• Title/Summary/Keyword: Thermal Diffusion

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The Study on Phase Separation Development by Curing Reaction Rate for Unsaturated Polyester/Polyvinylacetate Semi-IPN (Unsaturated Polyester/Polyvinylacetate Semi-IPN의 경화반응속도에 따른 상분리현상 연구)

  • Chang, Won-Young;Kim, Moo-Sool;Kim, Jin-Hwan;Nam, Jae-Do
    • Polymer(Korea)
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    • v.25 no.1
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    • pp.78-89
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    • 2001
  • Morphological changes of unsaturated polyester/polyvinylacetate semi-IPN were studied while the phase separation and the cure reaction occurred in a competing fashion. The light scattering and thermal analysis techniques were used to investigate the phase separation rates and mechanical properties resultantly induced by molecular diffusion of thermoplastic polymer during the curing process of thermosetting polymer. The reaction activation energy was calculated by using Flynn-Wall method and the semi-IPN structure exhibited various phase-separation morphological characteristics. When PVAc composition was 10 wt%, the phase separation was not observed during the curing reaction, but the phase separation occurred in a similar fashion to nucleation and growth(NG) mechanism at room temperature. On the other hand, when PVAc composition was over 11.65 wt%, the phase separation was generated in the middle of the curing process. Consequently, the phase separation seemed to influence the curing reaction rate, which was also supported by the changing activation energy with conversion and PVAc composition. Finally, the total scattered intensity was measured at various temperature, and subsequently the diffusion rates of phase separation R(${\beta}m$) were evaluated.

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Characteristics of MOCVD Cobalt on ALD Tantalum Nitride Layer Using $H_2/NH_3$ Gas as a Reactant

  • Park, Jae-Hyeong;Han, Dong-Seok;Mun, Dae-Yong;Yun, Don-Gyu;Park, Jong-Wan
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.377-377
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    • 2012
  • Microprocessor technology now relies on copper for most of its electrical interconnections. Because of the high diffusivity of copper, Atomic layer deposition (ALD) $TaN_x$ is used as a diffusion barrier to prevent copper diffusion into the Si or $SiO_2$. Another problem with copper is that it has weak adhesion to most materials. Strong adhesion to copper is an essential characteristic for the new barrier layer because copper films prepared by electroplating peel off easily in the damascene process. Thus adhesion-enhancing layer of cobalt is placed between the $TaN_x$ and the copper. Because, cobalt has strong adhesion to the copper layer and possible seedless electro-plating of copper. Until now, metal film has generally been deposited by physical vapor deposition. However, one draw-back of this method is poor step coverage in applications of ultralarge-scale integration metallization technology. Metal organic chemical vapor deposition (MOCVD) is a good approach to address this problem. In addition, the MOCVD method has several advantages, such as conformal coverage, uniform deposition over large substrate areas and less substrate damage. For this reasons, cobalt films have been studied using MOCVD and various metal-organic precursors. In this study, we used $C_{12}H_{10}O_6(Co)_2$ (dicobalt hexacarbonyl tert-butylacetylene, CCTBA) as a cobalt precursor because of its high vapor pressure and volatility, a liquid state and its excellent thermal stability under normal conditions. Furthermore, the cobalt film was also deposited at various $H_2/NH_3$ gas ratio(1, 1:1,2,6,8) producing pure cobalt thin films with excellent conformality. Compared to MOCVD cobalt using $H_2$ gas as a reactant, the cobalt thin film deposited by MOCVD using $H_2$ with $NH_3$ showed a low roughness, a low resistivity, and a low carbon impurity. It was found that Co/$TaN_x$ film can achieve a low resistivity of $90{\mu}{\Omega}-cm$, a low root-mean-square roughness of 0.97 nm at a growth temperature of $150^{\circ}C$ and a low carbon impurity of 4~6% carbon concentration.

