.16-22
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    • 2003
  • Zeta potential measurements of colloid particles suspended in a liquid are performed by a Zeta Meter developed. There are many applications of colloid stability in spray technology, paints, wastewater treatment, and pharmaceuticalse. Zeta potentials of charged particles are obtained by measuring the electrophoretic velocities of the particles using video enhanced microscopy and image analysis program. The values of zeta potential of polystyrene latex(PSL), $silica(SiO_2)$M, polyvinylidence difluoride(PVDF), silicon nitride, and alumina particles in deionized (DI) water were measured to be -40.5, -31.9, -25.2, -15.1 and -10.1mV, respectively. The particles having high zeta potential less than -20 mV are stable in DI water, because the double layers of them have strong repulsive forces mutually, and the particles having low zeta potential over -20mV are unstable due to Van Der Waals forces. Silica(>20nm), PSL, aluminum and PVDF particles were found to be stable that would remain separate and well disperse, while silicon nitride and alumina particles were found to be unstable that would gradually agglomerate in DI water.

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Refinement of the Structure of p-Dimethylaminobenzaldehyde 4-(p-Ethoxyphenyl) Thiosemicarbazone (p-Dimethylaminobenzaldehyde 4-(p-Ethoxyphenyl) Thiosemicarbazone구조의 정밀화)

  • Seo, Il-Hwan;Seo, Chu-Myeong;Park, Yeong-Ja
    • Korean Journal of Crystallography
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    • v.2 no.1
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    • pp.12-16
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    • 1991
  • C18H22N4OS, Mr=342.47, monoclinic, P2₁/c,a=11.802(2), b=31.962(2), c=9.829(2)A, β=100.12(1)˚, V=3694.8A3,F(000)=1472, Z=8, Dx=1.246 Mg m-3, Dm=1.17Mg m-3,λ=0.71073 A, μ=0.15mm-1, T=294 K. final R=0.0856 for 3718 observed reflection (Fo>3σ(Fo)) There are two molecules in an asymmetric unit and a major difference between these molecules is in the C(9)-N(1)-C(6)-C(7) torsion angles [58.8(8)˚and 1(1)˚]. Both molecules have intramolecular N(1)-H(10)'N(3) hydrogen bonds [ 2.613(7) and 2.566(7) A] and assume V-shaped conformation with N(2) atoms at the verices. The two independent molecules are linked by the two N(2)-H(11)'S' hydrogen bonds[3.367(5) A and 3.421(4)A] and the dimergen are held together by van der Waals forces.

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The Crystal and Molecular Structure of Piperidinothiosemicarbazide (Piperidinothiosemicarbazide의 結晶 및 分子構造)

  • Koo, Chung Hoe;Kim Hoon Sup;Chang Chong Hwan
    • Journal of the Korean Chemical Society
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    • v.19 no.2
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    • pp.85-91
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    • 1975
  • The crystal structure of piperidinothiosemicarbazide, $C_6H_{13}N_3S$, has been determined by single crystal X-ray analysis. The space group is P21/c with four molecules in the unit cell of dimensions $a=14.68{\pm}0.04,\;b=4.59{\pm}0.02,\;c=12.92{\pm}0.04{\AA}\;and\;{\beta}=109.4{\pm}0.2^{\circ}$. Three-dimensional photographic intensities were estimated visually. The structure has been solved by an interpretation of a Patterson synthesis and refined by block-diagonal least-squares methods to give a final R value of 0.14 for 378 observed independent reflections. There are two independent hydrogen bonds in the structure. One of them is of the type N-H${\ldots}$S with the length 3.28 and $3.39{\AA}$, and another is of the type N-H${\ldots}$N with the length $3.03{\AA}$. Apart from the hydrogen bonding system the molecules are held together in the crystal by van der Waals forces.

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The Crystal and Molecular Structure of (dl)-2-Benzyl-4-ethylester-5-(p-methylphenyl)-3H,5H,6H-1,2,6-thiadiazine-1,1-dioxide, $C_{20}H_{22}N_2O_4S$ ((dl)-2-Benzyl-4-ethylester-5-(p-methylphenyl)-3H,5H,6H-1,2,6-thiadiazine-1,1-dioxide, $C_{20}H_{22}N_2O_4S$의 結晶 및 分子構造)

  • Shin, Hyun-So;Kim, Euisung;Song, Hyun;Lee, Chai-Ho
    • Journal of the Korean Chemical Society
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    • v.39 no.5
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    • pp.344-349
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    • 1995
  • The crystal and molecular structure of the title compound has been determined from 2568 reflections collected on an automatic CAD4 diffractometer using graphite-monochromated $Mo-K\alpha$ radiation. The crystal is monoclinic system, space group $P2_1$ with unit cell dimensions $a=8.756(8)\AA$, $b=25.757(2)\AA$, $c=8.628(1)\AA$, $\beta=99.15(4)^{\circ}$, V= 1,921(2) ${\AA}^3$, Z=4, $D_C=1.336\;g/cm^3$, ${\mu}=1.54\;cm^{-1}\;and\;T=298^{\circ}K$. The final R factor was 0.051 for 2049 reflections over $3{\sigma}(Fο).$ The crystal has two asymmetric molecules in the unit cell. The arrangement of sulfon group was shown a distorted tetrahedron structure and N(6), N(6') atoms were deviated from the least-squares planes of the thiadiazine rings, respectively. The molecular packings in the unit cell are linked by the two intermolecular hydrogen bonds of N-H---O type and van der Waals forces.

