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http://dx.doi.org/10.4191/KCERS.2003.40.11.1047

Scanning Nonlinear Dielectric Microscopy : Overview -A High Resolution Tool for Observing Ferroelectric Domains and Nano-domain Engineering-  

Cho, Yasuo (Research Institute of Electrical Communication, Tohoku University)
Publication Information
Abstract
A sub-nanometer resolution Scanning Nonlinear Dielectric Microscope (SNDM) was developed for observing ferroelectric polarization. We also demonstrate that the resolution of SNDM is higher than that of a conventional piezo-response imaging. Secondly, we report new SNDM technique detecting higher nonlinear dielectric constants $\varepsilon$$\_$3333/ and $\varepsilon$$\_$33333/. Higher order nonlinear dielectric imaging provides higher lateral and depth resolution. Finally, the formation of artificial small inverted domain is reported to demonstrate that SNDM system is very useful as a nano-domain engineering tool. The nano-size domain dots were successfully formed in LiTaO$_3$ single crystal. This means that we can obtain a very high density ferroelectric data storage with the density above 1T-bits/inch$^2$.
Keywords
Scanning nonlinear dielectric microscope; Ferroelectri polarization;
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