• Title/Summary/Keyword: Surface deposition

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Comparative study of microstructure and mechanical properties for films with various deposition rate by magnetron sputtering

  • Nam, Kyung H.;Jung, Yun M.;Han, Jeon G.
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2000.11a
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    • pp.12-12
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    • 2000
  • This paper investigated the effect of the film deposition rate for $CrN_x$ microstructure and mechanical properties. For these purpose, pure Cr an stoichiometric CrN films were deposited with various target power density on Si hardened M2 tool steel. The variation of ni trogen concentration in $CrN_x$ f analyzed by AES and deposition rate was calculated by measuring of thickness using ${\alpha}-step$ profilometer. The microstructure was analyzed by X-Ray Diffract and Scanning Electron Microscopy(SEM), and mechanical properties were evalua residual stress, microhardness and adhesion tests. Deposition rate of Cr and CrN increased as an almost linear function of target power density from $0.25\mu\textrm{m}/min$ and $0.15\mu\textrm{m}/min$ to $0.43\mu\textrm{m}/min$. Residual stresses of Cr and CrN films were from tensi Ie to compressive stress with an increase of deposi tion rate a compressive stresses were increased as more augmentation of deposition r maximum hardness value of $2300kg/\textrm{mm}^2$ and the best adhesion strength correspond HF 1 were obtained for CrN film synthesized at the highest target densitY($13.2W/\textrm{mm}^2$) owing to high residual compressive stress and increasing mobility.

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The Effects of Process parameters on TiN Films deposited by Ion Plating Technique (이온 플레이팅의 TiN코팅층에 미치는 작업인자의 영향)

  • 백응승;권식철;이상로;이건환
    • Journal of the Korean institute of surface engineering
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    • v.23 no.2
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    • pp.24-29
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    • 1990
  • The TiN filmms were deposited on the stainless steel substrates by BARE techinique in order to investigate the effects of process parameters such as source-to-substate distance (15-35cm), N2 pressure(4$\times$10-10 -1$\times$10-3mb)and bias voltage(O-2000V), on the deposition rate, the concentration ratio [N/Ti] and the surface color of the films. The deposition rate was deduced from the weight measurement, the [N/ti] ratio by ESCA. The deposition rate decreased with a relationship of=40.2/D2 where D was source-to-substrate distance. The effect of the bias voltage and the N2pressure on the deposition rate, however, appeared negligble. The [N/Ti] ratio was in the narrow range of 0.7 tp 0.8 It increased slightly with the N2 partial pressure and deceased with the source-to-substrate distance. It was confired by ESCA that a significant amount of oxygen and carbon was contaminated after deposition in the top surface of TiN films. The surface color of TiN film was changed from light gold yellow to reddish gold yellow with increasing [N/Ti] ratio.

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Investigation of the mechanism of Ni-P alloy deposition using by in-situ surface pH measurement during electrodeposition (음극표면 pH 측정에 의한 Ni-P합금의 전착기구 고찰)

  • 이규환;장도연;김동수;이상열;권식철;강성군
    • Journal of the Korean institute of surface engineering
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    • v.35 no.2
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    • pp.93-100
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    • 2002
  • To better understand the codeposition mechanism of phosphorous, surface pH and potential of cathode were measured during electrodeposition of Ni-P alloys. The pH of cathode surface was measured using a flat-bottom glass pH electrode and a 500 mesh gold gauze as cathode. The cathode surface pH was increased with increasing the current density and always higher than the pH in the bulk solution. As a result of overplotting the surface pH and cathode potential on the Pourbaix diagram, it was found that cathode surface shift to the domain of predominant of $H_2$$PO3$-or $H_2$$PO_2$-. Additionally, new deposition mechanism was suggested that $H_2$ $PO_2$- and $H_2$$PO_3$- play important roles in the deposition reaction of Ni-P alloys.

Preliminary Study on the Effects of Out-of-Plane Deposition Angle on Product Characteristics of a UV Photo-Curing Process (UV 광경화 공정에서 평면 외 적층 경사각에 따른 제품 특성 변화에 관한 기초 연구)

  • Jang, Yong-Hun;Ahn, Dong-Gyu;Song, Jae-Guk;Kim, Dong-In;Shin, Bo-Sung
    • Journal of the Korean Society for Precision Engineering
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    • v.34 no.1
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    • pp.65-72
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    • 2017
  • The goal of this paper is to investigate the effects of out-of-plane deposition angle on product characteristics of a UV photo-curing process. Specimens are manufactured from a commercialized UV photo-curing machine, the NOBEL V1.0. The influence of the out-of-plane deposition angle of the specimen on surface characteristics, including morphology of the sloped surface, pick-to-pick distance of convex region, and roughness of the sloped surface, is examined via the observation of the sloped surface. In addition, the influence of the radius of curvature of the specimen on the surface roughness of the sloped surface is evaluated. The effects of the out-of-plane deposition angle on impact strength of specimens are investigated via Izod impact experiments. Finally, we discuss the influence of the out-of-plane deposition angle on failure characteristics of specimens for impact loads.

