• Title/Summary/Keyword: Testing Procedures

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A Note on a Recent Approach to Some Life Testing Problems

  • Ahmad, Ibrahim A.
    • International Journal of Reliability and Applications
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    • v.8 no.2
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    • pp.175-182
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    • 2007
  • In this note, some comments concerning the testing procedures for the problems of stochastic comparison, testing IFR and testing NBU ageing properties are presented showing that the tests proposed in Belzunce, Candel and Ruiz(1998) are cumbersome to calculate and do not have as good asymptotic Pittman efficacies as simpler others already in the literature. This is done via new presentations of the measures on which Belzunce et al. base their tests.

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ECONOMY IN RADIOGRAPHY THROUGH QUALITY

  • Lenaerts, C.
    • Journal of the Korean Society for Nondestructive Testing
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    • v.8 no.1
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    • pp.44-48
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    • 1988
  • Quality and economy in radiography can be achieved by using the right techniques and the film material available on the market. Pre-packing with or without lead, under vacuum or not, play an important role provided the right kinds of procedures are applied. The author explains some of the ways used by different N.D.T.companies to achieve the best quality in an economical way.

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Automatic Generation of DB Images for Testing Enterprise Systems (전사적 응용시스템 테스트를 위한 DB이미지 생성에 관한 연구)

  • Kwon, Oh-Seung;Hong, Sa-Neung
    • Journal of Intelligence and Information Systems
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    • v.17 no.4
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    • pp.37-58
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    • 2011
  • In general, testing DB applications is much more difficult than testing other types of software. The fact that the DB states as much as the input data influence and determine the procedures and results of program testing is one of the decisive reasons for the difficulties. In order to create and maintain proper DB states for testing, it not only takes a lot of time and efforts, but also requires extensive IT expertise and business knowledge. Despite the difficulties, there are not enough research and tools for the needed help. This article reports the result of research on automatic creation and maintenance of DB states for testing DB applications. As its core, this investigation develops an automation tool which collects relevant information from a variety of sources such as log, schema, tables and messages, combines collected information intelligently, and creates pre- and post-Images of database tables proper for application tests. The proposed procedures and tool are expected to be greatly helpful for overcoming inefficiencies and difficulties in not just unit and integration tests but including regression tests. Practically, the tool and procedures proposed in this research allows developers to improve their productivity by reducing time and effort required for creating and maintaining appropriate DB sates, and enhances the quality of DB applications since they are conducive to a wider variety of test cases and support regression tests. Academically, this research deepens our understanding and introduces new approach to testing enterprise systems by analyzing patterns of SQL usages and defining a grammar to express and process the patterns.

Towards defining a simplified procedure for COTS system-on-chip TID testing

  • Di Mascio, Stefano;Menicucci, Alessandra;Furano, Gianluca;Szewczyk, Tomasz;Campajola, Luigi;Di Capua, Francesco;Lucaroni, Andrea;Ottavi, Marco
    • Nuclear Engineering and Technology
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    • v.50 no.8
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    • pp.1298-1305
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    • 2018
  • The use of System-on-Chip (SoC) solutions in the design of on-board data handling systems is an important step towards further miniaturization in space. However, the Total Ionizing Dose (TID) and Single Event Effects (SEE) characterization of these complex devices present new challenges that are either not fully addressed by current testing guidelines or may result in expensive, cumbersome test configurations. In this paper we report the test setups, procedures and results for TID testing of a SoC microcontroller both using standard $^{60}Co$ and low-energy protons beams. This paper specifically points out the differences in the test methodology and in the challenges between TID testing with proton beam and with the conventional gamma ray irradiation. New test setup and procedures are proposed which are capable of emulating typical mission conditions (clock, bias, software, reprogramming, etc.) while keeping the test setup as simple as possible at the same time.