• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.2
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• pp.145-153
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• 2001

As combinational ATPG algorithms achieve effectively 100% fault coverage, reducing the length of test set without loosing its fault coverage becomes a challenging work. The new approach is based on the independent and the compatible relationships between faults. For more compact test set, the size of compatible fault set must be maximized, thus this algorithm generates fault-pattern pairs, and a fault-pattern pair tree structure using the independent and the compatible relationships between faults. With the fault-pattern pair tree structure, a compact test set effectively generated. The experimental results for ISCAS 85 and 89 benchmark circuits demonstrate the effectiveness of the proposed method.

• Proceedings of the Korean Institute of Building Construction Conference
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• 2013.05a
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• pp.305-307
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• 2013

In this paper, we test and evaluate in terms of workability the epoxy resin mortar and the EVA powder resin mortar used on the concrete structures. The initial viscosity of the epoxy resin mortar is lower than the EVA powder mortar, but after 20 minutes work can not be rapidly increased to 40 minutes. In the other hand, the EVA powder resin mortar is able to measure of viscosity for the past 40 minutes. In the flow test for evaluate workability, the flow of the epoxy resin mortar is rapidly decreased from 230 to 100 in the 90 minutes, but the flow of the EVA powder resin mortar is reduced to 198 to 175 that there is no significant change. In the coverage test of the pinhole on the concrete surface, the EVA powder mortar appears coverage in the all pinhole size but the epoxy resin mortar is not concealed from 2mm pinhole size.

• KIPS Transactions on Software and Data Engineering
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• v.2 no.3
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• pp.151-160
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• 2013

iOS applications refer to the apps operating on iOS, a mobile OS developed by Apple. As iOS provides graphic user interfaces based on touch screens, most of iOS apps support GUIs. GUIs become increasingly important for iOS apps. So are GUI tests. As GUI functions are performed by event handlers, faulty event handlers could cause defects in GUIs. Hence, this study detects faults in event handlers as a way to test GUIs for iOS apps, and suggests how to generate test cases by re-defining input domains of event handlers.

• Journal of Preventive Medicine and Public Health
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• v.32 no.2
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• pp.147-154
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• 1999

Objectives: To construct basic data to develop strategies for achieving higher Pap test coverage rate by evaluating factors associated with the use of Pap test through population-based survey. Methods: 16.4%(671) of the 4,090 women, who were eligible population for this study, in 3 Myens of Chung-ju City participated in this study voluntarily from July 21 to 26, 1997. After basic physical examination by trained doctors, they were interviewed with structured questionnaire by well-educated interviewers. Results: It shows that only 54.3% of study participants experienced Pap test. The strongest factor which is related with the use of Pap test was the history of having breast screening tests(aOR=8.71, 95% CI=4.25-17.84). Probability of ever having Pap test was also higher in married women(aOR of single=0.46, 95% CI=0.29-0.72), younger(Ptrend<0,051, more educated (Ptrend<0.001), non-smoker (aOR of smoker=0.25, 95% CI=0.12-0.55), women of ever having Hepatitis test(aOR=2.60, 95% CI=1.73-3.88) in multiple lineal logistic analysis. Conclusions : This study suggests that several factors significantly associated with the use of Pap test, and especially, high-risk population for cervical cancer such as women of older ages, less educated, living alone are less likely to have the Pap test. We should concentrate on encouraging high-risk women in the use of Pap test to improve Pap test coverage rate.

• Proceedings of the IEEK Conference
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• 1998.10a
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• pp.1169-1172
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• 1998

We designed an ALU(Airthmetic Logic Unit) with BIST(Built-In Self Test), which is suitable for 32-bit DSP RISC processors. We minimized the area of this ALU by allowing different operations to share several hardware blocks. Moreover, we applied DFT(Design for Testability) to ALU and offered Bist(Built-In Self-Test) function. BIST is composed of pattern generation and response analysis. We used the reseeding method and testability design for the high fault coverage. These techniques reduce the test length. Chip's reliability is improved by testing and the cost of testing system can be reduced.

