• Title/Summary/Keyword: Silicon Material

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Individual Identification by Bite Mark using Silicon Rubber Impression Material (Silicon Rubber Impression Material의 교상 감정에의 이용)

  • 김영구
    • Journal of Oral Medicine and Pain
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    • v.4 no.1
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    • pp.13-21
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    • 1979
  • Cases involving bite marks have increased considerably since first reports of bite wound for the individual identification in Korea 1969. This is probably due to fact that investigating officers are now more aware of the value of bite mark evidence and are always alter to the possibility of sign of bite mark. Authors recently had an experience in the identification of a criminal by tracing marks made on silicon rubber impression from corp genital organ.

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BCSC(Buired contact Solar cel1)의 제조를 위한 laser scribing Laser scrining for Buired contact Solar ell

  • 조은철;지일환;이수홍
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1995.05a
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    • pp.154-159
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    • 1995
  • To achieve a high aspect ration of metal contact, buried contact solar cell scribe the silicon surface using laser. The Q-switched NdLYAG laser which has 1.064$\mu\textrm{m}$ wavelength use for silicon scribing with 25~40$\mu\textrm{m}$ width and 20~200$\mu\textrm{m}$ depth capabilities. The 2~3% shading losses are very low campared to the screen printing solar cell. In this paper, we investigate the silicon scribing theory and pratice, scribing system for BCSC processing.

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Silicon solar cell--Development, Processing and Future (실리콘 태양전지--개발, 공정 및 미래전망)

  • 이수홍
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1994.11a
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    • pp.78-81
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    • 1994
  • The Photovoltaics(PV) industry has been evolving over the last 30 years and expanding because of a rising demand for clean and safe energy. Crystalline silicon solar cells will have increased performance and reduced cost in the future. In this paper solution growth process used to fabricate polycrystalline silicon thin film is considered.

EFFECT OF SURFACE ROUGHNESS ON THE ADHESION OF SILICON WAFERS PRIOR TO BONDING

  • Lee, D. H.;B. Derby
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1998.06a
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    • pp.497-502
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    • 1998
  • To understand the effect of surface roughness on silicon wafer bonding, a continuum mechanical model is presented. This model is based on Obreimoff's experiment and the contact theory of rough surfaces. The surface energy of silicon was calculated to be much reduced than the theoretical value. Problems are discussed concerning surface film effects and the assumption of constant asperity radius and statistical distribution function.

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Deposition of $\alpha$-Si:H thin films by PECVD method (플라즈마 화학증착법을 이용한 $\alpha$-Si:H박막의 제조)

  • 정병후;문대규;임호빈
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1991.10a
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    • pp.63-67
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    • 1991
  • Amorphous silicon films were deposited on glass, [100] single crystal silicon wafer with thermally grown silicon dioxide, and [100] silicon wafer substrates by Plasma Enhanced Chemical Vapor Deposition(with argon diluted silane source gas). Growth rate, UV optical band edge, and the hydrogen quantity in the amorphous silicon films have been investigated as a function of the preparation conditions by measuring film thickness, UV-absorbency, and FT-IR transmittance. The growth rate of the ${\alpha}$-Si:H films increases with increasing substrate temperture, flow rate and R.F. power density. The UV optical band edge shifts to blue with the increases in the deposition pressure. Increasing substrate temperature shifts the UV optical band edge of the films to red. Hydrogen quantity in the ${\alpha}$-Si:H films increases with an increases in the R.F. powr and decreases with an increase in the substrate temperature.

