• Journal of Korea Multimedia Society
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• v.19 no.8
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• pp.1288-1296
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• 2016

The reliable detection of the limited defect in TFT-LCD images is difficult due to the small intensity difference with the background. However, the proposed detection method reliably detects the limited defect by enhancing the TFT-LCD image based on the cumulative histogram and then detecting the defect through the mean and standard deviation of the enhanced image. Notably, an image enhancement using a cumulative histogram increases the intensity contrast between the background and the limited defect, which then allows defects to be detected by using the mean and standard deviation of the enhanced image. Furthermore, through the comparison with the histogram equalization, we confirm that the proposed algorithm suppresses the emphasis of the noise. Experimental comparative results using real TFT-LCD images and pseudo images show that the proposed method detects the limited defect more reliably than conventional methods.

• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.1053-1056
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• 2004

Chunghwa Picture Tubes, LTD. (CPT) has developed a Novel TFT-LCD Driving Techniquel. This new technique is developed in combination with other state-of-the-art image processing solutions such as image compression / decompression, motion detection, and noise reduction. By applying the Novel Driving Technique to the high resolution TFT-LCD, it was found that the response time can be effectively reduced with a lower overall system cost by smaller frame memory requirement, lower EMI by less memory band-width. Likewise, higher display quality can also be achieved in that the unexpected noises generated by over-drive can be eliminated. The Novel TFT-LCD Driving Technique has been successfully implemented to the 30 inch WXGA (1280${\times}$768) resolution TFT LCD commercial TV module. It was found that the quality of moving picture was better improved compared with that of the conventional fast response driving method.

• Proceedings of the IEEK Conference
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• 2001.06b
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• pp.225-228
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• 2001

We simulated and analyzed the flicker phenomena in the poly-Si TFT-LCD using PSpice for the development of wide-area and high-quality LCD display We define the electric quantity of flicker in the TFT-LCD, which is the ratio of half frame frequency (30Hz) to DC (0 Hz) frequency. We compared two different types of TFTs, excimer laser annealed (ELA) poly-Si TFT and silicide mediated crystallization (SMC) poly-Si TFT, and found that the ELA and SMC TFTs show different flicker characteristics because of their mobility and leakage current. In addition, we showed that the gate voltage should be chosen carefully at the minimum flicker because of the larger leakage current of poly-Si Tn as compared with a-Si TFT

• Proceedings of the Korean Society of Computer Information Conference
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• 2013.01a
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• pp.103-106
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• 2013

3D LCD Module은 기존 TFT-LCD에 Parallax Barrier 방식과 Passive Glasses 방식 및 Active Glass 방식의 기술을 적합하여 만들어 진다. 현재는 3D Module 제작 후 기타 ASSY 장치를 부착 하여 시제품 출시 전에 3D 패턴을 기반으로 출하 검사를 통해 제품 이상 유무를 검사하다 보니 제품 출하 검사 시 불량 요인으로 불량 제품에 대한 모든 Repair공정을 위해 많은 시간 및 인력, 자재 등의 많은 로스 부분이 발생 하여 생산성 절감 및 제품 원가 상승의 요인이 발생 한다. 따라서 본 논문에서 제안하고자 하는 내용은 기존의 2D TFT-LCD Module 검사장비에 3D Pattern 및 동영상을 구현하여 보다 신속 하고 정확한 임베디드 환경을 이용한 2D 및 3D LCD Module용 검사 시스템을 개발 하는데 있다.

