• 제목/요약/키워드: Soldering Temperature Profile

검색결과 5건 처리시간 0.019초

적외선 램프를 이용한 비접촉식 태양전지셀 솔더링 장치 개발에 관한 연구 (A Study on the Development of Noncontact Soldering Device of PV Cells Using Infrared Lamp)

  • 노태정;김선진;박민용
    • 한국산학기술학회논문지
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    • 제14권1호
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    • pp.45-50
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    • 2013
  • Photopia를 활용하여 적외선 램프 반사부의 각 형상에 대한 조도 분포를 해석하여 최적인 원호 형상으로 설계하였다. 적외선 온도센서를 통해 태양전지셀의 솔더링 온도를 피드백 받아서 설정된 솔더링 온도 프로파일과의 오차를 제어값으로서 IR 램프의 전류를 실시간으로 제어하는 솔더링 온도의 폐루프 제어시스템을 구현하였다. HMI 조작반에 의해 쉽게 운전되고, PLC와 IR 램프 제어기에 의하여 강인하게 제어되는 IR 램프 열원을 사용한 태양전지셀의 비접촉식 솔더링 장치를 개발하였다.

진공 솔더링 공정 중 웨이퍼 온도균일화 제어 (Temperature Uniformity Control of Wafer During Vacuum Soldering Process)

  • 강민식;지원호;윤우현
    • 반도체디스플레이기술학회지
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    • 제11권2호
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    • pp.63-69
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    • 2012
  • As decreasing size of chips, the need of wafer level packaging is increased in semi-conductor and display industries. Temperature uniformity is a crucial factor in vacuum soldering process to guarantee quality of bonding between chips and wafer. In this paper, a stepwise iterative algorithm has been suggested to obtain output profile of each heat source. Since this algorithm is based on open-loop stepwise iterative experimental technique, it is easier to implement and cost effective than real time feedback controls. Along with some experiments, it was shown that the suggested algorithm can remarkably improve temperature uniformity of wafer during whole heating process compared with the ordinary manual trial-and error method.

Reflow Profiling The Benefits of Implementing a Ramp-to-Spike Profile

  • AIM
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 2000년도 Proceedings of 5th International Joint Symposium on Microeletronics and Packaging
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    • pp.17-17
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    • 2000
  • The issue of reflow profiling continues to be a complex topic. The pains often associated with profiling can be reduced greatly if certain guidelines are followed and if there is a strong understanding of the variables that can be encountered during the reflow process. This paper shall discuss the appropriate guidelines and trouble shooting methods for reflow profiling, and in particular shall focus upon the benefits of implementing the linear ramp-to-spike profile. Delta T(T) is defined as the variation of temperature found on an assembly during the reflow process. Too large of a T can result in soldering defects, so to combat T a Ramp-Soak-Spike(RSS) reflow profile often is utilized. However, when using a newer-style reflow oven, the T often is minimized or eliminated, thus, the soak zone of the reflow profile becomes an unnecessary step. Because of this, the implementation of a linear Ramp-To-Spike(RTS) reflow profile should be considered. Benefits such as reduced energy costs, reduced solder defects, increased efficiency, improved wetting, and a simplification of the reflow profile process may be experienced when using the RTS profile. Included in this paper are the suggested process parameters for setting up the RSS and RTS profiles and the chemical and metallurgical reactions that occur at each set point of these profiles. The paper concludes with a discussion and pictures of several profile-related defects. Each of these defects is described, analyzed, and instructions are given for troublshooting these defects.

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COG(chip on glass) 구조에서 유리를 투과하는 레이저 조사 방식에 의한 area array type 패키지의 마운팅 공정

  • 이종현;김원용;이용호;김영석
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 2001년도 The IMAPS-Korea Workshop 2001 Emerging Technology on packaging
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    • pp.119-126
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    • 2001
  • Chip-on-glass(COG) mounting of area array electronic packages was attempted by heating the rear surface of a contact pad film deposited on a glass substrate. The pads consisted of an adhesion(i.e. Cr or Ti) and a top coating layer(i.e. Ni or Cu) was heated by an UV laser beam transmitted through the glass substrate. The laser energy absorbed on the pad raised the temperature of a solder ball which is in physical contact with the pad, forming a reflowed solder bump. The effects of the adhesion and top coating layer on the laser reflow soldering were studied by measuring temperature profile of the ball during the laser heating process. The results were discussed based on the measurement of reflectivity of the adhesion layer. In addition, the microstructures of solder bumps and their mechanical properties were examined.

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유리 기판을 투과하는 레이저 빔을 사용한 COG(chip-on-glass) 마운팅 공정 (COG(chip-on-glass) Mounting Using a Laser Beam Transmitting a Glass Substrate)

  • 이종현;문종태;김원용;김용석
    • 마이크로전자및패키징학회지
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    • 제8권4호
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    • pp.1-10
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    • 2001
  • 유리 기판상에 증착된 패드(pad)의 접합부 가열에 의한 면배열(area array) 형태 선자 패키지의 chip-on-glass(COG) 마운팅 공정이 시도되었다. 패드는 접합층(즉, Cr 또는 Ti)과 상부 코팅층(즉, Ni 또는 Cu)으로 구성되었으며, 이 중 접합층이 유리 기판을 투과하는 UV레이저에 의해 가열되었다. 접합층에 흡수된 레이저 에너지는 열전노 과정을 통하여 패드와 물리적으로 접촉되어 있는 솔더볼의 온도를 상승시켰으며, 리플로우 과정을 통하여 솔더 범프를 형성하였다. 레이저 가열 동안 솔더볼의 온도 이력(profile)을 측정함으로써 레이저 리플로우 솔더링시 접합층 및 상부 코팅층의 영향이 조사되었다. 그 결과들은 접합층의 반사율 측정 견과에 기초하여 논의되었다. 아울러 솔더 범프의 미세구조와 기계적 특성이 조사되었다.

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