• 제목/요약/키워드: Short current

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TRPC-Mediated Current Is Not Involved in Endocannabinoid-Induced Short-Term Depression in Cerebellum

  • Chang, Won-Seok;Kim, Jun;Kim, Sang-Jeong
    • The Korean Journal of Physiology and Pharmacology
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    • v.16 no.2
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    • pp.139-144
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    • 2012
  • It has been reported that activation of metabotropic glutamate receptor 1 (mGluR1) can mediate endocannabinoid-induced short-term depression of synaptic transmission in cerebellar parallel fiber (PF)-Purkinje cell (PC) synapse. mGluR1 has signaling pathways involved in intracellular calcium increase which may contribute to endocannabinoid release. Two major mGluR1-evoked calcium signaling pathways are known: (1) slow-kinetic inward current carried by transient receptor potential canonical (TRPC) channel which is permeable to $Ca^{2+}$; (2) $IP_3$-induced calcium release from intracellular calcium store. However, it is unclear how much each calcium source contributes to endocannabinoid signaling. Here, we investigated whether calcium influx through mGluR1-evoked TRPC channel contributes to endocannabinoid signaling in cerebellar Purkinje cells. At first, we applied SKF96365 to inhibit TRPC, which blocked endocannabinoid-induced short-term depression completely. However, an alternative TRP channel inhibitor, BTP2 did not affect endocannabinoid-induced short-term depression although it blocked mGluR1-evoked TRPC currents. Endocannabinoid signaling occurred normally even though the TRPC current was mostly blocked by BTP2. Our data imply that TRPC current does not play an important role in endocannabinoid signaling. We also suggest precaution in applying SKF96365 to inhibit TRP channels and propose BTP2 as an alternative TRPC inhibitor.

Short Circuit Electromagnetic Force Prediction by Coupled Electromagnetic-Mechanical Field Analysis of Dry-Type Transformer (전자계-기계계 결합해석에 의한 건식변압기의 단락강도 예측)

  • Ahn, Hyun-Mo;Hahn, Sung-Chin
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.60 no.2
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    • pp.301-308
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    • 2011
  • This paper deals with the coupled electromagnetic-mechanical field analysis for short-circuit electromagnetic force of the dry-type transformer. The short-circuit currents are calculated using external circuit in accordance with short-circuit test equipment. According to short-circuit current, the generated magnetic leakage flux density in dry-type transformer model is calculated by finite element method. The radially-directed electromagnetic forces in windings are calculated using electromagnetic field analysis and then axially-directed electromagnetic forces in windings are calculated using electromagnetic-mechanical field analysis. The calculated axially-directed electromagnetic forces in high voltage winding are compared to those of measured ones and showed good agreement with experimental results.

The study of a primary role of Back up Breaker and Making Switch for Short Circuit Test (단락시험에서 후비보호차단기와 투입스위치의 중요 역할)

  • Kim, Sun-Koo;Kim, Seon-Ho;Kim, Won-Man;Roh, Chang-Il;Lee, Dong-Jun;Jung, Heung-Soo
    • Proceedings of the KIEE Conference
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    • 2007.07a
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    • pp.915-916
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    • 2007
  • There are many equipments for the Short Circuit Test, for example Short Circuit Generator, Induction Motor, Sequence Timer, Exciter, CLR, Back Up Breaker, Making Switch and TRV etc. Especially Back up Breaker and Making Switch are very important equipments to test the short circuit test. A role of a Back up Breaker is to break high-voltage and high-current for short circuit test and a Making Switch should be operated always same speed/time and kept electrical-mechanical characteristics to make the voltage and current of short circuit test. This study introduces to the short circuit test also to kinds, principal movements and compare them of Back up Breaker and Making Switch.

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THE STUDY 01 CHARACTERISTICS OF INRUSH CURRENTS FOR HIGH POWER SHORT-CIRCUIT TESTING TRANSFORMER (단락시험용 대전류변압기 돌입전류특성에 관한 연구)

  • Roh, Chang-Il;La, Dae-Ryeol;Kim, Sun-Koo;Jung, Heung-Soo;Kim, Won-Man;Lee, Dong-Jun;Kim, Sun-Ho
    • Proceedings of the KIEE Conference
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    • 2006.07b
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    • pp.695-696
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    • 2006
  • The inrush current of transformer cause saturation effects of recovery voltage for short-circuit power testing. the inrush current depends on the residual flux of the transformer core. when inrush current occurs, it is contains a d.c. component and the high harmonic content of the current are of importance to relay protection of testing circuit. this paper describes of decrease method of inrush current for high power short-circuit testing transformer.

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Analysis of Tunneling Current of Asymmetric Double Gate MOSFET for Ratio of Top and Bottom Gate Oxide Film Thickness (비대칭 DGMOSFET의 상하단 산화막 두께비에 따른 터널링 전류 분석)

  • Jung, Hakkee
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.20 no.5
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    • pp.992-997
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    • 2016
  • This paper analyzes the deviation of tunneling current for the ratio of top and bottom gate oxide thickness of short channel asymmetric double gate(DG) MOSFET. The ratio of tunneling current for off current significantly increases if channel length reduces to 5 nm. This short channel effect occurs for asymmetric DGMOSFET having different top and bottom gate oxide structure. The ratio of tunneling current in off current with parameters of channel length and thickness, doping concentration, and top/bottom gate voltages is calculated in this study, and the influence of tunneling current to occur in short channel is investigated. The analytical potential distribution is obtained using Poisson equation and tunneling current using WKB(Wentzel-Kramers-Brillouin). As a result, tunneling current is greatly changed for the ratio of top and bottom gate oxide thickness in short channel asymmetric DGMOSFET, specially according to channel length, channel thickness, doping concentration, and top/bottom gate voltages.

