• Journal of Korean Society for Quality Management
• /
• 제41권1호
• /
• pp.135-148
• /
• 2013

Purpose: This paper presents a method to evaluate the stockpile reliability of propelling charge for performance and storage safety with storage time. Methods: We consider a performance failure level is the amount of muzzle velocity drop which is the maximum allowed standard deviation multiplied by 6. The lifetime for performance is estimated by non-linear regression analysis. The state failure level is assumed that the content of stabilizer is below 0.2%. Because the degradation of stabilizer with storage time has both distribution of state and distribution of lifetime, it must be evaluated by stochastic process method such as gamma process. Results: It is estimated that the lifetime for performance is 59 years. The state distribution at each storage time can be shown from probability density function of degradation. It is estimated that the average lifetime as $B_{50}$ life is 33 years from cumulative failure distribution function curve. Conclusion: The lifetime for storage safety is shorter than for performance and we must consider both the lifetime for storage safety and the lifetime performance because of variation of degradation rate.

• Journal of Korean Society for Quality Management
• /
• 제38권4호
• /
• pp.504-511
• /
• 2010

A fuze detonator comprising star shells is an important device so that its failure usually leads to failure of the shells. In this paper, accelerated degradation tests of RD1333 (lead azide) using temperature stress were performed, and then degradation data of explosive power for the detonator were analyzed to predict the storage lifetime of detonator. Degradation data analysis to estimate the storage lifetime is based on a distribution-based degradation process. Statistical distribution parameters of explosive power degradation measures at each time were estimated for each temperature level, and then reliability of the detonator for each accelerated temperature level was estimated using both time-varying distribution parameters and critical level of explosive power. Arrhenius model was applied to estimate storage lifetime of the detonator under the field temperature condition. Accelerated distribution-based degradation analysis to estimate storage lifetime is explained in detail, and estimation results are compared to field data of storage lifetime in this paper.

• Journal of Electrical Engineering and Technology
• /
• 제13권3호
• /
• pp.1173-1184
• /
• 2018

The lifetime of a lithium-ion battery is one of the most important issues of the energy storage system (ESS) because of its stable and reliable operation. In this paper, the lifetime management method of the lithium-ion battery for energy storage system is proposed. The lifetime of the lithium-ion battery varies, depending on the power usage, operation condition, and, especially the selected depth of discharge (DOD). The proposed method estimates the total lifetime of the lithium-ion battery by calculating the total transferable energy corresponding to the selected DOD and achievable cycle (ACC) data. It is also demonstrated that the battery model can obtain state of charge (SOC) corresponding to the ESS operation simultaneously. The simulation results are presented performing the proposed lifetime management method. Also, the total revenue and entire lifetime prediction of a lithium-ion battery of ESS are presented considering the DOD, operation and various condition for the nations of USA and Korea using the proposed method.

• Journal of the Korea Institute of Military Science and Technology
• /
• 제14권5호
• /
• pp.888-896
• /
• 2011

A white smoke hand grenade, KM8 is used to make smoke screen in order to provide visual field interceptions or signals. The grenade fails when its time to emit smoke is longer than the specified emission time so that the smoke concentration becomes lighter. This paper considered failure in smoke emission time, and evaluated its storage lifetime. The main objective of this paper is to modify the present specification limits of smoke emission time for the efficient process control in manufacturing, through analyzing effect of its specification change on the storage lifetime, based on the lifetime evaluation results. Accelerated degradation test was performed and then failure in smoke emission time was reproduced from the test. And estimated storage lifetimes from the accelerated test results was compared to evaluated lifetimes of grenades using the ASRP data. Past process testing results of the grenade in manufacturing were analyzed in this paper. Then, each storage lifetime for the specifications, ${\pm}3$ and ${\pm}5$ in seconds, extended from the current specification in manufacturing were estimated using the past testing results, and compared to one another.

