• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2004.04a
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• pp.530-537
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• 2004

Development of a versatile nanomanipulation tool is an overarching theme in nanotechnology. Such a tool will likely revolutionize the field given that it will enable fabrication and operation of a wealth of interesting nanodevices. This study seeks funding to create a novel nanomanipulation system with the ultimate goal of using this system for nanomanufacturing at the molecular level. The proposed design differs from existing approaches. It is based on a nanoscale ion trap integrated to a scanning prove microscope (SPM) tip. In this design, molecules to be assembled will be ionized and collected in the nanoscale ion trap all in an ultra high vacuum (UHV) environment. Once filled with the molecular ions, the nanoscale ion trap-SPM tip will be moved on a substrate surface using scanning probe microscopy techniques. The molecular ions will be placed at their precise locations on the surface. By virtue of the SPM, the devices that are being nanomanufactured will be imaged in real time as the molecular assembly process is carried out. In the later stages, automation of arrays of these nanomanipulators will be developed.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2002.04a
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• pp.59-64
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• 2002

One of the exciting research areas of the X-ray microscope is the observation of a living cell. In order to study a living cell with high resolution the order of the several tens nm, we need to improve the efficiency of mirrors which are components of an X-ray microscope system. In this paper we present the mirror design and manufacture to give a high resolution and reflectivity. We designed Wolter type I the condenser and objective mirror with the several tens of nm resolution. According to mirror design. we made the program using the visual basic. Using the new processing method as well as the ultra-precision diamond cutting, we directly processed the inside of an aluminum hulk in order to manufacture mirrors. From the experimental result, we think that the new processing method will improve a high reflectivity through the improved cutting tools and optimum cutting conditions.

• Proceedings of the KSME Conference
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• 2007.05a
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• pp.1271-1276
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• 2007

The most powerful analytical equipment usually comes at the cost of having the highest demand for space. Where electron microscopes has traditionally required a room to themselves, not just for reasons of their size but because of ancillary demands for pipes and service. The simple optical microscopes, of course, can occupy the desk-top, but because their performance is limited by the wavelength of light, their powers of magnification and resolution are inferior to that of the electron microscope. Mini SEM will sit comfortably on a desk-top but offers magnification and resolution performances much closer to that of a standard SEM. This new technique extends the scope of SEM as a high-resolution microscope, relatively cheap and widely available imaging tool, for a wider variety of samples.

• Journal of the Korean Institute of Telematics and Electronics S
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• v.35S no.3
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• pp.120-130
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• 1998

In this study, we implemented a scanning capacitance decimicron micorscope(SCdM) which scans a surface of the object mechanically in two or two point five dimensions with a stylus of size 0.2.mu.m. X-Y stage and stylus driving method are used as the scanning method, and VHD disk plate and IC chip are used as the object. Experimenal resutl of these object show that SCdM obtain 0.1.mu.m resolution power which exceeds that of optical microscope, and this microscope will be used as a powerful tool for inspecting ULSI pattern or biological data as a decimicron mcirocope which zoom a function of optical microscope and guide STM. The experimental system is composed of a VHD video disk method which captures the capacitance changes of the video disk suface and converts it into video signal.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2005.05a
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• pp.9-14
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• 2005

The nature of the signals collected by an SEM(Scanning Electron Microscope) in order to form images are all dependent on the detector used to collect them, and the quality of an acquired image is strongly influenced by detector performance. Therefore, the development of detector with high performance is very important in pulling up the resolution of SEM This study presents the secondary electron detector for use in scanning electron microscope, electric circuit and I/V conversion circuit for driving that detector.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2005.05a
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• pp.54-59
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• 2005

Recently, the ultra-precision stage is widely used in the fields of the nano-technology, specially in AFMs(Atomic Force Microscope) and STMs(Scanning Tunneling Microscope). In this paper, the ultra-precision stage which consists of flexure hinges, piezoelectric actuator, and ultra-precision linear encoder, is designed and developed. The guide mechanism which consisted of flexure hinges is analyzed by Finite Element Method. And we derived the transfer function of the system in 1st order system from step responses according to the magnitude. We performed simulation for the model to tune the control gain and applied the gains to the developed system. Experimental results found that the stage can be controlled in 5 nm resolution by PID controller.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.12 no.1
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• pp.81-87
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• 1999

The surface morphology of liquid crystal alignment layer has been investigated by using Brewster angle microscope(BAM) for the first time. The samples used in this work for liquid crystal alignment layer were mechanically rubbed polyimide films. The rubbing pattern on this layer has been analyzed with the terms of microgroove and rubbing induced optical birefringence. For the mechanically rubbed surface, the geometrical factors of microgroove play the major role for the formation of rubbing pattern. We propose that the BAM can be used as a powerful tool not only for observing the rubbing pattern, but also for inspecting the surface defects.

• Journal of the Korean Society for Precision Engineering
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• v.16 no.12
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• pp.46-53
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• 1999

Cutting force characteristics is closely related with tool wear on the end milling. And it is found that the tool wear can be properly obtained by observation through the tool-maker's microscope when STS 304 is cut using an end mill. The relationship between the tool wear and the cutting force is established based on data obtained from a series of experiments. A cutting force model can be derived from basic cutting force model using parasitic force components of this tool wear. The results of th simulation using the cutting force model proposed in this paper were verified experimentally and a good agreement was partly obtained. The proposed model is capable of predicting increased cutting force due to tool wear.

• Journal of the Korean Ceramic Society
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• v.40 no.11
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• pp.1047-1057
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• 2003

A sub-nanometer resolution Scanning Nonlinear Dielectric Microscope (SNDM) was developed for observing ferroelectric polarization. We also demonstrate that the resolution of SNDM is higher than that of a conventional piezo-response imaging. Secondly, we report new SNDM technique detecting higher nonlinear dielectric constants $\varepsilon$$\_$3333/ and $\varepsilon$$\_$33333/. Higher order nonlinear dielectric imaging provides higher lateral and depth resolution. Finally, the formation of artificial small inverted domain is reported to demonstrate that SNDM system is very useful as a nano-domain engineering tool. The nano-size domain dots were successfully formed in LiTaO$_3$ single crystal. This means that we can obtain a very high density ferroelectric data storage with the density above 1T-bits/inch$^2$.

• IEMEK Journal of Embedded Systems and Applications
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• v.19 no.2
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• pp.83-90
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• 2024

CNC tools contribute to the production of high-precision and consistent results. However, employing damaged CNC tools or utilizing compromised numerical control can lead to significant issues, including equipment damage, overheating, and system-wide errors. Typically, the assessment of external damage to CNC tools involves capturing a single viewpoint through a camera to evaluate tool wear. This study aims to enhance existing methods by using only a single manually focused Microscope camera to enable comprehensive external analysis from multiple perspectives. Applying the NeRF (Neural Radiance Fields) algorithm to images captured with a single manual focus microscope camera, we construct a 3D rendering system. Through this system, it is possible to generate scenes of areas that cannot be captured even with a fixed camera setup, thereby assisting in the analysis of exterior features. However, the NeRF model requires considerable training time, ranging from several hours to over two days. To overcome these limitations of NeRF, various subsequent models have been developed. Therefore, this study aims to compare and apply the performance of Instant NGP, Mip-NeRF, and DS-NeRF, which have garnered attention following NeRF.