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Effect of Metal Interlayers on Nanocrystalline Diamond Coating over WC-Co Substrate (초경합금에 나노결정질 다이아몬드 코팅 시 금속 중간층의 효과)

  • Na, Bong-Kwon;Kang, Chan Hyoung
    • Journal of the Korean institute of surface engineering
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    • v.46 no.2
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    • pp.68-74
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    • 2013
  • For the coating of diamond films on WC-Co tools, a buffer interlayer is needed because Co catalyzes diamond into graphite. W and Ti were chosen as candidate interlayer materials to prevent the diffusion of Co during diamond deposition. W or Ti interlayer of $1{\mu}m$ thickness was deposited on WC-Co substrate under Ar in a DC magnetron sputter. After seeding treatment of the interlayer-deposited specimens in an ultrasonic bath containing nanometer diamond powders, $2{\mu}m$ thick nanocrystalline diamond (NCD) films were deposited at $600^{\circ}C$ over the metal layers in a 2.45 GHz microwave plasma CVD system. The cross-sectional morphology of films was observed by FESEM. X-ray diffraction and visual Raman spectroscopy were used to confirm the NCD crystal structure. Micro hardness was measured by nano-indenter. The coefficient of friction (COF) was measured by tribology test using ball on disk method. After tribology test, wear tracks were examined by optical microscope and alpha step profiler. Rockwell C indentation test was performed to characterize the adhesion between films and substrate. Ti and W were found good interlayer materials to act as Co diffusion barriers and diamond nucleation layers. The COFs on NCD films with W or Ti interlayer were measured as less than 0.1 whereas that on bare WC-Co was 0.6~1.0. However, W interlayer exhibited better results than Ti in terms of the adhesion to WC-Co substrate and to NCD film. This result is believed to be due to smaller difference in the coefficients of thermal expansion of the related films in the case of W interlayer than Ti one. By varying the thickness of W interlayer as 1, 2, and $4{\mu}m$ with a fixed $2{\mu}m$ thick NCD film, no difference in COF and wear behavior but a significant change in adhesion was observed. It was shown that the thicker the interlayer, the stronger the adhesion. It is suggested that thicker W interlayer is more effective in relieving the residual stress of NCD film during cooling after deposition and results in stronger adhesion.

A Numerical Modeling of the Temperature Dependence on Electrochemical Properties for Solid Oxide Electrolysis Cell(SOEC) (고체 산화물 수전해 시스템(SOEC)에서 전기화학적 특성의 온도 의존성에 대한 수치 모델링)

  • Han, Kyoung Ho;Jung, Jung Yul;Yoon, Do Young
    • Journal of Energy Engineering
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    • v.29 no.2
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    • pp.1-9
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    • 2020
  • In recent days, fuel cell has received attention from the world as an alternative power source to hydrocarbon used in automobile engines. With the industrial advances of fuel cell, There have been a lot of researches actively conducted to find a way of generating hydrogen. Among many hydrogen production methods, Solid Oxide Electrolysis Cell(SOEC) is not only a basic way but also environment-friendly method to produce hydrogen gas. Solid Oxide Electrolysis Cell has lower electrical energy demands and high thermal efficiency since it is possible to operate under high temperature and high pressure conditions. For these reasons, experimental researches as well as studies on numerical modeling for Solid Oxide Electrolysis Cell have been under way. However, studies on numerical modeling are relatively less enough than experimental accomplishments and have limited performance prediction, which mostly is considered as a result from inadequate effects of electrochemical properties by temperature and pressure. In this study, various experimental studies of commercial Membrane Electrode Assembly (MEA) composed of Ni-YSZ (40wt%, Ni-60 wt% YSZ)/8-YSZ (TOSOH, TZ8Y)/LSM (La0.9Sr0.1MnO3) was utilized for improving effectiveness of SOEC model. After numerically analyzing effects of electrochemical properties according to operating temperature, causing the largest deviation between experiments and simulation are that Charge Transfer Coefficient (CTC), exchange current density, diffusion coefficient, electrical conductivity in SOEC. Analyzing temperature effect on parameter used in overpotential model is conducted for modeling of SOEC. cross-validation method is adopted for application of various MEA and evaluating feasibility of model. As a result, the study confirm that the numerical model of SOEC based on structured process of effectiveness evaluation makes performance prediction better.

Condensable Gas Separation using Phenol! Alumina Composite Activated Carbon Hollow Fiber Membranes (페놀수지/알루미나 복합 활성탄소중공사막을 이용한 응축성 기체 분리)

