• KSII Transactions on Internet and Information Systems (TIIS)
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• 제12권7호
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• pp.3268-3283
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• 2018

With the advent of the Information Age, the source identification of digital images, as a part of digital image forensics, has attracted increasing attention. Therefore, an effective technique to identify the source of digital images is urgently needed at this stage. In this paper, first, we study and implement some previous work on image source identification based on sensor pattern noise, such as the Lukas method, principal component analysis method and the random subspace method. Second, to extract a purer sensor pattern noise, we propose a sample selection method to improve the random subspace method. By analyzing the image texture feature, we select a patch with less complexity to extract more reliable sensor pattern noise, which improves the accuracy of identification. Finally, experiment results reveal that the proposed sample selection method can extract a purer sensor pattern noise, which further improves the accuracy of image source identification. At the same time, this approach is less complicated than the deep learning models and is close to the most advanced performance.

• 한국소음진동공학회논문집
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• 제18권12호
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• pp.1256-1261
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• 2008

This paper proposes a way to measure the displacement of a multi-point by using a pattern recognition from video signal. Generally in measuring displacement, gab sensor, which is a displacement sensor, is used. However, it is difficult to measure displacement by using a common sensor in places where it is unsuitable to attach a sensor, such as high-temperature areas or radioactive places. In this kind of places, non-contact methods should be used to measure displacement and in this study, images of CCD camera were used. When multi-point is measure by using a pattern recognition, it is possible to measure displacement with a non-contact method. It is simple to install and multi-point displacement measuring device so that it is advantageous to solve problems of spatial constraints.

• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 2008년도 추계학술대회논문집
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• pp.675-680
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• 2008

This paper proposes a way to measure the displacement of a multi-point by using a pattern recognition from video signal. Generally in measuring displacement, gab sensor, which is a displacement sensor, is used. However, it is difficult to measure displacement by using a common sensor in places where it is unsuitable to attach a sensor, such as high-temperature areas or radioactive places. In this kind of places, non-contact methods should be used to measure displacement and in this study, images of CCD camera were used. When displacement is measure by using camera images, it is possible to measure displacement with a non-contact method. It is simple to install and multi-point displacement measuring device so that it is advantageous to solve problems of spatial constraints.

• Transactions on Electrical and Electronic Materials
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• 제8권5호
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• pp.196-200
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• 2007

In this paper, we propose and discuss the design using a simple method that reduces the fixed pattern noise(FPN) generated on the amorphous Si($\alpha-Si$) bolometer. This method is applicable to an IR image sensor. This method can also minimize the size of the reference resistor in the readout integrated circuit(ROIC) which processes the signal of an IR image sensor. By connecting four bolometer cells in parallel and averaging the resistances of the bolometer cells, the fixed pattern noise generated in the bolometer cell due to process variations is remarkably reduced. Moreover an $\alpha-Si$ bolometer cell, which is made by a MEMS process, has a large resistance value to guarantee an accurate resistance value. This makes the reference resistor be large. In the proposed cell structure, because the bolometer cells connected in parallel have a quarter of the original bolometer's resistance, a reference resistor, which is made by poly-Si in a CMOS process chip, is implemented to be the size of a quarter. We designed a ROIC with the proposed cell structure and implemented the circuit using a 0.35 um CMOS process.

• 정보처리학회논문지:소프트웨어 및 데이터공학
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• 제4권12호
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• pp.561-570
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• 2015