A Study of High-efficiency me-silicon solar cells for SiNx passivation (SiNx passivation에 따른 Solar Cell의 효율향상에 관한 연구)

  • Ko, Jae-Kyung;Lim, Dong-Gun;Kim, Do-Young;Park, Sung-Hyun;Park, Joong-Hyun;Yi, Jun-Sin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.07b
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    • pp.964-967
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    • 2002
  • The effectiveness of silicon nitride SiNx surface passivation is investigated and quantified. This study adopted single-layer antireflection (SLAR) coating of SiNx for efficiency improvement of solar cell. The silicon nitride films were deposited by means of plasma enhanced chemical vapor deposition (PECVD) in planar coil reactor. The process gases used were pure ammonia and a mixture of silane and helium. The thickness and the refractive index on the films were measured by ellipsometry and chemical bonds were determined by using an FT-IR equipment. This films obtained were analyzed in term of hydrogen content, refractive index for gas flow ratio $(NH_3/SiH_4)$, and efficiency of solar cell. The polycrystalline silicon solar cells passivated by silicon nitride shows efficiency above 12.8%.

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Preparation of Silicon Nanoparticles for the Device of Photoluminescence (발광소자를 위한 실리콘 나노 미립자 제작)

  • Choi, Byoung-Jung;Lee, Jung-Hui;Yang, Sung-Chae
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.11a
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    • pp.131-132
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    • 2006
  • We experimentally demonstrated the synthesis of silicon nanoparticles by using high-density ablation plasma prepared by the interaction of an intense pulsed light-ion beam (LIB) with a target. known as the intense pulsed ion beam evaporation (IBE) method. Light emission was obtained from the silicon nanoparticles. It was determined that the ambient gas reaction is very important and useful method to obtain the photoluminescence from the silicon nanoparticles.

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Current Characteristics in the Silicon Oxides (실리콘 산화막의 전류 특성)

  • Kang, C.S.;Lee, Jae Hak
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.29 no.10
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    • pp.595-600
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    • 2016
  • In this paper, the oxide currents of thin silicon oxides is investigated. The oxide currents associated with the on time of applied voltage were used to measure the distribution of voltage stress induced traps in thin silicon oxide films. The stress induced leakage currents were due to the charging and discharging of traps generated by stress voltage in the silicon oxides. The stress induced leakage current will affect data retention in memory devices. The oxide current for the thickness dependence of stress current and stress induced leakage currents has been measured in oxides with thicknesses between $109{\AA}$, $190{\AA}$, $387{\AA}$, and $818{\AA}$ which have the gate area $10^{-3}cm^2$. The oxide currents will affect data retention and the stress current, stress induced leakage current is used to estimate to fundamental limitations on oxide thicknesses.

Buried contact solar cells using tri-crystalline silicon wafer (삼상 실리콘 기판을 사용한 저가 전극 함몰형 태양전지)

  • Kwon, Jea-Hong;Lee, Soo-Hong
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.07a
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    • pp.176-180
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    • 2003
  • Tri-crystalline silicon (Tri-Si) wafers have three different orientations and three grain boundaries. In this paper, tri-Si wafers have been used for the fabrication of buried contact solar cells. The optical and micro-structural properties of these cells after texturing in KOH solution have been investigated and compared with those of cast multi-crystalline silicon (multi-Si) wafers. We employed a cost effective fabrication process and achieved buried contact solar cell (BCSC) energy conversion efficiencies up to 15% whereas the cast multi-Si wafer has efficiency around 14%.

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Optical properties of nanocrystalline silicon thin films depending on deposition parameters (박막증착조건 변화에 따른 실리콘 나노결정 박막의 광학적 특성)

  • Kim, Gun-Hee;Kim, Jong-Hoon;Jeon, Kyung-Ah;Lee, Sang-Yeol
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07a
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    • pp.173-176
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    • 2004
  • Silicon thin films on p-type(100) silicon substrate have been prepared by a pulsed laser deposition(PLD) technique using a Nd:YAG laser. The pressure of the environmental gas during deposition was 1 Torr. After deposition, silicon thin film has been annealed in nitrogen ambient. Strong blue photoluminescence(PL) has been observed at room temperature. We report the optical properties of silicon thin films with the variation of the deposition parameters.

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