• 센서학회지
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• 제12권6호
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• pp.273-281
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• 2003

수평 전기로에서 $CdIn_2Te_4$ 다결정을 합성하여 Bridgeman 법으로 3단 수직 전기로에서 $CdIn_2Te_4$ 단결정을 성장하였다. 성장된 결정의 특성은 x선 회절과 광발광 측정으로 조사하였다. $CdIn_2Te_4$ 단결정 시료는 Laue에 배면 반사법에 의해서 (001)면으로 성장되었음을 확인하였다. Hall 효과는 van der Pauw 방법에 의해 측정되었으며, 온도에 의존하는 운반자 농도와 이동도는 293K에서 각각 $8.61{\times}10^{16}/cm^3$, $242\;cm^2/V{\codt}s$였다. $CdIn_2Te_4$ 단결정의 광흡수와 광전류 spectra를 293K에서 10K까지 측정하였다. 광흡수 스펙트럼으로부터 band gap $E_g(T)$는 Varshni공식에 따라 계산한 결과 1.4750eV - $(7.69{\times}10^{-3}\;eV/K)T^2$/(T+2147 K)임을 확인하였다. 막 성장된(as-grown) $CdIn_2Te_4$ 단결정 시료를 Cd-, In-, Te 분위기에서 열처리하여 10K에서 Photoluminescence(PL) spectra를 측정하여 점 결함의 기원을 알아보았다. $CdIn_2Te_4$ 단결정내에서 내재된 결함들의 기원을 10 K에서 광발광을 측정하여 연구되었다. PL 측정으로 부터 얻어진 $V_{Te}$, $Cd_{int}$, $V_{Cd}$, 그리고 $Te_{int}$는 주개와 받개로 분류되어졌다. $CdIn_2Te_4$ 단결정 시료를 Cd 분위기에서 열처리하면 n형으로 변환됨을 악 수 있었고, In 분위기에서 열처리하면 열처리 이전의 PL spectra를 보이고 있어서 $I_2$, $I_1$ 및 S.A emission에 의한 PL peak에는 영향을 주지 않는다고 보았다.

• 한국자기학회지
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• 제21권4호
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• pp.127-131
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• 2011

암염구조를 가진 SiTe에서 일부 Si를 Cr로 치환한 화합물에 대한 전자구조와 자성을 교환상관퍼텔셜에 일반기울기 근사를 쓴 full potential linearized augmented plane wave 에너지 띠 계산방법을 이용하여 연구하였다. Si 대신 25 %의 Cr을 치환한 $CrSi_3Te_4$ 및 50 %를 치환한 $CrSiTe_2$를 고려하였다. 총에너지 계산으로 $CrSi_3Te_4$는 11.64 a.u, $CrSiTe_2$는 a = 7.89 a.u., c = 11.13 a.u.의 평형격자상수를 가짐을 알았다. $CrSiTe_2$는 단위부피당 정수인 $4{\mu}_B$의 자기모멘트를 가지는 반쪽금속성을 나타냈으며, $CrSi_3Te_4$는 단위부피당 자기모멘트가 $4{\mu}_B$보다 미세하게 컸다. 두 화합물 모두에서 치환되어 들어간 Cr은 $3.6{\mu}_B$ 정도의 자기모멘트를 가졌으며, Si나 Te는 약하게 자기화되었다. 계산된 스핀분극 상태밀도를 이용하여 이 두 화합물의 자성을 논의하였다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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• pp.229-230
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• 2008

본 논문에서는 비정질-결정질간 가역적 상변화 기록 매질로 이용되고 있는 $(Ag_{5.5}In_{6.5}Sb_{59}Te_{29})$ 합금 박막의 Ag 조성 증가에 따른 원자구조와 상변화 특성간의 상관관계를 연구하였다. 실험에 사용된 AgInSbTe 조성은 5N의 금속 파우더를 용융-냉각법으로 벌크를 제작하였고 열증착 방법으로 Si (100) 및 유리(corning glass, 7059) 기판위에 200 nm 두께로 박막을 증착하였다. 비정질 박막의 결정화속도를 평가하기 위해서 658 nm의 LD가 장착된 나노-펄스 스캐너를 이용하여 power; 1~17mW, pulse duration; 10~460 ns의 범위에서 각 조성의 상변화에 따른 반사도 차이를 측정, 비교 분석하였다. 또한 각각의 박막을 $100^{\circ}C$ 에서 $300^{\circ}C$까지 $50^{\circ}C$ 간격으로 $N_2$ 분위기에서 1시간동안 열처리 한 후 XRD와 UV-Vis-NIR spectrophotometer를 사용하여 각 상의 구조분석 및 광학적 특성을 분석하였으며, 4-point probe로 면저항을 측정하였다.

