• KEPCO Journal on Electric Power and Energy
• /
• v.7 no.2
• /
• pp.309-316
• /
• 2021

For the detection of the state of charge in VRFB-ESS, the analyses of UV-Visible spectrometry and the measurements of potential between the anolyte and catholyte were used in parallel. This paper includes the production of 4-valant ion from VOSO4 powder, 3- and 5-valant ions from electrochemical charge of 4-valant ion and 2-valant ion from 3-valant ion. It also includes the analyses of these valance ions and unknown electrolyte at any time using UV-Visible spectrometry. Through the analyses of the valance ions in samples, the SOCs of the samples at any charge-discharge times were verified.

• Analytical Science and Technology
• /
• v.21 no.2
• /
• pp.143-147
• /
• 2008

U(IV) ion, the valance state of uranium presumed at in a deep-depth disposal of a spent fuel, was prepared and separated from U(VI) ion. In order to prepare U(IV) ion, tests were performed by adding several reducing agents into a uranyl solution or by dissolution of uranium oxide in a mixed acid added with a reducing agent. The valance states of the uranium in the prepared solutions were identified by separating two ions with a Dowex AG 50W-X8 cation exchange resins and measuring the solutions using a laser-induced fluorescence spectroscopy. However, U(IV) and U(VI) were not separated by a Lichroprep Si60 exchange resin in the same separation condition of Pu(IV) and Pu(VI).

• Korean Journal of Soil Science and Fertilizer
• /
• v.38 no.5
• /
• pp.238-246
• /
• 2005

We conducted this investigation to observe competitive adsorption phenomena among the heavy metals onto the available sorption sites of soil particle surfaces in sandy clay loam and clay soil collected from Nonsan city, Chungnam and Yoosung, Daejeon in Korea, respectively. Polluted and contaminated soils can often contain more than one heavy metal species, resulting in competition for available sorption sites among heavy metals in soils due to complex competitive ion exchange and specific sorption mechanism. And the adsorption characteristics of the heavy metals were reported that the selectivity for the sorption sites was closely related with electropotential and electro negativity carried by the heavy metals. The heavy metals were treated as single, binary and ternary systems as bulk solution phase. Adsorption in multi-element system was different from single-element system as Cr, Pb and Cd. The adsorption isotherms showed the adsorption was increased with increasing equilibrium concentrations. For binary and ternary systems, the amount of adsorption at the same equilibrium concentration was influenced by the concentration of individual ionic species and valence carried by the respective heavy metal. Also we found that the adsorption isotherms of Cd and Pb selected in this experiment were closely related with electronegativity and ionic potential regardless number of heavy metals in solution, while the adsorption of Cr carried higher valance and lower electro negativity than Cd and Pb was higher than those of Cd and Pb, indicating that adsorption of Cr was influenced by ionic potential than by electronegativity. Therefore adsorption in multi-element system could be influenced by electronegativity and ionic potential and valance for the same valance metals and different valance, respectively. But it still needs further investigation with respect to ionic strength and activity in multi-element system to verify sorption characteristics and reaction processes of Cr, especially for ternary system in soils.

• Transactions on Electrical and Electronic Materials
• /
• v.6 no.5
• /
• pp.229-232
• /
• 2005

Direct characterization of band alignment at chemical bath deposition $(CBD)-CdS/Cu_{0.93}(In_{1-x}Ga_x)Se_2$ has been carried out by photoemission spectroscopy (PES) and inverse photoemission spectroscopy (IPES). Ar ion beam etching at the condition of the low ion kinetic energy of 400 eV yields a removal of surface contamination as well as successful development of intrinsic feature of each layer and the interfaces. Especially interior regions of the wide gap CIGS layers with a band gap of $1.4\~1.6\;eV$ were successfully exposed. IPES spectra revealed that conduction band offset (CBO) at the interface region over the wide gap CIGS of x = 0.60 and 0.75 was negative, where the conduction band minimum of CdS was lower than that of CIGS. It was also observed that an energy spacing between conduction band minimum (CBM) of CdS layer and valance band maximum (VBM) of $Cu_{0.93}(In_{0.25}Ga_{0.75})Se_2$ layer at interface region was no wider than that of the interface over the $Cu_{0.93}(In_{0.60}Ga_{0.40})Se_2$ layer.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2010.02a
• /
• pp.420-420
• /
• 2010

