• Transactions on Electrical and Electronic Materials
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• v.18 no.6
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• pp.316-319
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• 2017

A new approach to improving the electrical characteristics and optical response of a polysilicon-based metal-semiconductor-metal (MSM) photodetector is proposed. To understand the cause of current restriction in the MSM photodetector, modified trap mechanisms are suggested, which include interfacial electron traps at the metal/polysilicon interface and silicon dangling bonds between silicon crystallite grains. Those traps were passivated using hydrogen ion implantation with subsequent post-annealing. Photodetectors that were ion-implanted under optima conditions exhibited improved photoconductivity and reduced dark current instability, implying that the hydrogen bonds in the polysilicon influence the simultaneous decreases in the density of dangling bonds at grain boundaries and the trapped positive charges at the contact interface.

• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.175.1-175.1
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• 2014

Despite growing interest in Ge as a possible alternative to Si, reliable data on Ge surface has been relatively scarce. Using low temperature scanning tunneling microscopy (STM), we investigate band-bending effects of localized charge traps at Ge(001) surface at 78 K. For this investigation, we prepared nearly defect-free Ge(001) surface by keeping the background pressure to < $1{\times}10^{-10}$ mbar during outgassing. Ge(001) surfaces this obtained exhibit a flat-band condition, and deposition of charge traps induce a distinct, sharp boundary between pinned and depinned surface area in the constant current mode STM images. We will show the tip-surface interaction plays an essential role in producing the boundary, and discuss about the conditions that enable the pinning effect.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1994.11a
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• pp.46-49
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• 1994

In this paper we investigate the characteristics of switching and memory traps in sealed MONOS nonvolatile memory devices with different nitride thicknesses. We have demonttrated flatband voltage shift of 1V with 5V programming voltage. By fitting the experimental observations with theoretical calculations, trap density and capture cross section of memory trap at the nitride-blocking oxide interface are estimated to be 1.0${\times}$10$\^$13/ cm$\^$-2/ and 8.0${\times}$10$\^$14/ cm$\^$-2/

• Journal of environmental and Sanitary engineering
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• v.17 no.1
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• pp.1-11
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• 2002

The results of adult mosquitoes collection at Uijeongbu-si, Dongducheon-si in Gyeonggi-do where malaria outbreak occur in Korea are presented. Light traps collection were operated for adult collection from April to October, 2001. Among the total 12 species comprising 4 genera, 4 species in Anopheles, 3 species in Aedes, 1 species in Armigeres and 4 species in Culex were identified in the collection using the black light traps. The adult population densities of Anopheles sinensis peaked at an average of 200 in Gwangam-dong, Dongduchen-si in July and an average an average of 977 in Songsan-dong, Uijeongbu-si in August. Nocturnal Activities of Anopheles sinensisn peaked at between 22:00 ∼23:00(21.0%) and 16.4% between 21:00 and 22:00, 13.1% between 23:00 and 24:00, 13.0% between 20:00 and 21:00, 11.7% between 24:00 and 01:00 in averages.

• Journal of the Korean Institute of Telematics and Electronics T
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• v.35T no.1
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• pp.29-32
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• 1998

The low level leakage currents in silicon oxides were investigated. The low level leakage currents were composed of a transient component and a do component. The transient component was caused by the tunnel charging and discharging of the stress generated traps nearby two interfaces. The do component was caused by trap assisted tunneling completely through the oxide. The low level leakage current was proportional to the number of traps generated in the oxides. The low level leakage current may be a trap charging and discharging current. The low level leakage current will affect data retention in EEPROM.

• The Korean Journal of Ecology
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• v.21 no.6
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• pp.809-814
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• 1998

Changes of annual seed production related to climate change were studied for 12 years in Piagol, a riparian valley in Mt. Jiri. Sixty-four seed traps (sized 0.5 ${\times}$ 0.5 $m^{2}$) were set up on the forest floor of surveyed area. Seeds were collected from these traps at an interval of 15 days from September to November since 1984. Vegetation of the study area was mainly consisted of the naturally regenerated Carpinus tschonoskii in the tree layer. Acer mono, Quercus serrata, Carpinus laxiflora and Symplocos chinensis also appeared in the same layer. Maximum production occurred in 1984 and 1994. As a result of comparing seed production with local climate factors for 12 years, seed productivity and the year of maximum production of Carpinus forest were merely related with precipitation, air temperature and duration of sunshine among local climate factors. Duration of sunshine was, however, not contributed to periodically high productivity of seed of riparian valley carpinus forest.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2002.11a
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• pp.575-578
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• 2002

In this paper, we discuss carrier trapping model and trap characteristics of nitrided oxide thin film. Based on the experimental results, the carrier trapping model for system having multi-traps is proposed and is fitted with experimental data in order to determine trap parameter of nitride oxide and O2 annealed nitrided oxide. As a results of curve fitting, the heavy nitridation of oxide introduces three kinds of traps with capture cross section $\sigma$n1=1.48$\times$10$^{-17}$ $\textrm{cm}^2$, $\sigma$n2=1.51$\times$10$^{-19}$ $\textrm{cm}^2$, $\sigma$p=1.53$\times$10$^{-18}$ $\textrm{cm}^2$ and corresponding trap densities Nnl=2.66$\times$10$^{12}$ Cm$^{-2}$ , Nn2=1.32$\times$10$^{12}$ Cm$^{-2}$ , Np=8.35$\times$10$^{12}$ Cm$^{-2}$ .

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2018.10a
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• pp.512-513
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• 2018

Trap-assisted-tunneling (TAT) degrades subthreshold slope of real-world tunneling field-effect-transistors (TFET) and it should be considered in the simulation. However, its mechanism is not very well understood in line tunneling type L-shaped TFET (LTFET). This study investigates TAT mechanism in LTFETs using dynamic nonlcoal Schenk model. Both phonon assisted and direct band to trap tunneling events are considered in this study.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.11a
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• pp.492-496
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• 2001

Due to their better photosensitivity in X-ray, the amorphous selenium based photoreceptor is widely used on the X-ray conversion materials. It was possible to control the charge carrier transport of amorphous selenium by suitably alloying a-Se with other elements(e,g. As, Cl). In this paper, We investigated dopants(As, Cl) composition rate to improve dark resistivity and transport properties of charge carrier in amorphous selenium using by direct X-ray conversion material. Alloying a-Se with As inhibits the recrystallization of a-Se but introduces undesirable deep hole traps. then doping with Cl(in the ppm range) compensates for the deep hole traps. We investigated their composition rate in various doping conditions and then obtained optimum dopant composition rate. The result was Se-As 0.3%-Cl 30 ppm and X-ray Sensitivity was 0.57 pc/pixel$.$mR at 137 $\mu\textrm{m}$ x 137 $\mu\textrm{m}$ Pixel area.

• Electrical & Electronic Materials
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• v.7 no.5
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• pp.383-388
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• 1994

Deep levels in semi-insulating GaAs were observed by thermally stimulated current(TSC) measurement In the temperature ranges of 100-300K Tl(E$\_$c/-0.18eV), T2(E$\_$c/-0.20eV), T3(E$\_$c/-0.31eV), T4(E$\_$c/-0.40eV), and T5(E$\_$c/-O.43eV) traps have been observed. The TI, T2, and T5 traps seem to be related to the V$\_$As/, V$\_$Ga/-complex, and As$\_$Ga/$\^$++/ respectively. T4 trap is considered with respect to V$\_$Ga/-V$\_$As/ complex.