• Nuclear Engineering and Technology
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• 제51권3호
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• pp.731-737
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• 2019

In this study, a new measurement method based on voltage transients in CdZnTe detectors response to low energy photon irradiations is applied to measure the electron mobility (${\mu}_e$) and electron mobility-lifetime product $({\mu}{\tau})_e$ in a CdZnTe detector. In the proposed method, the pulse rise times are derived from low energy photon response to 59.5 keV($^{241}Am$), 88 keV($^{109}Cd$) and 122 keV($^{57}Co$) ${\gamma}-rays$ for the irradiation of the cathode surface at each detector for different bias voltages. The electron $({\mu}{\tau})_e$ product was then determined by measuring the variation in the photopeak amplitude as a function of bias voltage at a given photon energy using a pulse-height analyzer. The $({\mu}{\tau})_e$ values were found to be $(9.6{\pm}1.4){\times}10^{-3}cm^2V^{-1}$ for $1000mm^3$, $(8.4{\pm}1.6){\times}10^{-3}cm^2V^{-1}$ for $1687.5mm^3$ and $(7.6{\pm}1.1){\times}10^{-3}cm^2V^{-1}$ for $2250mm^3$ CdZnTe detectors. Those results were then compared with the literature $({\mu}{\tau})_e$ values for CdZnTe detectors. The present results indicate that, the electron mobility ${\mu}_e$ and electron $({\mu}{\tau})_e$ values in CdZnTe detectors can be measured easily by applying voltage transients response to low energy photons, utilizing a fast signal acquisition and data reduction and evaluation.

• 한국기계가공학회지
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• 제6권4호
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• pp.50-56
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• 2007

This study aims to find the optimal cutting conditions, when are IR Detection device HgCdTe is machined with diamond tool of diamond turning machine. Machining technique for HgCdTe with single point diamond turning tool is reported in this paper. The main factors influencing the machined surface quality are discovered and regularities of machining process are drawn. It has been found HgCdTe has more and more important applications in the field of modern optics. The purpose of our research is to find the optimum machining conditions for ductile cutting of HgCdTe and apply the SPDT technique to the manufacturing of ultra precision optical components of brittle materials.

• 한국전기전자재료학회논문지
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• 제19권10호
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• pp.918-922
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• 2006

Chalcogenide Phase change memory has the high performance necessary for next-generation memory, because it is a nonvolatile memory with high programming speed, low programming voltage, high sensing margin, low power consumption and long cycle duration. To minimize the power consumption and the program voltage, the new composition material which shows the better phase-change properties than conventional $Ge_2Sb_2Te_5$ device has to be needed by accurate material engineering. In the present work, we investigate the basic thermal and the electrical properties due to phase-change compared with chalcogenide-based new composition $Ge_1Se_1Te_2$ material thin film and convetional $Ge_2Sb_2Te_5$ PRAM thin film. The fabricated new composition $Ge_1Se_1Te_2$ thin film exhibited a successful switching between an amorphous and a crystalline phase by applying a 950 ns -6.2 V set pulse and a 90 ns -8.2 V reset pulse. It is expected that the new composition $Ge_1Se_1Te_2$ material thin film device will be possible to applicable to overcome the Set/Reset problem for the nonvolatile memory device element of PRAM instead of conventional $Ge_2Sb_2Te_5$ device.

