• JSTS:Journal of Semiconductor Technology and Science
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• v.17 no.1
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• pp.65-78
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• 2017

Single Event Transient has a critical impact on highly integrated logic circuits which are currently common in various commercial and consumer electronic devices. Reliability against the soft and intermittent faults will become a key metric to evaluate such complex system on chip designs. Our previous work analyzing soft errors was focused on parallelizing and optimizing error propagation procedures for individual transient faults on logic and sequential cells. In this paper, we present a new propagation technique where a fault binary decision diagram (BDD) continues to merge every new fault generated from the subsequent logic gate traversal. BDD-based transient fault analysis has been known to provide the most accurate results that consider both electrical and logical properties for the given design. However, it suffers from a limitation in storing and handling BDDs that can be increased in size and operations by the exponential order. On the other hand, the proposed method requires only a visit to each logic gate traversal and unnecessary BDDs can be removed or reduced. This results in an approximately 20-200 fold speed increase while the existing parallelized procedure is only 3-4 times faster than the baseline algorithm.

• Journal of Institute of Control, Robotics and Systems
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• v.13 no.6
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• pp.519-524
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• 2007

The OBC(on-board computer) of a satellite which plays a role of the controller for the satellite should be equipped with preventive measures against transient errors caused by SEU(single event upset). Since memory devices are pretty much susceptible to these transient errors, it is essential to protect memory devices against SFU. A common method exploits an error detection and correction code and additional memory devices, combined with periodic memory scrubbing. This paper proposes an effective memory scrubbing scheme for the OBC of STSAT-2. The memory system of the OBC is briefly mentioned and the reliability of the information stored in the memory system is analyzed. The result of the reliability analysis shows that there exist optimal scrubbing periods achieving the maximum reliability for allowed overall scrubbing overhead and they are dependent on the significance of the information stored. These optimal scrubbing periods from a reliability point of view are derived analytically.

• Nuclear Engineering and Technology
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• v.49 no.8
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• pp.1589-1599
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• 2017

Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-critical application development of nuclear power plant instrumentation and control systems. The high logic density and advancements in architectural features make static random access memory (SRAM)-based FPGAs suitable for complex design implementations. Devices deployed in the nuclear environment face radiation particle strike that causes transient and permanent failures. The major reasons for failures are total ionization dose effects, displacement damage dose effects, and single event effects. Different from the case of space applications, soft errors are the major concern in terrestrial applications. In this article, a review of radiation effects on FPGAs is presented, especially soft errors in SRAM-based FPGAs. Single event upset (SEU) shows a high probability of error in the dependable application development in FPGAs. This survey covers the main sources of radiation and its effects on FPGAs, with emphasis on SEUs as well as on the measurement of radiation upset sensitivity and irradiation experimental results at various facilities. This article also presents a comparison between the major SEU mitigation techniques in the configuration memory and user logics of SRAM-based FPGAs.

• Proceedings of the Korean Society For Composite Materials Conference
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• 2005.04a
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• pp.172-175
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• 2005

The numerical simulation is performed for the acoustic emission and the wave propagation due to fiber breakage in single fiber composite plates by the finite element transient analysis. The acoustic emission and the following wave motions from a fiber breakage under a static loading is simulated to investigate the applicability of the explicit finite element method and the equivalent volume force model as a simulation tool of wave propagation and a modeling technique of an acoustic emission. For such a simple case of the damage event under static loading, various parameters affecting the wave motion are investigated for reliable simulations of the impact damage event. The high velocity and the small wave length of the acoustic emission require a refined analysis with dense distribution of the finite element and a small time step. In order to fulfill the requirement for capturing the exact wave propagation and to cover the 3-D simulation, we utilize the parallel FE transient analysis code and the parallel computing technology.

• Proceedings of the PSK Conference
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• 2002.10a
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• pp.314.2-314.2
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• 2002

DNA topoisomerases catalyze changes in DNA topology through cycles of transient DNA strand breakage and religation. During this process. the active site tyrosine in human DNA topoisomerase Ⅰ(Top Ⅰ) becomes covalently linked to the 3'-ends of a single-stranded nick in the DNA duplex, Stabilization of the Top Ⅰ-DNA cleavable complex is the common initial event leading to the cytotoxicity of top 1 inhibitors. (omitted)

• International Journal of Fluid Machinery and Systems
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• v.2 no.4
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• pp.269-277
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• 2009

