• Title/Summary/Keyword: Standard TTL

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Multiplexer as selector to select different speed (Normal speed, High speed and Super high speed) to display CAR at different speed to color TV system

  • Adhikari, Ganesh
    • International Journal of Advanced Culture Technology
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    • v.10 no.3
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    • pp.332-338
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    • 2022
  • The article presents a concept of designing a Multiplexer circuit which acts as a "Selector" and that becomes capable to select different speed created at different TTL Gate configurations; Standard TTL(Normal Speed), High Speed TTL(High Speed), Schottky TTL(Super High Speed) and further connect the selected Gate speed to the CAR shape created using C-Programming at Computer Graphics and finally CAR shape display at different speed to the color TV. The Multiplexer supporting efficient and more reliable selection criteria using "Logical based selection criteria" and further the output from multiplexer is provided to CAR shape created using c-programming and finally CAR shape is display to color TV system. Basic purposes and assumptions regarding the design and development of this system as well as a description of its operation have been presented.

Breakdown and Destruction Characteristics of the TTL IC by the Artificial Microwave (인위적인 전자파에 의한 TTL IC의 오동작 및 파괴 특성)

  • Hong, Joo-Il;Hwang, Sun-Mook;Huh, Chang-Su
    • Journal of the Korean Society of Safety
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    • v.22 no.5
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    • pp.27-32
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    • 2007
  • We investigated the damage of the TTL ICs which manufactured five different technologies by artificial microwave. The artificial microwave was rated at a microwave output from 0 to 1000W, at a frequency of 2.45GHz. The microwave power was extracted into a standard rectangular waveguide(WR-340) and TTL ICs were located into the waveguide. TTL ICs were damaged two types. One is breakdown which means no physical damage is done to the system and after a reset the system is going back into function. The other is destruction which means a physical damage of the system so that the system will not recover without a hardware repair. TTL SN74S08N and SN74ALS08N devices get a breakdown and destruction occurred but TTL SN74LS08N, SN74AS08N and 74F08N devices get a destruction occurred. Also destructed TTL ICs were removed their surface and a chip conditions were analyzed by SEM. The SEM analysis of the damaged devices showed onchipwire and bondwire destruction like melting due to thermal effect. The tested results expect to be applied to the fundamental data which interprets the combination mechanism of the semiconductors from artificial microwave environment.

A Study on the Design of the 32-Bit Floating-Pint Processor (32Bit Floating-Point Processor의 설계에 관한 연구)

  • Lee, Kun;Kim, Duck-Jin
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.20 no.4
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    • pp.24-29
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    • 1983
  • In this paper, a floating-point processor which satisfied the subset of the proposed IEEE standard has been designed and realized by TTL chips. This processor consists of a floating-point arithmetic unit and a control sequencer. AHPL has been used in the design of sequencer. The execution times for the arithmetic operations were measured and compared with other microprocessor. The results had shown faster operations compared to the Z-80 processor. Though this processor was built by TTL chips, it could be fabricated as a one-chip processor.

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A Bit-serial Encoder of (255, 223) Reed-Solomon code ((225, 223) RS 부호의 직렬부호기)

  • 조용석;이만영
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.13 no.5
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    • pp.429-436
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    • 1988
  • This paper presents a method of designing a Bit-Serial Reed-Solomon encoder using Berlekamp's Bit-Serial Multiplier Algorithm and the implementation of the (255, 223) Bit-Serial Reed-Solomon encoder using TTL logics. It is shown from these results that this encoder require substanitially less hardware than the convenional Reed-Solomon encoders.

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A Study on I/O Buffer Modeling to Supply PCB Simulation (PCB시뮬레이션을 지원하기 위한 입출력 버퍼 모델링에 관한 연구)

  • 김현호;이용희;이천희
    • Proceedings of the IEEK Conference
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    • 2000.11b
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    • pp.345-348
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    • 2000
  • In this paper, We described the procedures to generate an input-output buffer information specification (IBIS) model in digital IC circuits. We gives the method to describe IBIS standard I/O for the characteristics of I/O buffer and to represent its electrical characteristics. The parameters of I/O structure for I/O buffer modelling are also referred, and an IBIS model for CMOS, TTL IC, ROM and RAM constructed amounts about 216. This IBIS model can be used to the simulation of signal integrity of high speed circuits in a PCB level.

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