Analysis of MICC, ELA TFT performance transition according to substrate temperature and gate bias stress time variation (온도 변화 및 Gate bias stress time에 따른 MICC, ELA TFT성능 변화 비교 분석)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 2010.06a
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- pp.368-368
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- 2010