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http://dx.doi.org/10.3745/KIPSTA.2009.16-A.4.245

Test Suit Generation System for Retargetable C Compilers  

Woo, Gyun (부산대학교 정보컴퓨터공학부)
Bae, Jung-Ho (부산대학교 컴퓨터공학과)
Jang, Han-Il (슈어소프트테크 소프트웨어 시험자동화연구소)
Lee, Yun-Jung (부산대학교 U-Port 사업단)
Chae, Heung-Seok (부산대학교 정보컴퓨터공학부)
Publication Information
The KIPS Transactions:PartA / v.16A, no.4, 2009 , pp. 245-254 More about this Journal
Abstract
With the increasing adoption of embedded processors, the need of developing compilers for the embedded processors with timely manner is also growing. Retargeting has been adopted as a viable approach to constructing new compilers by modifying the back-end of an existing compiler. This paper proposes a test suite generation system for testing retargetable C compilers. The proposed system generates the test suite using the grammar coverage concept. Generally, the size of the test suite satisfying the grammar coverage of the source language is very large. Hence, the proposed system also provides the facility to reduce the size of the test suite. According to the experimental result, the reduced test suite can detect 75% of the compiler faults detected by the original test suite though the size of the reduced test suite is only 10% of that of the original test suite in average. This result indicates that the reduction technique proposed in this paper can be effectively used in the prior phase of the development procedure of the embedded compilers.
Keywords
Compiler Testing; Retargetable C Compiler; Embedded System; Intermediate Code;
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