The current paper focuses on the analysis of transient cavitating flow in pressurised polyethylene pipes, which are characterized by viscoelastic rheological behaviour. A hydraulic transient solver that describes fluid transients in plastic pipes has been developed. This solver incorporates the description of dynamic effects related to the energy dissipation (unsteady friction), the rheological mechanical behaviour of the viscoelastic pipe and the cavitating pipe flow. The Discrete Vapour Cavity Model (DVCM) and the Discrete Gas Cavity Model (DGCM) have been used to describe transient cavitating flow. Such models assume that discrete air cavities are formed in fixed sections of the pipeline and consider a constant wave speed in pipe reaches between these cavities. The cavity dimension (and pressure) is allowed to grow and collapse according to the mass conservation principle. An extensive experimental programme has been carried out in an experimental set-up composed of high-density polyethylene (HDPE) pipes, assembled at Instituto Superior T$\acute{e}$cnico of Lisbon, Portugal. The experimental facility is composed of a single pipeline with a total length of 203 m and inner diameter of 44 mm. The creep function of HDPE pipes was determined by using an inverse model based on transient pressure data collected during experimental runs without cavitating flow. Transient tests were carried out by the fast closure of the ball valves located at downstream end of the pipeline for the non-cavitating flow and at upstream for the cavitating flow. Once the rheological behaviour of HDPE pipes were known, computational simulations have been run in order to describe the hydraulic behaviour of the system for the cavitating pipe flow. The calibrated transient solver is capable of accurately describing the attenuation, dispersion and shape of observed transient pressures. The effects related to the viscoelasticity of HDPE pipes and to the occurrence of vapour pressures during the transient event are discussed.

• Journal of Astronomy and Space Sciences
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• v.11 no.1
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• pp.131-145
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• 1994

The Cosmic Ray Experiment (CRE) is one of the modules flown on board the KITSAT-1 satellite and consistes of two sub-systems: the Total Dose Experiment (TDE) and the Cosmic Particl Experiment(CPE). The purpose of CRE is to characterize the space radiation environment as encountered by an Earth-orbiting spacecraft. KITSAT-1 orbit is dominated by the inner Van Allen radiation belt. This region has a large population of high energy protons which contributes significantly to both long-term and transient radiation effects. The data shows that the inner Van Allen radiation belt is very stable and the solar activity influences the CPE, TDE data and SEU(Single Event Upset) rates. The result also shows that much larger high energy particle flux is recorded than the predictions of the CREME code.

• Journal of the Korean Society for Aeronautical & Space Sciences
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• v.32 no.5
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• pp.116-121
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• 2004

Simulation of proton irradiation in space is undertaken with a cyclotron accelerator. The cyclotron is capable of accelerating protons up to 200MeV with nominal fluxes near $10^6-10^8\;protons/cm^2/s$. Accelerated protons are irradiated onto a MPC860 for space application. Both the transient and cumulative responses of the device are found due to the proton irradiation. The primary transient response of the device is modification of the stored data in the circuit, whereas intermittent functional interrupts are also found. The cumulative response of the device is the increase of current consumption by the device.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.13 no.4
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• pp.277-282
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• 2020

This study was initiated to find a way to resolve electronic equipment as it could be affected by multiple environments. The effect of setting the exponential constant wave (iExp) in the telescopic cascade comparator to the SET (Single Event Transient) environment was tested. In this paper, the radio wave delay was measured at 0.46 ㎲ and the gain at 0.713 in the telescopic cascade comparator without setting the SET situation. FET T0 (M6) was measured to have a large spike at 11㎲ to 15㎲ in the telescopic cascade comparator entering the SET situation. FET T1 (M5) has shorted output signals from 10 ㎲ to 16 ㎲. FET T2 (M3) represented a shorted output signal, and FET T3 (M4) measured the output waveform in the form of a large spike waveform. The FET T4 (M1) and FET T5 (M2) are spiky signals. And at all FETs, the propagation delay was changed from 0.45㎲ to 0.54㎲. In summary, The FET element in the telescopic cascade comparator in SET situation was measured to be greatly affected.

• Journal of Electrical Engineering and Technology
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• v.9 no.5
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• pp.1471-1481
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• 2014

This paper presents the new power dissipation model of individual switching device in a high-level modular multilevel converter (MMC), which can be mostly used in voltage sourced converter (VSC) based high-voltage direct current (HVDC) system and flexible AC transmission system (FACTS). Also, the voltage balancing method based on sorting algorithm is newly proposed to advance the MMC functionalities by effectively adjusting switching variations of the sub-module (SM). The proposed power dissipation model does not fully calculate the average power dissipation for numerous switching devices in an arm module. Instead, it estimates the power dissipation of every switching element based on the inherent operational principle of SM in MMC. In other words, the power dissipation is computed in every single switching event by using the polynomial curve fitting model with minimum computational efforts and high accuracy, which are required to manage the large number of SMs. After estimating the value of power dissipation, the thermal condition of every switching element is considered in the case of external disturbance. Then, the arm modeling for high-level MMC and its control scheme is implemented with the electromagnetic transient simulation program. Finally, the case study for applying to the MMC based HVDC system is carried out to select the appropriate insulated-gate bipolar transistor (IGBT) module in a steady-state, as well as to estimate the proper thermal condition of every switching element in a transient state.