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http://dx.doi.org/10.5695/JKISE.2013.46.2.068

Effect of Metal Interlayers on Nanocrystalline Diamond Coating over WC-Co Substrate  

Na, Bong-Kwon (Department of Advanced Materials Engineering, Korea Polytechnic University)
Kang, Chan Hyoung (Department of Advanced Materials Engineering, Korea Polytechnic University)
Publication Information
Journal of the Korean institute of surface engineering / v.46, no.2, 2013 , pp. 68-74 More about this Journal
Abstract
For the coating of diamond films on WC-Co tools, a buffer interlayer is needed because Co catalyzes diamond into graphite. W and Ti were chosen as candidate interlayer materials to prevent the diffusion of Co during diamond deposition. W or Ti interlayer of $1{\mu}m$ thickness was deposited on WC-Co substrate under Ar in a DC magnetron sputter. After seeding treatment of the interlayer-deposited specimens in an ultrasonic bath containing nanometer diamond powders, $2{\mu}m$ thick nanocrystalline diamond (NCD) films were deposited at $600^{\circ}C$ over the metal layers in a 2.45 GHz microwave plasma CVD system. The cross-sectional morphology of films was observed by FESEM. X-ray diffraction and visual Raman spectroscopy were used to confirm the NCD crystal structure. Micro hardness was measured by nano-indenter. The coefficient of friction (COF) was measured by tribology test using ball on disk method. After tribology test, wear tracks were examined by optical microscope and alpha step profiler. Rockwell C indentation test was performed to characterize the adhesion between films and substrate. Ti and W were found good interlayer materials to act as Co diffusion barriers and diamond nucleation layers. The COFs on NCD films with W or Ti interlayer were measured as less than 0.1 whereas that on bare WC-Co was 0.6~1.0. However, W interlayer exhibited better results than Ti in terms of the adhesion to WC-Co substrate and to NCD film. This result is believed to be due to smaller difference in the coefficients of thermal expansion of the related films in the case of W interlayer than Ti one. By varying the thickness of W interlayer as 1, 2, and $4{\mu}m$ with a fixed $2{\mu}m$ thick NCD film, no difference in COF and wear behavior but a significant change in adhesion was observed. It was shown that the thicker the interlayer, the stronger the adhesion. It is suggested that thicker W interlayer is more effective in relieving the residual stress of NCD film during cooling after deposition and results in stronger adhesion.
Keywords
Nanocrystalline diamond; Microwave plasma CVD; Coefficient of friction; Adhesion;
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1 X. Xiao, B. W. Sheldon, E. Konca, L. C. Lev, M. J. Lukitsch, Diamond Relat. Mater., 18 (2009) 1114.   DOI   ScienceOn
2 R. Polini, M. Barletta, G. Cristofallini, Thin Solid Films, 519 (2010) 1629.   DOI   ScienceOn
3 Y. Tang, Y. S. Li, Q. Yang, A. Hirose, Diamond Relat. Mater., 19 (2010) 496.   DOI   ScienceOn
4 P. K. Chu, L. Li, Mater. Chem. Phys., 96 (2006) 253.   DOI   ScienceOn
5 M. Ohring, Materials Science of Thin Films : Deposition & Structure, 2nd ed., Academic Press, San Diego, CA, USA, (2002) 732.
6 David R. Lide (Ed.), Handbook of Chemistry and Physics, 88th ed., CRC Press, Boca Raton, FL, USA, (2008).
7 H. Guo, Y. Qi, X. Li, J. Appl. Phys., 107 (2010) 033722.   DOI   ScienceOn
8 D. M. Gruen, Annu. Rev. Mater. Sci., 29 (1999) 211.   DOI   ScienceOn
9 S. H. Choi, C. H. Kang, MRS Proc. 1035E-L05-16 (2007).
10 D. Y. Jung, C. H. Kang, J. Kor. Inst. Surf. Eng., 42 (2009) 216.   DOI   ScienceOn
11 D. Y. Jung, C. H. Kang, J. Kor. Inst. Surf. Eng., 44 (2011) 131.   DOI   ScienceOn
12 I.-S. Kim, C. H. Kang, J. Kor. Inst. Surf. Eng., 46 (2013) 29.   DOI   ScienceOn
13 J. E. Butler, A. V. Sumant, Chem. Vap. Deposition, 14 (2008) 145.   DOI   ScienceOn
14 J. M. Dasch, C. C. Ang, C. A. Wong, Y. T. Cheng, A. M. Weiner, L. C. Lev, E. Konca, Surf. Coat. Technol., 200 (2006) 2970.   DOI   ScienceOn
15 T. B. Massalski (Ed.), Binary Alloy Phase Diagrams, 2nd ed., vol. 1, ASM International, Metals Park, OH, USA, (1997) 835.
16 B. S. Park, Y.-J. Baik, K.-R. Lee, K. Y. Eun, D. H. Kim, Diamond Relat. Mater., 2 (1993) 910.   DOI   ScienceOn
17 M. G. Peters, R. H. Cummings, European Patent 0519587 (1992) A1.
18 V. G. Ralchenko, A. A. Smolin, V. G. Pereverzev, E. D. Obraztsova, K. G. Korotoushenko, V. I. Konov, Y. V. Lakhotkin, E. N. Loubnin, Diamond Relat. Mater., 4 (1995) 754.   DOI   ScienceOn
19 Q. H. Fan, A. Fernandes, J. Gracio, Diamond Relat. Mater., 7 (1998) 603.   DOI   ScienceOn
20 R. Polini, Thin Solid Films, 515 (2006) 4.   DOI   ScienceOn