  • Shin, Kyung-Yong;Park, You-In;Kim, Beom-Sik;Koo, Kee-Kahb
    • Membrane Journal
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    • v.20 no.4
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    • pp.312-319
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    • 2010
  • Carbon membrane materials have received considerable attention for the gas separation including hydrocarbon mixture of ingredients of the volatile organic compounds(VOCs) because they possess their higher selectivity, permeability, and thermal stability than the polymeric membranes. The use of activated carbon membranes makes it possible to separate continuously the VOCs mixture by the selective adsorption-diffusion mechanism which the condensable components are preferentially adsorbed in to the micropores of the membrane. The activated carbon hollow fiber membranes with uniform adsorptive micropores on the wall of open pores and the surface of the membranes have been fabricated by the carbonization of a thin film of phenolic resin deposited on porous alumina hollow fiber membrane. Oxidation, carbonization, and activation processing variables were controlled under different conditions in order to improve the separation characteristics of the activated carbon membrane. Properties of activated carbon hollow fiber membranes and the characterization of a gas permeation by pyrolysis conditions were studied. As the result, the activated carbon hollow fiber membranes with good separation capabilities by the molecular size mechanism as well as selective adsorption on the pores surface followed by surface diffusion effective in the recovery hydrocarbons have been obtained. Therefore, these activated carbon membranes prepared in this study are shown as promising candidate membrane for separation of VOCs.

Behavior of Implanted Dopants and Formation of Molybdenum Siliclde by Composite Sputtering (Composite target으로 증착된 Mo-silicide의 형성 및 불순물의 거동)

  • Cho, Hyun-Choon;Paek, Su-Hyon;Choi, Jin-Seog;Hwang, Yu-Sang;Kim, Ho-Suk;Kim, Dong-Won;Shim, Tae-Earn;Jung, Jae-Kyoung;Lee, Jong-Gil
    • Korean Journal of Materials Research
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    • v.2 no.5
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    • pp.375-382
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    • 1992
  • Molybdenum silicide films have been prepared by sputtering from a single composite MoS$i_2$ source on both P, B$F_2$respectively implanted (5${\times}10^{15}ions/cm^2$ single crystal and P implanted (5${\times}10^{15}ions/cm^2$) polycrystalline silicon substrates followed by rapid thermal annealing in the ambient of argon. The heat treatment temperatures have been varied in the range of 600-l20$0^{\circ}C$ for 20 seconds. The properties of Mo-silicide and the diffusion behaviors of dopant after the heat treatment are investigated using X-ray diffraction, scanning electron microscopy(SEM) , secondary ions mass spectrometry(SIMS), four-point probe and $\alpha-step.$ Annealing at 80$0^{\circ}C$ or higher resulted in conversion of the amorphous phase into predominantly MoS$i_2$and a lower sheet resistance. There was no significant out-diffusion of dopants from both single crystal and polycrystalline silicon substrate into molybdenum silicide layers during annealing.

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A Study on the Resistve Switching Characteristic of Parallel Memristive Circuit of Lithium Ion Based Memristor and Capacitor (리튬 이온 기반 멤리스터 커패시터 병렬 구조의 저항변화 특성 연구)

  • Kang, Seung Hyun;Lee, Hong-Sub
    • Journal of the Microelectronics and Packaging Society
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    • v.28 no.4
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    • pp.41-45
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    • 2021
  • In this study, in order to secure the high reliability of the memristor, we adopted a patterned lithium filament seed layer as the main agent for resistive switching (RS) characteristic on the 30 nm thick ZrO2 thin film at the device manufacturing stage. Lithium filament seed layer with a thickness of 5 nm and an area of 5 ㎛ × 5 ㎛ were formed on the ZrO2 thin film, and various electrode areas were applied to investigate the effect of capacitance on filament type memristive behavior in the parallel memristive circuit of memristor and capacitor. The RS characteristics were measured in the samples before and after 250℃ post-annealing for lithium metal diffusion. In the case of conductive filaments formed by thermal diffusion (post-annealed sample), it was not available to control the filament by applying voltage, and the other hand, the as-deposited sample showed the reversible RS characteristics by the formation and rupture of filaments. Finally, via the comparison of the RS characteristics according to the electrode area, it was confirmed that capacitance is an important factor for the formation and rupture of filaments.

