• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2009년도 춘계학술대회 논문집
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• pp.1109-1110
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• 2009

• 한국정밀공학회지
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• 제20권3호
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• pp.187-193
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• 2003

This paper presents an on-machine measurement method of flatness error fur surface machining processes. There are two kinds of on-machine measurement methods available to measure flatness errors in workpieces: i.e., surface scanning method and sensor scanning method. However, motion errors are often engaged in both methods. This paper proposes an idea to realize a measurement system of flatness errors and its rigorous application for estimation of motion errors of the positioning system. The measurement system is made by modifying the straightness measurement system, which consists of a laser, a CCD camera and processing system, a sensor head, and some optical units. The sensor head is composed of a retroreflector, a ball and ball socket, a linear motion guide unit and adjustable arms. The experimental .results show that the proposed method is useful to identify flatness errors of machined workpieces as well as motion errors of positioning systems.

• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 2001년도 ICCAS
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• pp.127.4-127
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• 2001

Inspection and shape measurement of three-dimensional objects are widely needed in industries for quality monitoring and control. A number of visual or optical technologies have been successfully applied to measure three dimensional surfaces. Especially, the shape measurement using an interferometric principle becomes a successful methodology. However, those conventional interferometric methods to measure surface profile have an inherent shortcoming, namely 2∏ ambiguity problem. The problem inevitably happens when the object to be measured has discontinuous shape due to the repetition of interferometric signal with phase period of 2∏. Therefore, in this paper, we choose as a shape measuring method, ...

• 한국기계가공학회지
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• 제7권1호
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• pp.47-52
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• 2008

We present a 3-D profiler specially devised for the profile measurement of rough surfaces that are difficult to be measured with conventional non-contact interferometer. The profiler comprises multiple two-point-diffraction sources made of single-mode optical fibers. Test measurement proves that the proposed profiler is well suited for the warpage inspection of microelectronics components with rough surface, such as unpolished backsides of silicon wafers and plastic molds of integrated-circuit chip package.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1994년도 춘계학술대회 논문집
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• pp.50-56
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• 1994

Partial discharge on organic insulation surfaces are an important sauce of aging. Furthermore the modern PD measurement technigues are rapid developed as quality control and diagnostic tests to determine the fitness for use of HV equipment employing sol id electrical insulation. This paper deals with theory of conventional PD measurement and new tendency of technical development on PD measurements und evaluations. Finally the Measuring system used for diagnosing the surface aging on the organic insulation at High Voltage Laboratory of Technical University of Darmstadt in Germany is presented.

• 대한기계학회논문집A
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• 제32권4호
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• pp.347-353
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• 2008

Reflected light can be decomposed into specular and diffuse components according to the light reflectance theory and experiments. The specular component appears in smooth surfaces mainly, while the diffuse one is visible in rough surfaces mostly. Therefore, each component can be used in forming their correlations to a surface roughness. However, they cannot represent the whole surface roughness seamlessly, because each formulation is merely validated in their available surface roughness regions. To solve this problem, new approaches to properly blend two light components in all regions are proposed in this paper. First is the weighting function method that a blending zone and rate can be flexibly adjusted, and second is the neural network method based on the learning from the measurement data. Simulations based on the light reflectance theory were conducted to examine its performance, and then experiments conducted to prove the enhancement of the measurement accuracy and reliability through the whole surface roughness regions.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 추계학술대회 논문집
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• pp.36-39
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• 2000

A small electrical potential difference which appears on any solid body when subjected to illumination by a modulated light beam generated by laser is called photocharge voltage(PCV)[1,2]. This voltage is proportional to the induced change in the surface electrical charge and is capacitatively measured on various materials such as conductors, semiconductors, ceramics, dielectrics and biological objects. The amplitude of the detected signal depends on the type of material under investigation, and on the surface properties of the sample. In photocharge voltage spectroscopy measurements[3], the sample is illuminated by both a steady state monochromatic bias light and the pulsed laser. The monochromatic light is used to created a variation in the steady state population of trap levels in the surface and space charge region of semiconductor samples which does result in a change in the measured voltage. Using this technique the spatial variation of PCV can be utilized to evaluate the surface conditions of the sample and the variation of the PCV due to the monochromatic bias light are utilized to characterize the surface states. A qualitative analysis of the proposed measurement is present along with experimental results performed on amorphous silicon samples. The deposition temperature was varied in order to obtain samples with different structural, optical and electronic properties and measurements are related to the defect density in amorphous thin film.

• 한국지리정보학회지
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• 제27권1호
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• pp.1-11
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• 2024

현재 측정되는 많은 데이터가 지표를 기반으로 측정되지만, 측정지점의 높이값이 기초자료로 활용되지 않기 때문에, 3차원 지리정보시스템에 활용하고자 할 때 어려움이 발생한다. 지표면에 많은 양을 표시하기 위해서는 지형정보를 이용하여 지표면에 점을 그리거나, 지표면의 각 측정지점의 높이값을 추출하여 다각형을 생성하는 방법이 다양하게 사용될 수 있다. 본 연구에서는 다양한 형태의 데이터 표현 방법 중 지표면에 표현되는 시계열 측정 데이터의 시각화 성능을 향상시키기 위한 데이터 구축 및 표시 방법을 시도하고, 그 절차와 장단점을 살펴본다.

• 정보저장시스템학회논문집
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• 제8권2호
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• pp.44-49
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• 2012

We measured the surface flatness of both sides for refractive media using the transmitted digital holography method. To enhance the accuracy of the result, phase-shifting system was used. With two different phase modulation of reference beam, the phase profile of object can be easily obtained. Thus, we proposed the surface measurement method which can measure large area fast, compared with conventional methods. To guarantee the reliability of obtained result, we compared with Zygo measurement system. With the proposed method, the surface flatness of $3.45{\mu}m$ resolution could be obtained.

• 한국가스학회지
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• 제4권1호
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• pp.49-54
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• 2000

구조물에 존재하는 균열을 측정하기 위해 DCPD법이 널리 사용되고 있다. 본 연구를 통해 표면균열의 성장뿐만 아니라 형상변화도 측정 가능한 다채널 DCPD 시스템을 개발하였고, 이를 위한 전용 소프트웨어를 개발하였다. DCPD 시스템을 CT 시편에 적용하여 그 효용성을 검증한 후, 넓은 평판에 존재하는 표면균열 측정실험에 시스템을 적용하였다. 표면균열 성장시 개발한 다채널 DCPD 시스템을 적응함으로써 효과적이고 정확한 균열측정이 가능하다는 결론을 얻었다.