• Journal of the Korea Institute of Military Science and Technology
• /
• 제13권2호
• /
• pp.336-341
• /
• 2010

The burning interruption between the initiator and the delay column in a Zr-Ni K1 delay system used for a K510 fuze occurs with long-time storage. About 10 % failure probability of 15-years stored delay systems shows the failure mode in open literature. This paper shows storage lifetime improvement results for the delay system through changing the single-base delay column into double-base ones and controlling the manufacturing processes especially the initial inclusion of humidity. The double-base delay columns was implemented by inserting one delay column of fast burning rates between the initiator and the previous delay column of slow burning rates. Accelerated aging tests of the delay systems with double-base columns, and then the firing tests were performed to evaluate the improved lifetime. The double-base delay columns shows improved storage lifetime of the delay system through preventing the failure mode.

• Journal of Korean Society for Quality Management
• /
• 제40권3호
• /
• pp.270-277
• /
• 2012

Purpose: In this paper, storage lifetime of delay system in the fuse of 81MM illuminating projectile is estimated. Methods: Accelerated degradation testings of tungsten delay system using both temperature and humidity stresses were performed, and then delay time increase of the systems were analyzed as degradation data based on distribution-based degradation processes. Results: The estimated storage lifetime of detonator is between 11.8 years and 17.6 years with each stress-life relationship. Conclusion: Comparing with field data, storage lifetime of 90% reliability is about 12 years.

• Proceedings of the KIPE Conference
• /
• 전력전자학회 2016년도 전력전자학술대회 논문집
• /
• pp.423-424
• /
• 2016

Recently, the mass production of Energy storage system (ESS) is actively perform around world. Energy storage system is a technique that stores power to energy storage device to supply energy into grid and load at peak-load. Therefore, the efficient energy management is available by using ESS system. The life of Lithium-ion battery is varied corresponding to the power usage, especially selected depth of discharge (DOD). The lifetime of battery is the one of the most issue of the ESS system because of its stability and reliability. Therefore, lifetime management of battery and power converter of ESS module is required. In this paper, the battery lifetime management method estimating residual power and lifetime of lithium ion battery of ESS system is proposed. Also, total avenue prediction of ESS system is simulated considering the total lifetime of battery.

• Korean Journal of Air-Conditioning and Refrigeration Engineering
• /
• 제13권11호
• /
• pp.1156-1164
• /
• 2001

This study aims to suggest envelope structure which can improve the insulation performance of cold storage warehouse with cost effectiveness. Envelope structures are classified and economical efficiency of each type is evaluated to the model warehouse. As results, type 3 (PC wall) and 4(sandwich panel wall) have benefits to the middle/large (lifetime of 25 years) and small (lifetime of 12∼13 years) warehouse, respectively.

• Journal of Internet of Things and Convergence
• /
• 제7권4호
• /
• pp.9-14
• /
• 2021

In computing systems that require high reliability, the method of predicting the lifetime of a storage device is one of the important factors for system management because it can maximize usability as well as data protection. The life of a solid state drive (SSD) that has recently been used as a storage device in several storage systems is linked to the life of the NAND flash memory that constitutes it. Therefore, in a storage system configured using an SSD, a method of accurately and efficiently predicting the lifespan of a NAND flash memory is required. In this paper, a method for optimizing the lifetime prediction of a flash memory-based storage device using the frequency of NAND flash memory failure is proposed. For this, we design a cost matrix to collect the frequency of defects that occur when processing data in units of Drive Writes Per Day (DWPD). In addition, a method of predicting the remaining cost to the slope where the life-long finish occurs using the Gradient Descent method is proposed. Finally, we proved the excellence of the proposed idea when any defect occurs with simulation.

• Journal of Internet of Things and Convergence
• /
• 제9권3호
• /
• pp.81-86
• /
• 2023

SSD (solid state disk), which is flash memory-based storage device, has the advantages of high density and fast data processing. Therefore, it is being utilized as a storage device for high-capacity data storage systems that manage rapidly increasing big data. However, flash memory, a storage media, has a physical limitation that when the write/erase operation is repeated more than a certain number of times, the cells are worn out and can no longer be used. In this paper, we propose a method for converting defective multi-bit cells into single-bit cells to reduce the defect rate of flash memory and extend its lifetime. The proposed idea distinguishes the defects and treatment methods of multi-bit cells and single-bit cells, which have different physical characteristics but are treated as the same defect, and converts the expected defective multi-bit cells into single-bit cells to improve the defect rate and extend the overall lifetime. Finally, we demonstrate the effectiveness of our proposed idea by measuring the increased lifetime of SSD through simulations.