Structure and Variation of Tidal Flat Temperature in Gomso Bay, West Coast of Korea (서해안 곰소만 갯벌 온도의 구조 및 변화)

  • Lee, Sang-Ho;Cho, Yang-Ki;You, Kwang-Woo;Kim, Young-Gon;Choi, Hyun-Yong
    • The Sea:JOURNAL OF THE KOREAN SOCIETY OF OCEANOGRAPHY
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    • v.10 no.1
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    • pp.100-112
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    • 2005
  • Soil temperature was measured from the surface to 40 cm depth at three stations with different heights in tidal flat of Gomso Bay, west coast of Korea, for one month in every season 2004 to examine the thermal structure and the variation. Mean temperature in surface layer was higher in summer and lower in winter than in lower layer, reflecting the seasonal variation of vertically propagating structure of temperature by heating and cooling from the tidal flat surface. Standard deviation of temperature decreased from the surface to lower layer. Periodic variations of solar radiation energy and tide mainly caused short term variation of soil temperature, which was also intermittently influenced by precipitation and wind. Time series analysis showed the power spectral energy peaks at the periods of 24, 12 and 8 hours, and the strongest peak appeared at 24 hour period. These peaks can be interpreted as temperature waves forced by variations of solar radiation, diurnal tide and interaction of both variations, respectively. EOF analysis showed that the first and the second modes resolved 96% of variation of vertical temperature structure. The first mode was interpreted as the heating antl cooling from tidal flat surface and the second mode as the effect of phase lag produced by temperature wave propagation in the soil. The phase of heat transfer by 24 hour period wave, analyzed by cross spectrum, showed that mean phase difference of the temperature wave increased almost linearly with the soil depth. The time lags by the phase difference from surface to 10, 20 and 40cm were 3.2,6.5 and 9.8 hours, respectively. Vertical thermal diffusivity of temperature wave of 24 hour period was estimated using one dimensional thermal diffusion model. Average diffusivity over the soil depths and seasons resulted in $0.70{\times}10^{-6}m^2/s$ at the middle station and $0.57{\times}10^{-6}m^2/s$ at the lowest station. The depth-averaged diffusivity was large in spring and small in summer and the seasonal mean diffusivity vertically increased from 2 cm to 10 cm and decreased from 10 cm to 40 cm. Thermal propagation speeds were estimated by $8.75{\times}10^{-4}cm/s,\;3.8{\times}10{-4}cm/s,\;and\;1.7{\times}10^{-4}cm/s$ from 2 cm to 10 cm, 20 cm and 40 cm, respectively, indicating the speed reduction with depth increasing from the surface.