AC PDP에서 유전체 보호막으로 사용되는 MgO 박막은 높은 이차전자방출계수($\gamma$)로 인해 방전전압을 낮춰주는 중요한 역할을 하고 있다. 이러한 MgO 보호막의 이차전자방출계수를 증가시키기 위해 MgO 의 Energy Band Structure 규명이 중요한 연구 주제가 되고 있다. MgO의 이차전자방출계수($\gamma$)는 Auger 중화 이론에 의해 방출 메커니즘이 설명이 되고, 그 원리는 다음과 같다. 고유의 이온화 에너지를 가진 이온이 MgO 표면에 입사 되면, Tunneling Effect에 의해 전자와 이온 사이에 중화가 일어나고, 중화가 되고 남은 에너지가 MgO Valance Band 내의 전자에게 전달되면 이때 남은 에너지(${\Delta}E$)가 MgO의 일함수(Work function) 보다 크게 되면 이차전자로 방출된다. 본 실험 에서는 $\gamma$-FIB System을 이용하여 결정 방향이 (100), (110), (111)을 갖는 Single Crystal MgO에 이온화 에너지가 24.58eV인 He Ion source를 주사 하였을 때 Auger self-convolution을 통해 이차전자의 운동 에너지 분포를 구하고, 이를 통해 MgO 내의 Energy Band Structure를 실험적으로 측정하였다. 이를 통해 MgO Single Crystal의 일함수 및 Defect Level의 분포를 확인하였다.

• Korean Journal of Materials Research
• /
• v.14 no.4
• /
• pp.293-299
• /
• 2004

Transition metal ions doped $TiO_2$ nanostructured powders were prepared with simply heating aqueous $TiOCl_2$ solutions, contained various metal ions (Ni, Al, Fe, Zr, and Nb) of 1.47 mol% added as metal-chlorides, at $100^{\circ}C$ for 4 hrs by homogeneous precipitation process under suppressing conditions of water vaporization. The characterizations for prepared $TiO_2$ powders were carried out to observe doping of metal ions, their concentrations and microstructures using XRD, UV-VIS (DRS), XPS, SEM, TEM and ICP. Also, photo-oxidative abilities were evaluated by decomposition of 4-chlorophenol (4CP) under ultraviolet light irradiations. No secondary oxide phases were formed in all the $VTiO_2$ powders, showing doping with various transition metal ions. When adding ions ($Ni^{2+}$ or$ Al^{3+ }$ and $Zr^{4+}$ ) having valance states or ionic radii greatly different from those of $Ti^{4+}$ , the $TiO_2$ powders of mixed anatase and rutile phases were formed, whereas in the case of additions of $^Fe{3+ }$ and $Nb^{ 5+}$ as well as no addition of metal ion the powders with pure rutile phase alone were formed. Among the prepared $TiO_2$ powders, Ni$^{2+}$ doped $TiO_2$ powders, containing a small amount of anatase phase, showed excellent photo-oxidative ability in 4CP decomposition because of relative decreases in electron-hole recombination and poisoning of $TiO_2$ surface during the photoreaction.n.

• Environmental Sciences Bulletin of The Korean Environmental Sciences Society
• /
• v.4 no.3
• /
• pp.173-183
• /
• 2000

This study measured the zeta potential of both latex colloidal particles with carboxylate surface groups and glass beads (collectors) with silanol surface group employing various solution with different chemical characteristics. The results have been compared with the surface chemistry theory. The zeta potential of the particle and collector increased with increasing pH up to 5.0 regardless of the solution chemistry. For a monovalent electrolyte solution(sodium chloride solution) the zeta potential steadily increased until the pH reached 9.5. In contrast, little change in zeta potential was made between 5.0 and 9.5 for a divalent electrolyte solution (sodium chloride solution) the zeta potential steadily increased until the pH reached 9.5. In contrast, little change in zeta potential was made between 5.0 and 9.5 for a divalent electrolyte solution (calcium chloride solution). In other words, the more the pH decreases, the larger the effect of neutral salts, such as NaCl and CaCl$_2$, have on the ζ-potential values. In this study, the PZPC(point of zero proton condition) of the particle and collector occurred below a pH of 3.1, H(sup)+ and OH(sup)- acted as a PDI (potential determining ion), and Na(sup)+ acted as an IDI(indifferent ion). The magnitude of the negative ζ-potential values of the particle and collector monotonically increased as the concentrations of Na(sup)+ or Ca(sup)2+([Na(sup)+] or [Ca(sup)2+]) decreased (the values of pNa or pCa increased). In the case of latex particles, the ζ-potential should aproach zero (isoelectric point; IEP) asymptotically as the pNa approaches zero, while in the case of calcium chloride electrolyte, ζ-potential reversal may be expected to occur around 3.16$\times$10(sup)-2MCaCl$_2$(pCa=1.5). pH, valance and ionic strength can be used in various ways to improve the water treatment efficiency by modifying the charge characteristics of the particle and collector. Predictive capability is far less certain when EDL(electrical double layer) repulsive forces exist between the particle and collector.

