• Title/Summary/Keyword: Surface stitching

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Development and Evaluation of Stitching Algorithm With five Degrees of Freedom for Three-dimensional High-precision Texture of Large Surface (대면적/고정밀 3차원 표면형상의 5자유도 정합법 개발 및 평가)

  • Lee, Dong-Hyeok;Ahn, Jung-Hwa;Cho, Nham Gyoo
    • Journal of the Korean Society of Manufacturing Technology Engineers
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    • v.23 no.2
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    • pp.118-126
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    • 2014
  • In this paper, a new method is proposed for the five-degree-of-freedom precision alignment and stitching of three-dimensional surface-profile data sets. The control parameters for correcting thealignment error are calculated from the surface profile data for overlapped areas among the adjacent measuring areas by using the "least squares method" and "maximum lag position of cross correlation function." To ensure the alignment and stitching reliability, the relationships betweenthe alignment uncertainty, overlapped area, and signal-to-noise level of the measured profile data are investigated. Based on the results of this uncertainty analysis, an appropriate size is proposed for the overlapped area according to the specimen's surface texture and noise level.

The Fast 3D mesh generation method for a large scale of point data (대단위 점 데이터를 위한 빠른 삼차원 삼각망 생성방법)

  • Lee, Sang-Han;Park, Kang
    • Proceedings of the KSME Conference
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    • 2000.11a
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    • pp.705-711
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    • 2000
  • This paper presents a fast 3D mesh generation method using a surface based method with a stitching algorithm. This method uses the surface based method since the volume based method that uses 3D Delaunay triangulation can hardly deal with a large scale of scanned points. To reduce the processing time, this method also uses a stitching algorithm: after dividing the whole point data into several sections and performing mesh generation on individual sections, the meshes from several sections are stitched into one mesh. Stitching method prevents the surface based method from increasing the processing time exponentially as the number of the points increases. This method works well with different types of scanned points: a scattered type points from a conventional 3D scanner and a cross-sectional type from CT or MRI.

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Analysis on Stitched Mode I Specimen Using Spring Elements

  • Tapullima, Jonathan;Sim, Hyung Woo;Kweon, Jin Hwe;Choi, Jin Ho
    • Composites Research
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    • v.32 no.2
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    • pp.102-107
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    • 2019
  • Several studies related to reinforce composites structures in the through thickness direction have been developed along the years. As follows, in this study a new reinforced process is proposed based on previous experimental results using a novel stitching process in T-joints and one-stitched specimens. It was established the need to perform more analysis under standard test methods to obtain a better understanding. FEM analysis were compared after performed mode I interlaminar fracture toughness test, using different stitching patterns to analyze the through thickness strength with reference laminates without stitching. The stitching patterns were defined in $2{\times}2$ and $3{\times}3$, where the upper and lower head of the non-continuous stitching process (I-Fiber) has proven to influence in a higher through thickness strength of the laminate. In order to design the numerical model, cohesive parameters were required to define the surface to surface bonding elements using the cohesive zone method (CZM) and simulate the crack opening behavior from the double cantilever beam (DCB) test.

3D Surface and Thickness Profile Measurements of Si Wafers by Using 6 DOF Stitching NIR Low Coherence Scanning Interferometry (6 DOF 정합을 이용한 대 영역 실리콘 웨이퍼의 3차원 형상, 두께 측정 연구)

  • Park, Hyo Mi;Choi, Mun Sung;Joo, Ki-Nam
    • Journal of the Korean Society for Precision Engineering
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    • v.34 no.2
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    • pp.107-114
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    • 2017
  • In this investigation, we describe a metrological technique for surface and thickness profiles of a silicon (Si) wafer by using a 6 degree of freedom (DOF) stitching method. Low coherence scanning interferometry employing near infrared light, partially transparent to a Si wafer, is adopted to simultaneously measure the surface and thickness profiles of the wafer. For the large field of view, a stitching method of the sub-aperture measurement is added to the measurement system; also, 6 DOF parameters, including the lateral positioning errors and the rotational error, are considered. In the experiment, surface profiles of a double-sided polished wafer with a 100 mm diameter were measured with the sub-aperture of an 18 mm diameter at $10\times10$ locations and the surface profiles of both sides were stitched with the sub-aperture maps. As a result, the nominal thickness of the wafer was $483.2{\mu}m$ and the calculated PV values of both surfaces were $16.57{\mu}m$ and $17.12{\mu}m$, respectively.

Accurate Stitching for Polygonal Surfaces

  • Zhu, Lifeng;Li, Shengren;Wang, Guoping
    • International Journal of CAD/CAM
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    • v.9 no.1
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    • pp.71-77
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    • 2010
  • Various applications, such as mesh composition and model repair, ask for a natural stitching for polygonal surfaces. Unlike the existing algorithms, we make full use of the information from the two feature lines to be stitched up, and present an accurate stitching method for polygonal surfaces, which minimizes the error between the feature lines. Given two directional polylines as the feature lines on polygonal surfaces, we modify the general placement method for points matching and arrive at a closed-form solution for optimal rotation and translation between the polylines. Following calculating out the stitching line, a local surface optimization method is designed and employed for postprocess in order to gain a natural blending of the stitching region.

Effect of Stitching Range on Radiation Dose to Eyeball, Thyroid, Breast, Pelvis in Whole Spine Radiography with Standing Position (선 자세 척추 전장 방사선검사 시 스티칭 범위가 장기(수정체, 갑상샘, 유방, 골반부)의 선량에 미치는 영향)

  • Min-Ji, Hong;Han-Yong, Kim;Dong-Hwan, Kim;Young-Cheol, Joo
    • Journal of the Korean Society of Radiology
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    • v.17 no.1
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    • pp.47-52
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    • 2023
  • In whole spine radiography using the stitching technique, overlapping parts occur in the process of synthesizing the three segmented images, so some anatomical structures may be repeatedly exposed, and it has been thought that the dose increases as the scan range increases. However, in the whole spine radiography using the stitching technique in this study, under the condition that the stitching range is taken in the same three splits, the overlapping area decreases as the stitching range increases, so in the case of breasts included in the overlapping range, the dose value decreased by almost half as the stitching range increased from 90 cm to 105 cm. During spinal full-length radiological examination using the stitching method, an appropriately long stitching range could be set to reduce the exposure dose of the breast.

Regional Linear Warping for Image Stitching with Dominant Edge Extraction

  • Yoo, Jisung;Hwang, Sung Soo;Kim, Seong Dae;Ki, Myung Seok;Cha, Jihun
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.7 no.10
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    • pp.2464-2478
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    • 2013
  • Image stitching techniques produce an image with a wide field-of-view by aligning multiple images with a narrow field-of-view. While conventional algorithms successfully stitch images with a small parallax, structure misalignment may occur when input images contain a large parallax. This paper presents an image stitching algorithm that aligns images with a large parallax by regional linear warping. To this end, input images are first approximated as multiple planar surfaces, and different linear warping is applied to each planar surface. For approximating input images as multiple planar surfaces, the concept of dominant edges is introduced. Dominant edges are defined as conspicuous edges of lines in input images, and extracted dominant edges identify the boundaries of each planar surface. Dominant edge extraction is conducted by detecting distinct changes of local characteristics around strong edge pixels. Experimental results show that the proposed algorithm successfully stitches images with a large parallax without structure misalignment.