• Journal of Korea Society of Industrial Information Systems
• /
• v.12 no.3
• /
• pp.116-123
• /
• 2007

Despite the number of backlight manufacturer is increased as the market of flat panel display equipments and related development devices is enlarged, the inspection based on the human eye is still used in many backlight production lines. The defects such as particle, spot and scratch on the light emitting surface of the backlight prevent the LCD device from displaying the colors correctly. From that manual inspection it is difficult to maintain the quality of backlight consistently because the accuracy and the speed of the inspection may change with the physical condition of the operater. In this paper we studied on the development of automatic backlight surface defect inspection system. For this, we made up of the computer vision system and we developed the main program with various user interfaces to operate the inspection system effectively. And we developed the image processing module to extract the defect information. Furthermore, we presented the labeling process to reconstruct defect regions using the labeling table and the defect index. From the experimental results, we found that our system can detect all defect regions identified from human eye and it is sufficient to substitute for the conventional surface inspection.

• Journal of Institute of Control, Robotics and Systems
• /
• v.22 no.8
• /
• pp.627-632
• /
• 2016

In this paper, we propose a new vision-based defect inspection system for the surface of hot slabs. To minimize the influence of self-emission from slab surfaces with high temperature, an optic method based on blue LED light and a blue pass filter is proposed. Because the slab surface is partially covered with scales, which are unavoidable oxidized substances caused during manufacturing, it is difficult to distinguish between vertical cracks and scale. In order to resolve this problem and to improve the detection performance, the use of a Gabor filter and dynamic programming are proposed. Finally, the effectiveness of the proposed method is shown by means of experiments conducted on images of hot slabs that were obtained from an actual slab production line.

• Journal of the Korea Institute of Information and Communication Engineering
• /
• v.19 no.7
• /
• pp.1737-1742
• /
• 2015

In the industrial field for product inspection needs not only on the surface of the product but also the internal components defect inspection. Generally, optical inspection is mainly used for item inspection from production process. However, this is only to check defect of surface it is difficult to perform inspection of goods internal. To overcome these limitations, Instead of optical device by using the portable X- ray DR image acquisition device system developed to obtain an image in real time at the same time and determine product defects. After obtaining the X- ray image, the inspection product within error range is passed after machine image processing. Also, the results and numbers are stored by users.

• 한국정보디스플레이학회:학술대회논문집
• /
• 2004.08a
• /
• pp.325-327
• /
• 2004

Novel surface profiler system for inspection of the display components is demonstrated In the case of the liquid crystal display, for example, not only the flatness of the alignment film but also the quality of rubbing can be inspected. Furthermore, the shape of the component such as the color filter, electrode and mirror can be inspected without removing each component.

• Proceedings of the Korean Society of Precision Engineering Conference
• /
• 1995.10a
• /
• pp.952-956
• /
• 1995

It is known that the 3D Solid CAD system can provide various information which is useful for implementing CAPP and CAE. However the commercial 3D CAD systems available today do not support the handling of non-geometric information such as geometry tolerance and surface finish. It is impossible to input the non-geometric information during designof parts while CAPP needs the information for selecting machine tools. fiztures, inspection method, etc. In this paper the need of research on handling tolerance information In 3D CAD systems is considered. The development of inspection planning support system is also explained with an example. The development of inspection planning support systm receives the design geometry information from the 3D CAD system in the form of 2D draft and generates the inspection data base and the inspection sheet through the user interaction.

• Journal of the Korean Society of Manufacturing Technology Engineers
• /
• v.24 no.6
• /
• pp.647-652
• /
• 2015

A probe pin is a key component of LED inspection equipment. The probe pin makes contact with the LED electrodes and supplies an electric current. Because the mechanical and electrical homogeneity of the probe surface affects the service life and reliability, its characterization is essential. For this study, the hardness was measured using a micro-Vickers hardness test. Moreover, the thicknesses of the plating at different locations and the elemental compositions were examined using an FE-SEM. The uniformity of the plating was found to be acceptable because palladium was detected consistently throughout the tested domain. In addition, the hardness of the surface was determined to be higher than that of the typical palladium range, which is attributed to the use of undercoated nickel.

• Journal of the Korean Society for Precision Engineering
• /
• v.24 no.11
• /
• pp.76-83
• /
• 2007

The dark-field laser scattering system has been developed to inspect surface defects in infrared cut-off filters and then laser scattering characteristics against the defects are investigated. The qualitative analysis for the reliable and accurate detection performance is described through the correlation between incident angles of a laser and viewing ones of a camera. In this paper, reliable and important information with laser scattering is given for the surface defect inspection of IR filters. Its performance has been verified through various experiments.

• Nuclear Engineering and Technology
• /
• v.52 no.4
• /
• pp.856-862
• /
• 2020

Defect inspection system for industrial applications takes the important portion. Non-destructive inspection method has been significantly improved. Infrared thermography, as one of method for non-destructive inspection, can provide relatively precise data and quick inspection time. This study, it was performed to measure defect according to the measurement limit of the non-visible areas such as the back surface of the pipe using reflection plate using reflection plate based on Infrared thermography. The materials of the reflection plate were determined in consideration of the space limitation and the thermal characteristics, and defects were detected by the manufactured reflection plate. Detection of defect in non-visible area using the candidate materials for reflection plate was conducted.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
• /
• 2000.10a
• /
• pp.590-594
• /
• 2000

One of the most important factors for a leather quality inspection is its surface condition. So far a leather quality level has been discriminated by human's eye inspection, But, these kinds of method needs a lot of labor time and cause decision mistakes from an optical illusion. It means leather quality inspection is very subjective and there is no consistency. In this study, we present computer vision based a leather quality inspection system using an Artificial intelligence. Suggested system ran give standard spec for a leather quality and take human inspection duty place.

• Journal of Institute of Control, Robotics and Systems
• /
• v.4 no.3
• /
• pp.384-391
• /
• 1998

When a device is mounted on the PCB, it is impossible to have zero defects due to many unpredictable problems. Among these problems, devices with bent corner leads due to mis-handling and which are not placed at a given point measured along the axis are principal problem in SMT(Surface Mounting Technology). It is obvious that given the complexity of the inspection task, the efficiency of a human inspection is questionable. Thus, new technologies for inspection of SMD(Surface Mounting Device) should be explored. An example of such technologies is the Automated Visual Inspection(AVI), wherein the vision system plays a key role to correct this problem. In implementing vision system, high-speed and high-precision are indispensable for practical purposes. In this paper, a new algorithm based on the Radon transform which uses a projection technique to inspect the FIC(Flat Integrated Circuit) device is proposed. The proposed algorithm is compared with other algorithms by measuring the position error(center and angle) and the processing time for the device image, characterized by line scan camera.