• Proceedings of the KIEE Conference
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• 2007.10a
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• pp.151-152
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• 2007

본 논문은 TFT-LCD 영상에서 결함을 자동검색하여 결함이 있는 LCD 영상의 경우 결함이 있는 LCD 패턴을 정확하게 추출해 내는 방법을 제안하였다. TFT-LCD 영상에서 결함이 있는 LCD 패턴 검색은 세단계로 이루어진다. 1단계는 먼저 입력영상에서 LCD 패턴영상의 특징을 이용하여 각 LCD 패턴의 기준점을 찾는다. 2단계는 1단계에서 찾은 여러 기준점 중에서 필터링과정을 통하여 정확한 한 개의 기준점을 최종 선택한다. 마지막으로 3단계에서는 최종적으로 선택된 기준점을 이용하여 결함정의(결함중심 및 결함사이즈)를 이용하여 결함이 포함되어 있는 LCD 패턴을 추출한다. 제안된 결함패턴 추출 알고리즘의 정확성은 컴퓨터 시뮬레이션을 통하여 그 효용성을 증명하였다.

• 한국정보디스플레이학회:학술대회논문집
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• 2009.10a
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• pp.1115-1117
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• 2009

Resist patterning of all layers in TFT and BM layer in CF were carried out using UV-imprinting Lithography to make a 12.1 inch TFT-LCD panel at the resolution of 1280 ${\times}$ 800 lines (125 ppi). Technical challenges and solutions for resist patterning by UV-imprinting are shown in this article.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.12 no.5
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• pp.2038-2047
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• 2011

This paper presents a framework for production planning for a Slim MES(Manufacturing Execution System) of module operations in TFT-LCD(Thin Film Transistor-Liquid Crystal Display) production lines. There are differences in the line configurations and functions among the module operations in the TFT-LCD production systems. This paper presents the framework for the customized MES reflecting these differences. First, a production process is figured out through the analysis of the TFT-LCD module operations. Next, a mathematical modeling is presented reflecting the constraints of shop floors and an optimal schedule is presented through a case example. And a scheduling process using the dispatching rules reflecting the status of shop floors is presented and the performances are measured and compared. Finally, a design process for the Slim MES framework is presented.

• Journal of Korea Multimedia Society
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• v.15 no.4
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• pp.439-448
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• 2012

TFT-LCD panel images have non-uniform brightness, noise signal and defect signal. It is hard to divide defect signal because of non-uniform brightness and noise signal, so various divide methods have being developed. In this paper, we suggest method to divide defective regions on TFT-LCD panel image by estimating a menas of two different size of windows, which is suggested by Eikvil et al., and using difference of them. But in this method, the size of detectable defects is restricted by the size of window, hence it has inefficient problem that the size of window have to increase to divide a large defect region. To solve this problem we suggest an algorithm which can divide various size of defects, by using Multi-scale and restrict a detectable size of defects in each scale. To prove an efficiency of suggested algorithm, we show that resulting images of real TFT-LCD panel images and an artificial image with various defects.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08b
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• pp.1767-1770
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• 2007

The key development issues in the flexible displays are TFT backplane technology for their various applications, which requires competitive device performance as well as its low temperature process. In this paper, with shortly reviewing recent flexible display development status, we describe technical trends of low-temperature a-Si TFTs. Our TFTs show good device characteristics enough to apply LCD and electrophoretic display.

• Journal of the Korean Society for Precision Engineering
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• v.23 no.7 s.184
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• pp.130-137
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• 2006

TFT-LCD(Thin Film Transistor Liquid Crystal Display) module is representative commercial product of FPD(Flat Panel Display). Thickness of TFT-LCD module is very thin. It is adopted for major display unit for IT devices such as Cellular Phone, Camcorder, Digital camera and etc. Due to the harsh user environment of mobile IT devices, it requires complicated structure and tight assembly. And user requirements for the mechanical functionalities of TFT-LCD module become more strict. However, TFT-LCD module is normally weak to high level transient mechanical shock. Since it uses thin crystallized panel. Therefore, anti-shock performance is classified as one of the most important design specifications. Traditionally, the product reliability against mechanical shock is confirmed by empirical method in the design-prototype-drop/impact test-redesign paradigm. The method is time-consuming and expensive process. It lacks scientific insight and quantitative evaluation. In this article, a systematic design evaluation of TFT-LCD module for mobile IT devices is presented with combinations of FEA and testing to support the optimal shock proof display design procedure.