• 한국재료학회지
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• 제33권7호
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• pp.295-301
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• 2023

Thermoelectric (TE) energy harvesting, which converts available thermal resources into electrical energy, is attracting significant attention, as it facilitates wireless and self-powered electronics. Recently, as demand for portable/wearable electronic devices and sensors increases, organic-inorganic TE films with polymeric matrix are being studied to realize flexible thermoelectric energy harvesters (f-TEHs). Here, we developed flexible organic-inorganic TE films with p-type Bi_0.5Sb_1.5Te₃ powder and polymeric matrices such as poly(3,4-eethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) and poly (vinylidene fluoride) (PVDF). The fabricated TE films with a PEDOT:PSS matrix and 1 wt% of multi-walled carbon nanotube (MWCNT) exhibited a power factor value of 3.96 µW·m^-1·K^-2 which is about 2.8 times higher than that of PVDF-based TE film. We also fabricated f-TEHs using both types of TE films and investigated the TE output performance. The f-TEH made of PEDOT:PSS-based TE films harvested the maximum load voltage of 3.4 mV, with a load current of 17.4 µA, and output power of 15.7 nW at a temperature difference of 25 K, whereas the f-TEH with PVDF-based TE films generated values of 0.6 mV, 3.3 µA, and 0.54 nW. This study will broaden the fields of the research on methods to improve TE efficiency and the development of flexible organic-inorganic TE films and f-TEH.

• 한국재료학회지
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• 제7권1호
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• pp.40-49
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• 1997

기계적 합금화 공정과 가압소결법으로 $Bi_{2}(Te_{0.9}Se_{0.1})_{3}$ 열전재료를 제조하여, 가압소결온도 및 dopant첨가에 따른 미세구조와 열전특성의변화를 연구하였다. 평균 3.6mm 크기의 Bi, Te, Se granule을 볼과 원료금속의 무게비 5:1에서 3 시간 기계적 합금화 하므로써 $Bi_{2}(Te_{0.9}Se_{0.1})_{3}$ 합금분말의 형성이 완료되었다. $Bi_{2}(Te_{0.9}Se_{0.1})_{3}$ 가압소결체의 성능지수는 $450^{\circ}C$ 이상의 온도에서 가압소결시 급격히 증가하였으며, $550^{\circ}C$에서 가압소결한 시편에서 $1.9{\times}10^{-3}/K$의 값을 얻었다. $550^{\circ}C$에서 가압소결한 $Bi_{2}(Te_{0.9}Se_{0.1})_{3}$의 성능지수는 acceptor dopant 인 Bi를 0.015wt %첨가함에 따라 $2.1{\times}10^{-3}/K$로 향상되었다.

• 한국전기전자재료학회논문지
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• 제20권1호
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• pp.86-91
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• 2007

Contact material is widely used as electrical parts. Ag-CdO has a good wear resistance and stable contact resistance. But the disadvantages of Ag-Cd alloy are coarse Cd oxides and harmful metal, Cd. Then Ag-Sn alloy that has stable and fine Sn oxide at high temperature has been developed. In order to investigate the effect of Te additional that affects the formation of the oxide layer on the surface and the formation of oxide in matrix Ag, we studied the microstructures and properties of Ag-Sn-In(-Te) material fabricated by rapid solidification process. The experimental procedure were melting using high frequency induction, melt spinning, and internal oxidation. Specimens were examined and analyzed by Transmission electron microscopy(TEM), energy dispersive X-ray spectroscopy(EDS) and Vickers hardness. As a result, internal oxidation was completed even at $600^{\circ}C$. Te forms coarse $In_{2}TeO_{6}$ phase and makes fine and well dispersed $SnO_{2}$ Phase. 0.3 wt% Te shows favorable properties.

• 한국진공학회지
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• 제6권S1호
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• pp.34-42
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• 1997

Hg-Te-CdTe superlattices have received much interests over the last several years as a potential material for its applications for detecting devices and optoelectronics. We have grown the HgTe-CdTe superlattice using MBE. in our lab. We have carried out DCRC spectroscopy after growth of HgTe-CdTe superlattice with varying the superlattice periods and controlling the barrier thickness and we have that the presence of the main peak and the satellite peaks. We obtained 20 arcsec of FWHM over 100 periods of superlattice. We also note that high peak intensity shows the high quality of the sample and each layer of superlattice has abrupt interfaces. The angular separation between the main peak(m=0) and the first satellite peak(m=$\pm$1) is increased when the barrier layer thickness in superlatice layers are decreased. The separation between the first setellite peak(m=$\pm$1) and the second satellite peak(m$\pm$2) is increased similarly. The number of the satellite peak is a qualitative measure of the interfacial abruptness of the superlattice.