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http://dx.doi.org/10.9717/kmms.2016.19.8.1288

STD Defect Detection Algorithm by Using Cumulative Histogram in TFT-LCD Image  

Lee, SeungMin (Dept. of Electronics Engineering, Graduate School, Kyungpook National University)
Park, Kil-Houm (Dept. of Electronics Engineering, Graduate School, Kyungpook National University)
Publication Information
Journal of Korea Multimedia Society / v.19, no.8, 2016 , pp. 1288-1296 More about this Journal
Abstract
The reliable detection of the limited defect in TFT-LCD images is difficult due to the small intensity difference with the background. However, the proposed detection method reliably detects the limited defect by enhancing the TFT-LCD image based on the cumulative histogram and then detecting the defect through the mean and standard deviation of the enhanced image. Notably, an image enhancement using a cumulative histogram increases the intensity contrast between the background and the limited defect, which then allows defects to be detected by using the mean and standard deviation of the enhanced image. Furthermore, through the comparison with the histogram equalization, we confirm that the proposed algorithm suppresses the emphasis of the noise. Experimental comparative results using real TFT-LCD images and pseudo images show that the proposed method detects the limited defect more reliably than conventional methods.
Keywords
TFT-LCD; Defect Detection; Cumulative Histogram; Image Enhancement;
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Times Cited By KSCI : 2  (Citation Analysis)
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