양산에 적합한 구조의 X-ray 검출기 공정에 대한 연구

  • Gwon, Jun-Hwan;O, Gyeong-Min;Song, Yong-Geun;Kim, Ji-Na;No, Seong-Jin;Nam, Sang-Hui
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.08a
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    • pp.265-266
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    • 2012
  • 의료용 X-ray의 발전에 따라, 영상의 Digital화가 필요하게 되었다. Digital 영상 구현을 위해 다양한 형태의 영상 검출기가 개발되었다. 진단 영상의 조건으로는 구현 시간이 빠르고 해상도가 높아야 한다. 조건에 부합하는 Flat panel 형태의 직접방식과 간접방식 검출기의 개발이 주로 이루어졌으며, X-ray 검출 효율이 높고 공간 분해능이 높은 직접 방식의 검출기에 대한 연구가 활발히 진행되고 있다. 기존 직접방식의 X-ray 검출물질로는 A-Se이 이용되었다. 하지만 A-Se의 경우 낮은 원자번호로 인해 X-ray에 대한효율이 낮으며, 제조 공정과 수율의 문제로 인해 대체 물질의 개발과 공정의 개선이 필요하다. 선행 연구를 통해 X-ray 검출물질의 전기적 특성을 파악을 통해 대체 물질로서 가능성을 알아보았다. 본 연구에서는 기존에 제작된 X-ray 검출물질의 상부전극 증착 물질과 증착법 선정에 대한 연구이다. 선행 연구를 통해 선정된 X-ray 검출물질은 HgI2이다. 상, 하부 전극 선택에 있어 HgI2의 일함수 값(4.15eV)을 고려하여 그와 비슷한 일함수 값을 가진 물질로 전기적 장벽을 제거하여야 한다. 따라서, ITO (일함수 4.45eV)와 Au (일함수 5.1eV)을 선택하였다. ITO의 증착으로 이용된 방법으로는 on-axis 형태의 magnetron plasma sputtering을 이용하였으며, Au의 증착으로 이용된 방법은 Thermal evaporation deposition을 이용하였다. plasma sputtering에 이용된 타겟은 In2O3;SnO2 (조성비:90:10wt%)를 사용하였으며, Chamber의 크기는 넓이 456 ${\phi}cm^2$ 높이 25 cm이며, 로 target과 기판과의 거리는 15cm이다. plasma발생에 필요한 가스로는 Ar과 O2를 이용하였다. 고 진공 환경 조성에 이용된 장비로는 Rotary pump와 Turbo molecular pump이다. plasma 발생 전 진공도는 $3.2{\times}10^{-5}$ Torr, 발생 후 진공도는 $5.1{\times}10^{-5}$ Torr이다. plasma 환경이 조성된 후 증착 시간은 1분 30초이다. Au는 순도 99.999%를 이용하였으며, 이용된 금은 1회 증착에 0.3 g을 이용하였다. Chamber의 넓이 1,444 ${\phi}cm^2$이며, 높이 40 cm, boat와 기판과의 거리는 25 cm이다. 고 진공 환경 조성에 이용된 장비로는 Rotary pump와 diffusion pump를 이용하였다. Au의 승화 전 진공도는 $2.4{\times}10^{-5}$ Torr 증착 시 진공도는 $4.2{\times}10^{-5}$ Torr이며, Boat에 가해준 전압, 전류는 0.97 V, 47 A이며, 증착 시간은 1분 30초이다. 광도전체 층에 각각 증착된 전극의 저항을 통해 증착상태를 판단하였다. DMM (Digital Multimeter)로 1 cm 간격으로 측정된 표면의 저항은 ITO 약 $8{\Omega}$, Au 약 $3{\Omega}$으로 전극으로서 이용이 가능한 상태이다. Au와 ITO가 증착된 HgI2 시편의 전기적 특성은 기존에 이용된 X-ray 변환물질의 성능보다 우수하였다. 하지만 Au와 ITO가 각각 증착된 시편의 전기적 특성은 큰 차이를 보이지 않았다. ITO의 경우 진공 상태에서 이용되는 Gas가 이용되며, Plasma 환경 조성 유지가 어려운 점이 있다. Au전극은 증착 환경 조성이 쉽지만, 전극 물질 이용효율이 떨어지는 단점이 있다. 본 연구를 통해 X-ray 변환물질인 HgI2의 전극물질로 Au와 ITO의 이용가능성을 알아보았다. 두 전극으로 제작된 검출기의 성능은 큰 차이 없이 우수하였고, 전기적 장벽 상태가 낮아 높은 검출 효율을 보였다. 상대적으로 Au 전극의 공정이 간단하고 수율이 높다. 하지만 Au Source의 이용 효율이 떨어지는 단점이 있다. 본 연구의 결과를 통해 공정상의 유리함과 Source의 이용효율을 고려한 분석에 대한 연구가 필요할 것으로 사료된다.

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Electrical and Chemical Properties of ultra thin RT-MOCVD Deposited Ti-doped $Ta_2O_5$

  • Lee, S. J.;H. F. Luan;A. Mao;T. S. Jeon;Lee, C. h.;Y. Senzaki;D. Roberts;D. L. Kwong
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.1 no.4
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    • pp.202-208
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    • 2001
  • In Recent results suggested that doping $Ta_2O_5$ with a small amount of $TiO_2$ using standard ceramic processing techniques can increase the dielectric constant of $Ta_2O_5$ significantly. In this paper, this concept is studied using RTCVD (Rapid Thermal Chemical Vapor Deposition). Ti-doped $Ta_2O_5$ films are deposited using $TaC_{12}H_{30}O_5N$, $C_8H_{24}N_4Ti$, and $O_2$ on both Si and $NH_3$-nitrided Si substrates. An $NH_3$-based interface layer at the Si surface is used to prevent interfacial oxidation during the CVD process and post deposition annealing is performed in $H_2/O_2$ ambient to improve film quality and reduce leakage current. A sputtered TiN layer is used as a diffusion barrier between the Al gate electrode and the $TaTi_xO_y$ dielectric. XPS analyses confirm the formation of a ($Ta_2O_5)_{1-x}(TiO_2)_x$ composite oxide. A high quality $TaTi_xO_y$ gate stack with EOT (Equivalent Oxide Thickness) of $7{\AA}$ and leakage current $Jg=O.5A/textrm{cm}^2$ @ Vg=-1.0V has been achieved. We have also succeeded in forming a $TaTi_x/O_y$ composite oxide by rapid thermal oxidation of the as-deposited CVD TaTi films. The electrical properties and Jg-EOT characteristics of these composite oxides are remarkably similar to that of RTCVD $Ta_2O_5, suggesting that the dielectric constant of $Ta_2O_5$ is not affected by the addition of $TiO_2$.

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