• Title/Summary/Keyword: Scanning Probe Microscopy

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Distribution Analysis of the Local Critical Temperature and Current Density in YBCO Coated Conductors using Low-temperature Scanning Laser and Hall Probe Microscopy (저온 주사 레이저 및 홀소자 현미경을 이용한 YBCO 초전도 선재의 국소적 임계 온도 및 전류 밀도 분포 분석)

  • Park, S.K.;Cho, B.R.;Park, H.Y.;Ri, H.C.
    • Progress in Superconductivity
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    • v.13 no.1
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    • pp.28-33
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    • 2011
  • Distribution of the local critical temperature and current density in YBCO coated conductors were analyzed using Low-temperature Scanning Laser and Hall Probe Microscopy (LTSLHPM). We prepared YBCO coated conductors of various bridge types to study the spatial distribution of the critical temperature and the current density in single and multi bridges. LTSLHPM system was modified for detailed linescan or two-dimensional scan both scanning laser and scanning Hall probe method simultaneously. We analyzed the local critical temperature of single and multi bridges from series of several linescans of scanning laser microscopy. We also investigated local current density and hysteresis curve of single bridge from experimental results of scanning Hall probe microscopy.

Analysis of the Local Properties in GdBCO and YBCO Coated Conductors using Low-temperature Scanning Laser and Hall Probe Microscopy (저온 주사 레이저 및 홀소자 현미경을 이용한 GdBCO와 YBCO 초전도 선재의 국소적 특성 분석)

  • Park, S.K.;Ri, H.C.
    • Progress in Superconductivity
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    • v.13 no.3
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    • pp.169-177
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    • 2012
  • Distribution of the local properties in GdBCO and YBCO coated conductors was investigated using Low-temperature Scanning Laser and Hall Probe Microscopy (LTSLHPM). We prepared GdBCO and YBCO coated conductors to study the spatial distribution of the current density in a single bridge. Inhomogeneity of the ${T_c}^{max}$ in the bridge was analyzed from experimental results of Scanning Laser Microscopy (SLM) near the superconducting transition. The local transport and screening current in the bridge were also investigated using Scanning Hall Probe Microscopy (SHPM). A series of line scans of SLM of the GdBCO and YBCO sample showed that lines with more inhomogeneous distributions of ${\delta}V$ had more inhomogeneous distributions of ${T_c}^{max}$. The defect of the superconducting layer of the GdBCO sample caused by damage to the substrate affected the current flow. And we could analyze the redistribution of the current density using SLM and SHPM.

Narrow Resonant Double-Ridged Rectangular Waveguide Probe for Near-Field Scanning Microwave Microscopy

  • Kim, Byung-Mun;Son, Hyeok-Woo;Cho, Young-Ki
    • Journal of Electrical Engineering and Technology
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    • v.13 no.1
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    • pp.406-412
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    • 2018
  • In this paper, we propose a narrow resonant waveguide probe that can improve the measurement sensitivity in near-field scanning microwave microscopy. The probe consists of a metal waveguide incorporating the following two sections: a straight section at the tip of the probe whose cross-section is a double-ridged rectangle, and whose height is much smaller than the waveguide width; and a standard waveguide section. The advantage of the narrow waveguide is the same as that of the quarter-wave transformer section i.e., it achieves impedance-matching between the sample under test (SUT) and the standard waveguide. The design procedure used for the probe is presented in detail and the performance of the designed resonant probe is evaluated theoretically by using an equivalent circuit. The calculated results are compared with those obtained using the finite element method (Ansoft HFSS), and consistency between the results is demonstrated. Furthermore, the performance of the fabricated resonant probe is evaluated experimentally. At X-band frequencies, we have measured the one-dimensional scanning reflection coefficient of the SUT using the probe. The sensitivity of the proposed resonant probe is improved by more than two times as compared to a conventional waveguide cavity type probe.

The Measurement of Nano-grating by Scanning Probe Microscopy Using Digital PID Control (Digital PID Control을 적용한 Scanning Probe Microscopy의 Nano-grating 측정)

  • Park, Gyeong-Deok;Ji, Won-Su;Kim, Dae-Chan;Jang, Dong-Hun;O, Beom-Hwan;Park, Se-Geun;Lee, Il-Hang;Lee, Seung-Geol
    • Proceedings of the Optical Society of Korea Conference
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    • 2008.07a
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    • pp.185-186
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    • 2008
  • In this paper, the nano-grating was measured by Scanning Probe Microscopy (SPM) system using digital Proportion, Integration and Derivative (PID) control. Through this measurement, we could confirm the improvement of the vertical resolution compared with analog Proportion and Integration (PI) control method.