Research of an On-Line Measurement Method for High-power IGBT Collector Current

  • Hu, Liangdeng;Sun, Chi;Zhao, Zhihua
    • Journal of Power Electronics
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    • v.16 no.1
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    • pp.362-373
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    • 2016
  • The on-line measurement of high-power IGBT collector current is important for the hierarchical control and short-circuit and overcurrent protection of its driver and the sensorless control of the converter. The conventional on-line measurement methods for IGBT collector current are not suitable for engineering measurement due to their large-size, high-cost, low-efficiency sensors, current transformers or dividers, etc. Based on the gate driver, this paper has proposed a current measuring circuit for IGBT collector current. The circuit is used to conduct non-intervention on-line measurement of IGBT collector current by detecting the voltage drop of the IGBT power emitter and the auxiliary emitter terminals. A theoretical analysis verifies the feasibility of this circuit. The circuit adopts an operational amplifier for impedance isolation to prevent the measuring circuit from affecting the dynamic performance of the IGBT. Due to using the scheme for integration first and amplification afterwards, the difficult problem of achieving high accuracy in the transient-state and on-state measurement of the voltage between the terminals of IGBT power emitter and the auxiliary emitter (uEe) has been solved. This is impossible for a conventional detector. On this basis, the adoption of a two-stage operational amplifier can better meet the requirements of high bandwidth measurement under the conditions of a small signal with a large gain. Finally, various experiments have been carried out under the conditions of several typical loads (resistance-inductance load, resistance load and inductance load), different IGBT junction temperatures, soft short-circuits and hard short-circuits for the on-line measurement of IGBT collector current. This is aided by the capacitor voltage which is the integration result of the voltage uEe. The results show that the proposed method of measuring IGBT collector current is feasible and effective.

Control of Short-Channel Effects in Nano DG MOSFET Using Gaussian-Channel Doping Profile

  • Charmi, Morteza
    • Transactions on Electrical and Electronic Materials
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    • v.17 no.5
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    • pp.270-274
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    • 2016
  • This article investigates the use of the Gaussian-channel doping profile for the control of the short-channel effects in the double-gate MOSFET whereby a two-dimensional (2D) quantum simulation was used. The simulations were completed through a self-consistent solving of the 2D Poisson equation and the Schrodinger equation within the non-equilibrium Green’s function (NEGF) formalism. The impacts of the p-type-channel Gaussian-doping profile parameters such as the peak doping concentration and the straggle parameter were studied in terms of the drain current, on-current, off-current, sub-threshold swing (SS), and drain-induced barrier lowering (DIBL). The simulation results show that the short-channel effects were improved in correspondence with incremental changes of the straggle parameter and the peak doping concentration.

Operation Analysis of Full-Bridge Series Resonant Converters with Considering the Load Short (부하단락을 고려한 직렬공진형 컨버어터의 운전해석)

  • Park, Min-Ho;Hong, Soon-Chan;Yoon, Duck-Yong;Park, Young-Jeen;Kim, Ji-Han
    • Proceedings of the KIEE Conference
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    • 1989.07a
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    • pp.608-611
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    • 1989
  • The full-bridge series resonant converter is analyzed to limit the maximum values of the current and the voltage across resonant capacitor in the case of load short. If the converter is operated in the optimal region derived in this paper, the maximum value of short-circuit current will be smaller or equal to that of the current in steady operation. Since the additional facilities for the protection against load short do not need, converters have advantages in weight, size, and cost.

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A study on the secondary side eddy current distribution analysis of a short primary-short secondary single-sided LIM by the finite element method (유한요소법에 의한 단1차 단2차 편측식 선형 유도전동기의 2차측 와전류 분포 해석에 관한 연구)

  • Im, Dal-Ho;Kim, Hak-Lyun;Cho, Yun-Hyun;Kim, Dong-Jin
    • Proceedings of the KIEE Conference
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    • 1989.07a
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    • pp.31-33
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    • 1989
  • In this paper, a short primary-short secondary single-sided LIM which is used as a driving source for automatic conveyor system, is selected as a analysis model. And with a method for analyzing eddy current distribution and thrust force which are produced according to the relative position of primary and secondary, FEM in which current vector potential is introduced is adopted. Also, analysis results are compared with experimental results, so propriety of this at study is proved.

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The effects of sulfur passivation on the performance of ITO/InP solar cells (ITO/InP 태양전지 제작에 응용된 sulfur passivation의 효과)

  • 이영철;한교용
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.34D no.9
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    • pp.50-55
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    • 1997
  • In order to improve the electrical performance of ITO/InP solar cells, sulfur passivation technique was employed using (N $H_{4}$)$_{2}$ $S_{x}$ solution. Passivation effects were analyzed by measuring the short circuit current density ( $J_{sc}$ ) of solar cells and photoluminescence (PL) of ITO/InP interfaces. This paper firstly reports the sulfur passivation effects by investigating the correlation between the PL intensity and the short circuit current. Generally, PL intensity and the short circuit current of sulfur passivated sampels wer eincreased, and showed the same trend. Especially, samples prepared at 60.deg. C (N $H_{4}$)$_{2}$ $S_{x}$ solution exhibited the highest $J_{sc}$ and PL intensity. These results demonstrated that the short circuit currents was influenced by the ITO/InP interface states.

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