• Journal of Korean Society of Occupational and Environmental Hygiene
• /
• v.10 no.1
• /
• pp.32-44
• /
• 2000

The practice of welding stainless steel is known to produce various valance states of chromium. $CO_2$ flux cored arc welding on stainless was performed in fume collection chamber. Content of total chromium and hexavalent chromium in fumes, content of hexavalent chromium in total chromium, solubility of hexavalent chromium were investigated. Content of total chromium in fumes increases from 2~3% to 7~9% as a function of input energy, but hexavalent chromium, less than 1.2% in fumes, is not related to input energy. Hexavalent chromium in fumes exists as solubles up to 90%. Content of total chromium in flux cored arc welding fumes and solubility of hexavalent chromium are similar to shielded metal arc welding fumes, but content of hexavalent chromium is similar to metal inert gas welding fumes. These characteristics are relevant to flux of wires and $CO_2$ shielding gas.

• Proceedings of the Korean Vacuum Society Conference
• /
• 1999.07a
• /
• pp.83-83
• /
• 1999

본 연구에서는 Auger Elecrtron Spectroscopy (AES) 장비를 이용하여 Silicone Wafer 표면에 BF 이온을 주입시킨 후 Dopping 농도 및 Implantation 에너지에 따른 Si KLL Peak의 변화를 관찰하였다. 또한 PVD Ti 계열 화학물의 시료에 대하여 Peak의 Shape 변화를 관찰하였다. 1)Dopping 농도 및 Implantation 에너지에 따른 Si KLL Peak의 변화 관찰 일반적으로 Silicone 기판에 Arsenic(3가)을 Dopping 하였을 경우, Si KLL Peak의 Kinetic Energy 값은 순수 Si Peak보다 더 작은 값으로 Shift 하며, Boron (5가)을 Dopping하였을 경우에는 더 큰 값으로 Shift 한다. 이론적으로 N-type Si의 에너지 차이는 약 1.0eV로 보고되어 있으며, AES를 이용하여 실험적으로 측정된 값은 약 0.6eV정도로 알려져 있다. 이러한 차이는 Dopping 농도에 따라 Valance Band의 에너지 값이 변화하기 때문이라고 알려져 있다. 본 연구에서는 BF2를 Si에 이온 주입하여 입사 에너지 및 dose 량에 따른 Si KLL Peak의 변화를 관찰하였다. 그림1과 같이 Si KLL Peak는 Implantation Energy가 작을수록 Kinetic Energy가 높은 곳으로 Shift 한다. 이는 LOw Energy로 이온 주입하면, Projected Range (Rp)가 High Energy로 이온 주입할 때보다 작기 때문이며, 이 결과를 Secondary Ion Mass Spectroscopy (SIMS) 및 TRIM simulation을 이용하여 확인하였다. 또한 표면에서의 전자 Density의 변화와 Implantation energy와의 관계를 시료의 표면에서 반사되어 나오는 전자의 에너지 손실(Reflected Electron Energy Loss Spectroscopy:REELS)을 통하여 고찰하였다. 2) PVD Ti 계열화합물의 시료에 대한 peak의 shape 가 변화하며, TiL3M23V (Ti2) 및 TiL3M23M23 (Til) Peak의 Intensity Ratio가 변화한다. 따라서 본 연구에서는 그림 2와 같이 Ti 결합 화합물에서의 Ti Auger Peak의 특성 에너지 값과 Peak Shape를 관찰하여, AES를 이용하여 Ti 계열의 화합물에 대한 Chemical state 분석의 가능성을 평가하였다.

• Journal of the Korea Academia-Industrial cooperation Society
• /
• v.19 no.1
• /
• pp.603-608
• /
• 2018

Although the voltage-applied discharge method is most widely used in the semiconductor and display industries, periodic management costs are incurred because the method causes defects due to the absorption of ambient fine dust and causes emitter tip contamination due to the discharge. The emitter tip contamination problem is caused by the accumulation of fine particles in ambient air due to the corona discharge of the ionizer. Fuzzy ball generation accelerates the wear of the emitter tip and deteriorates the performance of the ionizer. Although a mechanical cleaning method using a manual brush or an automatic brush is effective for contaminant removal, it requires management of additional mechanical parts by the user. In some cases, contaminants accumulated in the emitter may be transferred to the wafer or product. In order to solve this problem, we developed an ionizer for a clean environment that can remove the pencil-type emitter tip and directly ionize the surrounding gas molecules using the tungsten wire located inside the ion tank. As a result of testing and certification by the Korea Institute of Machinery and Materials, the average concentration was $0.7572particles/ft^3$, the decay time was less than two seconds, and the ion valance was 7.6 V, which is satisfactory.