• Proceedings of the Korean Society of Precision Engineering Conference
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• 1995.10a
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• pp.415-418
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• 1995

This paper describes a new technique for thickness measurement of a very thin layer less than one-quarter of the wavelength of ultrasonic wave using ultrasonic pulse-echo method. The technique determines the thickness of a thin layer in a layered medium form the amplitudes of the total reflected waves from the back side layer of interst. Thickness of a very thin layer few inch deep inside the media can be measured without using a very high frequency ultrasonic transducer over 100MHz which must be used in the conventional techniques for the precision measurement of a thin layer. The method also requires no inversion process to extract the thickness from the waveform of the reflected waves, so that it makes possible on-line measurement of the thickness of the layer.

• Journal of the Korean Society for Nondestructive Testing
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• v.23 no.6
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• pp.577-582
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• 2003

This paper describes a new technique for thickness measurement of a very thin layer less than one-quarter of the wavelength of ultrasonic wave used in the ultrasonic pulse-echo measurements. The technique determines the thickness of a thin layer in a tapered medium from constructive interference of multiple reflection waves. The interference characteristics are derived and investigated in theoretical and experimental approaches. Modified total reflection wave g(t) defined as difference between total and first reflection waves increases in amplitude as the interfacial layer thickness decreases down to zero. A layer thickness less than one-tenth of the ultrasonic wavelength is measured using the maximum amplitude of g(t) with a good accuracy and sensitivity. The method also requires no inversion process to extract the thickness information from the waveforms of reflected waves, so that it makes possible to have the on-line thickness measurement of a thin layer such as a lubricating oil film in thrust bearings and journal bearings during manufacturing process.

• Journal of the Korean Society for Nondestructive Testing
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• v.19 no.5
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• pp.363-368
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• 1999

Ultrasonic pulse-echo methods measuring the transit time through specimens have been widely used in determination of ultrasonic velocity and thickness of specimens. Usually, to determine the velocity of the ultrasonic. the transit time of the ultrasonic pulse through specimen is measured by using the ultrasonic measuring equipment such as the oscilloscope including ultrasonic pulser/receiver and the thickness of the specimen is measured by using the length measuring instrument such as micrometer or vernier calipers etc., i. e. each parameter is measured by using each measuring method. In the case of the measuring the thickness of a specimen by using the ultrasonics. the ultrasonic equipments, which measure the thickness, such as the ultrasonic thickness gauge must be calibrated by using the reference block of which the ultrasonic velocity is known beforehand. In the present work, we proposed a new method for simultaneous measurement of ultrasonic velocity and thickness without reference blocks. Experimental results for several specimens show that proposed method have good agreements with those by traditional ultrasonic method.

• Nuclear Engineering and Technology
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• v.54 no.1
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• pp.186-192
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• 2022

Flow accelerated corrosion (FAC) is a type of pipe corrosion in which the pipe thickness decreases depending on the fluid flow conditions. In nuclear power plants, FAC mainly occurs in the carbon steel pipes of a secondary system. However, because the temperature of a secondary system pipe is over 150 ℃, in situ monitoring using a conventional ultrasonic non-destructive testing method is difficult. In our previous study, we developed a waveguide ultrasonic thickness measurement system. In this study, we applied a waveguide ultrasonic thickness measurement system to monitor the thinning of the pipe according to the change in pH. The Korea Atomic Energy Research Institute installed FAC-proof facilities, enabling the monitoring of internal fluid flow conditions, which were fixed for ~1000 h to analyze the effect of the pH. The measurement system operated without failure for ~3000 h and the pipe thickness was found to be reduced by ~10% at pH 9 compared to that at pH 7. The thickness of the pipe was measured using a microscope after the experiment, and the reliability of the system was confirmed with less than 1% error. This technology is expected to also be applicable to the thickness-reduction monitoring of other high-temperature materials.