• The Transactions of the Korea Information Processing Society
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• v.5 no.9
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• pp.2378-2387
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• 1998

This thesis proposes a design algorithm of an efficient space response compactor for Built-In Self-Testing of VLSI circuits. The proposed design algorithm of space compactors can be applied independently from the structure of Circuit Cnder Test. There are high hardware overhead cost in conventional space response compactors and the fault coverage is reduced by aliasing which maps faulty circuit's response to fault-free one. However, the proposed method designs space response compactors with reduced hardware overheads and does not reduce the fault coverage comparing to conventional method. Also, the proposed method can be extended to general N -input logic gate and design the most efficient space response L'Ompactors according to the characteristies of output sequence from CUT. The prolxlsed design algorithm is implemented by C language on a SUN SPARC Workstation, and some experiment results of the simulation applied to ISCAS'85 benchmark circuits with pseudo random patterns generated bv LFSR( Linear Feedback Shift Register) show the efficiency and validity of the proposed design algorithm.

• KIISE Transactions on Computing Practices
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• v.22 no.1
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• pp.32-37
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• 2016

In model-based testing using sequence diagrams, test cases are automatically derived from the sequence diagrams. For the generation of test cases, scenarios need to be found for representing as a sequence diagram, and to extract test paths satisfying the test coverage. However, it is hard to automatically extract test paths from the sequence diagram because a sequence diagram represents loop, opt, and alt information using CombinedFragments. To resolve this problem, we propose a transformation process that transforms a sequence diagram into an activity diagram which represents scenarios as a type of control flows. In addition, we generate test cases from the activity diagram by applying a test coverage concept. Finally, we present a case study for test cases generation from a sequence diagram.

• KIPS Transactions on Software and Data Engineering
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• v.2 no.11
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• pp.765-778
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• 2013

This paper proposes a test case generation method for Stateflow model using the extended RRT method. The RRT method which has been popularly used for planning paths for complex systems also shows a good performance for test case generation. However, it does not consider the test coverage which is important for test case generation. The proposed extension method hires the concept of test goal achievement to increase test coverage and drives RRT extension in the direction that increases the goal achievement. Considering the concept, a RRT distance metric, random node generation method and modified RRT extension algorithm are proposed. The effectiveness of proposed algorithm is compared with that of the typical RRT algorithm through the experiment using the practical automotive ECUs.

• The KIPS Transactions:PartA
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• v.16A no.4
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• pp.245-254
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• 2009

With the increasing adoption of embedded processors, the need of developing compilers for the embedded processors with timely manner is also growing. Retargeting has been adopted as a viable approach to constructing new compilers by modifying the back-end of an existing compiler. This paper proposes a test suite generation system for testing retargetable C compilers. The proposed system generates the test suite using the grammar coverage concept. Generally, the size of the test suite satisfying the grammar coverage of the source language is very large. Hence, the proposed system also provides the facility to reduce the size of the test suite. According to the experimental result, the reduced test suite can detect 75% of the compiler faults detected by the original test suite though the size of the reduced test suite is only 10% of that of the original test suite in average. This result indicates that the reduction technique proposed in this paper can be effectively used in the prior phase of the development procedure of the embedded compilers.

• Journal of Astronomy and Space Sciences
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• v.25 no.3
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• pp.291-298
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• 2008

With the growth of civil and commercial applications, the Global Navigation Satellite System(GNSS) that provides the positioning, navigation, and timing information affects to our life. In order to meet all the requirements of civilian user, new positioning technology with the accuracy of 10cm level has been applied and the positioning accuracy is getting improved. In this study, dual coverage(DAEJ, SUWN) GPS measurements were applied to improve the positioning accuracy for GPS L1 single frequency users. We processed some GPS data obtained from the distributed test sites in the wide area over Korea Peninsula. As a result, the combined solution output using dual coverage showed more improved positioning accuracy than that of single coverage.