• Title/Summary/Keyword: Ultrawide bandgap

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CO2 Reduction and C2H4 Production Using Nanostructured Gallium Oxide Photocatalyst (산화갈륨 나노구조 광촉매 특성을 이용한 이산화탄소 저감 및 에틸렌 생성 작용)

  • Seo, Dahee;Ryou, Heejoong;Seo, Jong Hyun;Hwang, Wan Sik
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.35 no.3
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    • pp.308-310
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    • 2022
  • Ultrawide bandgap gallium oxide (Ga2O3) semiconductors are known to have excellent photocatalytic properties due to their high redox potential. In this study, CO2 reduction is demonstrated using nanostructured Ga2O3 photocatalyst under ultraviolet (254 nm) light source conditions. After the CO2 reduction, C2H4 remained as a by-product in this work. Nanostructured Ga2O3 photocatalyst also showed an excellent endurance characteristic. Photogenerated electron-hole pairs boosted the CO2 reduction to C2H4 via nanostructured Ga2O3 photocatalyst, which is attributed to the ultrawide and almost direct bandgap characteristics of the gallium oxide semiconductor. The findings in this work could expedite the realization of CO2 reduction and a simultaneous C2H4 production using a low cost and high performance photocatalyst.

Bandgap Control of (AlxGa1-x)2O3 Epilayers by Controlling Aqueous Precursor Mixing Ratio in Mist Chemical Vapor Deposition System (미스트화학기상증착시스템의 전구체 수용액 혼합비 조절을 통한 (AlxGa1-x)2O3 에피박막의 밴드갭 특성 제어 연구)

  • Kim, Kyoung-Ho;Shin, Yun-Ji;Jeong, Seong-Min;Bae, Si-Young
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.32 no.6
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    • pp.528-533
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    • 2019
  • We investigated the growth of $(Al_xGa_{1-x})_2O_3$ thin films on c-plane sapphire substrates that were grown by mist chemical vapor deposition (mist CVD). The precursor solution was prepared by mixing and dissolving source materials such as gallium acetylacetonate and aluminum acetylacetonate in deionized water. The [Al]/[Ga] mixing ratio (MR) of the precursor solution was adjusted in the range of 0~4.0. The Al contents of $(Al_xGa_{1-x})_2O_3$ thin films were increased from 8 to 13% with the increase of the MR of Al. As a result, the optical bandgap of the grown thin films changed from 5.18 to 5.38 eV. Therefore, it was determined that the optical bandgap of grown $(Al_xGa_{1-x})_2O_3$ thin films could be effectively engineered by controlling Al content.