• Journal of the Korean Society for Nondestructive Testing
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• v.12 no.1
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• pp.9-15
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• 1992

Ultrasonic spectroscopy is likely to become a very powerful NDE method for detection of microfects and thickness measurement of thin film below the limit of ultrasonic distance resolution in the opaque materials, provides a useful information that cannot be obtained by a conventional ultrasonic measuring system. In this paper, we considered a thin film below the limit of ultrasonic distance resolution sandwitched between two substances as acoustical analysis model, demonstrated the usefulness of ultrasonic spectroscopic analysis technique using information of ultrasonic frequency for measurements of thin film thickness, regardless of interference phenomenon and phase reversion of ultrasonic waveform. By using frequency intervals(${\triangle}f$) of periodic minima from the ratio of reference power spectrum of reflective waveform obtained a sample to power spectrum of multiple reflective waves obtained interference phenomenon caused by ultrasonic waves reflected at the upper and lower surfaces of a thin layer, can measured even dimensions of interest are smaller than the ultrasonic wave length with simplicity and accuracy.

• Transactions of the Korean Society of Automotive Engineers
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• v.14 no.2
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• pp.67-75
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• 2006

In this paper, the compensation of ultrasonic scattering on interface crack depending on thickness variations of A1/Epoxy bonded dissimilar components was applied to improve measuring accuracy by using ultrasonic attenuation coefficient. The optimum conditions of theoretical value and experimental measuring accuracy by the ultrasonic method in A1/Epoxy bonded dissimilar components have been investigated. From the experimental results, the measurement method of interfacial crack lengths by using ultrasonic attenuation coefficient was proposed and discussed. After the ultrasonic scattering compensation depending on thickness variations of bonded dissimilar components was carried out, the measuring accuracy of interfacial crack length was improved by 5%.

• Transactions of the Korean Society for Noise and Vibration Engineering
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• v.26 no.2
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• pp.148-156
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• 2016

The paper deals with improvement of a piezoelectric ultrasonic transducer for measuring both pipe thickness and flow velocity. The transducer structure is based on the conventional transducers for measuring flow velocity by obliquely transmitting ultrasonic waves to the flow direction. The transducer invented earlier for measuring flow velocity and pipe thickness had an advantage of including only one piezoelectric disc, but for the thickness measurement the ultrasonic wave had to be reflected twice in a wedge material to be transmitted vertically to a pipe, and thus the wave signal was too weak. The transducer has been improved to transmit waves for thickness measurement vertically to a pipe without any prior reflection by electrically connecting two piezoelectric discs, one for flow velocity and the other for pipe thickness measurement. By comparing the measured results of specimen thickness with the improved transducer and conventional transducers, the accuracies of the improved one have been evaluated in the pipe thickness measurements.

• Transactions of the Korean Society for Noise and Vibration Engineering
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• v.25 no.8
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• pp.559-567
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• 2015

The paper deals with an ultrasonic transducer invented for measuring both flow velocity and pipe thickness. The structure of the transducer is based on the conventional transducers for measuring flow velocity by obliquely transmitting ultrasonic waves to the flow direction. The transducer additionally generates ultrasonic waves transmitting vertically to a pipe for measuring pipe thickness. By measuring flow velocity with the invented transducer and a conventional oblique-incidence transducer and comparing their results, the accuracy of the flow velocity measurement of the invented one was evaluated. By measuring specimen thickness with the invented transducer and a conventional normal-incidence transducer and comparing their results, the accuracy of the thickness measurement of the invented one was evaluated.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 1999.10a
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• pp.476-481
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• 1999

This paper describes a new technique for measurement of the displacement less than one-quarter of the wavelength of ultrasonic wave using ultrasonic pulse-echo method. The technique determines the displacement of a journal bearing from the amplitudes of the total reflected waves from the surface of journal inside the bearing. Vibration of journal bearing can be measured without using a very high frequency ultrasonic transduce over 100MHz which must be used in the conventional techniques for the precision measurement of a small displacement. The method also requires no inversion process to extract the thickness from the waveforms of the reflected waves, so that it makes possible on-line measurement of the vibration of journal bearing.

• Journal of the Korean Society for Nondestructive Testing
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• v.7 no.2
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• pp.27-34
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• 1988

Recently, it is gradually raised necessity that thickness of thin film is measured accurately and managed in industrial circles and medical world. In this study, regarding to the thickness of film which is in opaque object and is beyond distance resolution capacity, thickness measurement was done by MEM-cepstrum analysis of received ultrasonic wave. In measurement results, film thickness which is beyond distance resolution capacity was measured accurately. And within thickness range that don't exist interference, thickness measurement by MEM-ceptrum analysis was impossible.