IT 기술이 급격히 발전함에 따라서 디지털 멀티미디어 장치 및 소프트웨어를 이용한 콘텐츠가 범람하고 있다. 그러나 불법적 목적을 가지고 있는 사용자가 활용함에 따라 이를 이용한 범죄가 증가되고 있고 멀티미디어 포렌식을 통한 콘텐츠의 보호 및 불법 사용 차단의 필요성이 대두되고 있다. 본 논문에서는 센서 패턴 잡음을 이용하여 디지털 영상 획득 장치 판별을 위한 포렌식 기술에 대하여 제안한다. 먼저 광자 탐지기의 빛에 대한 민감도가 불완전해 생기는 센서 패턴 잡음을 검출하기 위한 기술에 대하여 제시한다. 그다음에 참조 영상들에 대하여 센서 패턴 잡음을 추정하고, 검사 영상에 대하여 센서 패턴 잡음을 추정한 후 두 잡음 사이의 유사성 계산을 통하여 디지털 영상을 획득한 장치에 대하여 판별하는 방법을 설명한다. 제안한 기술의 성능 분석을 위하여 DSLR 카메라, Compact 카메라, 스마트폰, 캠코더 등을 포함한 총 10대 장치에 대하여 개발한 알고리즘에 대한 정량적 성능의 분석을 수행하였고, 그 결과 99.6%의 판별 정확도를 달성하였다.

• 전기학회논문지
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• 제65권12호
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• pp.2153-2158
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• 2016

Multimedia such as image, audio, and video is easy to create and distribute with the advance of IT. Since novice uses them for illegal purposes, multimedia forensics are required to protect contents and block illegal usage. This paper presents a multimedia forensic algorithm for video to identify the device used for acquiring unknown video files. First, the way to calculate a sensor pattern noise using Wiener filter (W-SPN) is presented, which comes from the imperfection of photon detectors against light. Then, the way to identify the device is explained after estimating W-SPNs from the reference device and the unknown video. For the experiment, 30 devices including DSLR, compact camera, smartphone, and camcorder are tested and analyzed quantitatively. Based on the results, the presented algorithm can achieve the 96.0% identification accuracy.

• 정보저장시스템학회논문집
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• 제5권2호
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• pp.89-95
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• 2009

We setup the system to measure the noise characteristics of the 5M complementary metal-oxide semiconductor (CMOS) image sensor by generic measurement indicator of Standard mobile imaging architecture (SMIA) which is one of internal standard of mobile imaging architecture. To evaluate the effect of environment and setting parameters, such as temperature and integration time, we measure the variation of the dark signal, dynamic range and fixed pattern noise of image sensor. We also detect the number of defective pixels and cluster defects defined as adjacent single defect pixels at 5M CMOS image sensor. Then, we find the existence of some cluster defects in experiment, which are not expected in calculation.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2009년도 하계학술대회 논문집
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• pp.7-8
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• 2009

In the presence of infrared light, a CMOS Readout IC (ROIC) for a microbolometer typed infrared sensor detects the voltage or current that is caused by the changing in resistance in the bolometer sensor. A serious problem in designing the ROIC is how the value of the bolometer and reference resistors vary because of variations in manufacturing process. Since different pixel have different, resistance values, sensor operations must contend with fixed pattern noise (FPN) problems. In this paper, we propose a novel technique to compensate for the fluctuation in reference resistance by tiling into account the process variation. By using constant current source basing and correlated double sampling, we solved FPN.

• 한국전기전자재료학회논문지
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• 제25권11호
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• pp.857-861
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• 2012

FPN (fixed-pattern-noise) mainly comes from the device or pattern mismatches in pixel and color filter, pixel photodiode leakage in CMOS image sensor. In this paper, optical stack module related pixel FPN was investigated and the classification of pixel FPN contribution with the individual optical module process was presented. The methodology and procedure would be helpful in reducing the greater pixel FPN and distinguishing the complex FPN sources with respect to various noise factors.

• 한국전기전자재료학회논문지
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• 제22권2호
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• pp.119-122
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• 2009

As infrared light radiates, the CMOS Readout IC (ROIC) for the microbolometer typed infrared sensor detects voltage or current which is caused by the variation of resistance in the bolometer sensor. A serious problem we may have in designing the ROIC is the value of bolometer and reference resistors will be changed due to process variation. Since each pixel does not have the same value of resistance, fixed pattern noise problems happen during the sensor operations. In this paper, we propose a novel technique to compensate the fluctuation of reference resistance with taking account of process variation. By using a comparator and a cross coupled latch, we will make the value of reference resistor same as the bolometer's.