Fabrication of ZnO inorganic thin films by using UV-enhanced Atomic Layer Deposition

  • Song, Jong-Su;Yun, Hong-Ro;Seong, Myeong-Mo
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.312.1-312.1
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    • 2016
  • We have deposited ZnO thin films by ultraviolet (UV) enhanced atomic layer deposition using diethylznic (DEZ) and water (H2O) as precursors with UV light. The atomic layer deposition relies on alternating dose of the precursor on the surface and subsequent chemisorption of the precursors with self-limiting growth mechanism. Though ALD is useful to deposition conformal and precise thin film, the surface reactions of the atomic layer deposition are not completed at low temperature in many cases. In this experiment, we focused on the effects of UV radiation during the ALD process on the properties of the inorganic thin films. The surface reactions were found to be complementary enough to yield uniform inorganic thin films and fully react between DEZ and H2O at the low temperature by using UV irradiation. The UV light was effective to obtain conductive ZnO film. And the stability of TFT with UV-enhanced ZnO was improved than ZnO by thermal ALD method. High conductive UV-enhanced ZnO film have the potential to applicability of the transparent electrode.

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The Effect of in situ Ultraviolet Irradiation on the Chemical Vapor Deposited ZnO Thin Films (증착 중 자외광 노광에 의한 산화 아연 박막의 특성 변화)

  • Kim, Bo-Seok;Baik, Seung Jae
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.29 no.4
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    • pp.241-246
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    • 2016
  • ZnO thin films have wide application areas due to its versatile properties as transparent conductors, wide-bandgap n-type semiconductors, gas sensor materials, and etc. We have performed a systematic investigation on ultraviolet-assisted CVD (chemical vapor deposition) method. Ultraviolet irradiation during the deposition of ZnO causes chemical reduction on the growing surface; which results in the reduction of the deposition rate, increase in the surface roughness, and decrease of the electrical resistivity. These effects produce larger characteristic variation with various deposition conditions in terms of surface morphology and optical/electrical properties compared to normal CVD deposited ZnO thin films. This versatile controllability of ultraviolet-assisted CVD can provide a larger processing options in the fabrication of nano-structured materials and flexible device applications.

Measurement of Particle Deposition Velocity Toward a Vertical Wafer Surface (수직 웨이퍼상의 입자 침착속도의 측정)

  • Bae, G.N.;Lee, C.S.;Park, S.O.;Ahn, K.H.
    • Korean Journal of Air-Conditioning and Refrigeration Engineering
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    • v.7 no.3
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    • pp.521-527
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    • 1995
  • The average particle deposition velocity toward a vertical wafer surface in a vertical airflow chamber was measured by a wafer surface scanner(PMS Model SAS-3600). Polystyrene latex(PSL) spheres with diameters between 0.3 and $0.8{\mu}m$ were used. To examine the effect of the airflow velocity on the deposition velocity, experiments were conducted for three vertical airflow velocities ; 20, 30, 50cm/s. Experimental data of particle deposition velocity were compared with those given by prediction model suggested by Liu and Ahn(1987).

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INFRARED ABSORPTION MEASUREMENT DURING LOW-TEMPERATURE PECVD OF SILICON-OXIDE FILMS

  • Inoue, Yasushi;Sugimura, Hiroyuki;Takai, Osamu
    • Journal of the Korean institute of surface engineering
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    • v.32 no.3
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    • pp.297-302
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    • 1999
  • In situ measurement of infrared absorption spectra has been performed during low-temperature plasma-enhanced chemical vapor depositiion of silicon-oxide films using tetramethoxysilane as a silicon source. Several absorption bands due to the reactant molecules are clearly observed before deposition. In the plasma, these bands completely disappear at any oxygen mixing ratio. This result shows that most of the tetramethoxysilane molecules are dissociated in the rf plasma, even C-H bonds. Existence of Si-H bonds in vapor phase and/or on the film surface during deposition has been found by infrared diagnostics. We observed both a decrease in Si-OH absorption and an increase in Si-O-Si after plasma off, which means the dehydration condensation reaction continues after deposition. The rate of this reaction is much slower than the deposition ratio of the films.

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A Thermodynamic Analysis on Silicon Consumption during The Chemical Vapper Deposition of Tungsten (텅스텐의 화학증착시 Si소모에 관한 열역학적 분석)

  • 정태희;이정중
    • Journal of the Korean institute of surface engineering
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    • v.23 no.1
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    • pp.27-33
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    • 1990
  • Thermodynamic analysis on silicon consumpton during the chemical vapor deposition of tungten was carried out by calculation equilibrium concerations of all possible product species utilizing a computer progrom according to VCS.(Villars-Cruise-Smith) algorithm. The calculation could show various reaction paths which dominate the tungsten deposition under different process conditions. According to the calculation, the consumption of silicon can also be reduced at a lower total pressure SiH4 without H2 as the reacting gas is most effective for suppression of the excessive consumption of silicon during the deposition process.

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Electroless Ni Plating on Pb-base Ceramics (Pb계 Ceramics 기지상의 무전해 Ni 도금)

  • 민봉기;유종수;최순돈;신현준
    • Journal of the Korean institute of surface engineering
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    • v.32 no.4
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    • pp.487-495
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    • 1999
  • In order to form metallic electrodes on PZT (Pb (Zr, Ti)O$_3$) ceramics, plating conditions for optimal electroless Ni deposition were investigated. Pb in PZT is the major component to inhibit the electroless deposition, because it plays a active role of catalytic poison in plating solution. Adhesion of the electroless Ni deposits is measured by push-pull scale test and peel test. Results such as deposition ability, deposition rate, and thickness of deposits showed in terms of concentration of etchant, composition of catalyzing solution, and composition and pH of electroless bath solution.

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