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The Crystal Structure of Thiourea of Derivatives(I) (Thiourea Deirvatives의 결정과 분자구조 (제1보))

  • Park Young Ja;Suh Chung Sun;Koo, Chung Hoe
    • Journal of the Korean Chemical Society
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    • v.21 no.5
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    • pp.307-319
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    • 1977
  • The crystal structure of $N-({\alpha}-dimethyl\;{\beta}-hydroxy)ethyl\;N'-cyclohexyl\;thiourea,\;C_{ll}H_{22}N_2OS)$, has been determined by X-ray diffraction method. The compound crystallizes in the orthorhombic space group Pbca with a = 10.33(3), b = 11.82(3), c = 22.57(4)${\AA}$ and Z = 8. A total of 1414 observed reflections collected by the Weissenberg photographs and was solved by heavy atom method and refined by block diagonal least-squares methods to the R value of 0.13. The cyclohexane ring has a normal chair conformation and the thiourea unit is planar. The primary alcoholic group O-H bonded to C(l) makes an intramolecular hydrogen bond with N(2), which leads to stablize the molecule. There are two independent hydrogen bonds in the structure. One of them is of the type N-H${\cdot}{\cdot}{\cdot}$O intramolecular hydrogen bond with the length 2.71${\AA}$, another is of the type O-H${\cdot}{\cdot}{\cdot}$S intermolecular hydrogen bond with the length 3.21${\AA}$ parallel to the b axis. Apart from the hydrogen bonding system the molecules are held together by van der Waals forces in the crystal.

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Molecular Theory of Plastic Deformation (I). Theory (소성변형의 분자론 (제1보). 이론)

  • Kim Chang Hong;Ree Taikyue
    • Journal of the Korean Chemical Society
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    • v.21 no.5
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    • pp.330-338
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    • 1977
  • In order to elucidate the plastic deformation of solids, the following assumptions were made: (1) the plastic deformation of solids is classified into two main types, the one which is caused by dislocation movement and the other caused by grain boundary movement, each movement being restricted on a different shear surface, (2) the dislocation movement is expressed by a mechanical model of a parallel connection of various kinds of Maxwell dislocation flow units whereas the grain boundary movement is also expressed by a parallel connection of various kinds of Maxwell grain boundary flow units; the parallel connection in each type of movements indicates that all the flow units on each shear surface flow with the same shear rate, (3) the latter model for grain boundary movement is connected in series to the former for dislocation movement, this means physically that the applied stress distributes homogeneously in the flow system while the total strain rate distributes heterogeneously on the two types of shear planes (dislocation or grain boundary shear plane), (4) the movement of dislocation flow units and grain boundary units becomes possible when the atoms or molecules near the obstacles, which hinder the movement of flow units, diffuse away from the obstacles.Using the above assumptions in conjunction with the theory of rate processes, generalized equations of shear stress and shear rate for plastic deformation were derived. In this paper, four cases important in practice were considered.ted N${\cdot}{\cdot}{\cdot}$O hydrogen bond and the second of two normal N${\cdot}{\cdot}{\cdot}$O hydrogen bonds, both of which exist between the amino group and the perchlorate, groups. A p-phenylenediamine group is approximately planar within an experimental error and bonded to twelve perchlorates: ten perchlorates forming hydrogen bonds and two being contacted with the van der Waals forces. A perchlorate group is surrounded by six p-phenylenediamines and four perchlorates; among the six p-phenylenediamines, five of them are hydrogen-bonded, and the rest contacted with the van der Waals force.

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Organo-Compatible Gate Dielectrics for High-performance Organic Field-effect Transistors (고성능 유기 전계효과 트랜지스터를 위한 유기친화 게이트 절연층)

  • Lee, Minjung;Lee, Seulyi;Yoo, Jaeseok;Jang, Mi;Yang, Hoichang
    • Applied Chemistry for Engineering
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    • v.24 no.3
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    • pp.219-226
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    • 2013
  • Organic semiconductor-based soft electronics has potential advantages for next-generation electronics and displays, which request mobile convenience, flexibility, light-weight, large area, etc. Organic field-effect transistors (OFET) are core elements for soft electronic applications, such as e-paper, e-book, smart card, RFID tag, photovoltaics, portable computer, sensor, memory, etc. An optimal multi-layered structure of organic semiconductor, insulator, and electrodes is required to achieve high-performance OFET. Since most organic semiconductors are self-assembled structures with weak van der Waals forces during film formation, their crystalline structures and orientation are significantly affected by environmental conditions, specifically, substrate properties of surface energy and roughness, changing the corresponding OFET. Organo-compatible insulators and surface treatments can induce the crystal structure and orientation of solution- or vacuum-processable organic semiconductors preferential to the charge-carrier transport in OFET.

An Analysis of Particle-clumping Phenomena of a Charged Particle-type Reflective Electronic Display

  • Kim, Young-Cho
    • Transactions on Electrical and Electronic Materials
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    • v.13 no.4
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    • pp.212-214
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    • 2012
  • Both the electrically positive and negative particles in a cell of quick response-liquid powder display (QR-LPD) are surrounded by conductive electrodes on the upper and lower substrate and the dielectric materials of the barrier ribs. Particles in a cell are attached to or detached from the other materials by image force, electric field, Coulomb's force, and Van der Waals' force. Through these forces, the moving particles form an image but induce clumping phenomena. Particles having a large kinetic energy by a large q/m value crash into the opposite electrode with high speed at a large driving voltage and quickly lose electrically charged material. As a result, these particles are clumped and degrade panel performance. The clumped particles in a cell are observed by microscopic photographs and ascertained by a response time. When the bias voltage is increased to 0.68-0.76 $V/{\mu}m$, particle clumping occurs abruptly and the response time increases sharply. This particle clumping is similarly observed after the number of driving times at the driving voltage (0.42-0.64 $V/{\mu}m$).