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Vibration Characteristics and Performance of Cantilever for Non-contact Atomic Force Microscopy (비접촉 원자간력 현미경의 탐침 캔틸레버 진동 특성 및 측정 성능 평가)

  • 박준기;권현규;홍성욱
    • Transactions of the Korean Society for Noise and Vibration Engineering
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    • v.14 no.6
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    • pp.495-502
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    • 2004
  • This paper presents the vibration analysis and the performance evaluation of cantilevers with probing tips for non-contact scanning probe microscopy. One of the current issues of the scanning probe microscopy technology is to increase the measurement speed, which is closely tied with the dynamic characteristics of cantilevers. The primary concern in this research is to investigate the relation between the maximum possible speed of non-contact scanning probe microscopy and the dynamic characteristics of cantilevers. First, the finite element analysis is made for the vibration characteristics of various cantilevers in use. The computed natural frequencies of the cantilevers are in good agreement with measured ones. Then, each cantilever is tested with topographic measurement for a standard sample with the scanning speed changed. The performances of cantilevers are analyzed along with the natural frequencies of cantilevers. Experiments are also performed to test the effects of how to attach cantilevers in the piezo-electric actuator. Finally, measurement sensitivity has been analyzed to enhance the performance of scanning probe microscopy.

Performance Evaluation of Non-contact Atomic Force Microscopy Due to Vibration Characteristics of Cantilever (비접촉 원자간력 현미경의 탐침 외팔보 진동특성에 따른 성능 평가)

  • 박준기;권현규;홍성욱
    • Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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    • 2003.05a
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    • pp.263-268
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    • 2003
  • This paper presents a result of performance evaluation fur non-contact scanning probe microscopy with respect to the vibration characteristics of cantilevers with tips. One of the current issues of the scanning probe microscopy technology is to increase the measurement speed, which is closely tied with the dynamic characteristics of cantilevers. The primary concern in this research is to investigate the relation between the maximum possible speed of non-contact scanning probe microscopy and the dynamic characteristics of cantilevers. First, the finite element analysis is made fur the vibration characteristics of various cantilevers in use. The computed natural frequencies of the cantilevers are in good agreement with measured ones. Then, each cantilever is tested with topographic measurement for a standard sample with the scanning speed changed. The performances of cantilevers are analyzed along with the natural frequencies of cantilevers. Experiments are also performed to test the effects of how to attach cantilevers in the piezo-electric actuator. Finally, measurement sensitivity has been analyzed to enhance the performance of scanning probe microscopy.

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나노트라이볼로지 분석을 이용한 W-N 나노박막의 표면 물성 연구

  • Kim, Su-In;Lee, Chang-U
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.08a
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    • pp.133-133
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    • 2011
  • 최근 연구중인 소자들의 크기가 점차 나노 크기를 가짐에 따라서 나노 영역에 대한 물성 분석 연구의 필요성이 대두되고 있다. 특히 나노 크기를 가지는 소자에 대한 기계적 특성은 기존의 마이크로 이상의 소자와는 다른 특성을 보이는 것으로 보고되고 있다. 그러나 이러한 나노 크기에 대한 연구에서 대부분을 차지하는 분광학적, 전기적 방법은 측정 영역 한계와 일정 깊이에 대한 평균적인 정보를 제공하게 된다. 본 연구에서는 나노트라이볼로지 분석의 대표적인 Nano-indenter와 Scanning Probe Microscopy(SPM) 분석을 통하여 박막의 수 혹은 수십 나노 미만의 영역과 깊이에 대한 기계적 물성을 연구하였고, 이를 기반으로 수십 나노 이하 두께를 가지는 W-N 확산박지막에 대한 연구를 실시하였다. 연구 결과에 의하면, 박막의 표면 hardness는 박막의 두께가 감소함에 따라서 4.19 GPa에서 3.51 GPa로 감소하였고, Weibull modulus를 통한 박막의 균일도는 2.75에서 7.91로 급격히 증가하는 현상을 나타내었다. 또한 SPM의 Kelvin probe force microscopy (KPFM), Force modulation microscopy (FMM) mode를 활용하여 표면에서의 Nitrogen 흡착에 의한 영상, 전기적 및 표면 탄성에 대한 연구를 실시하였다.

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Simultaneous Detection of Biomolecular Interactions and Surface Topography Using Photonic Force Microscopy

  • Heo, Seung-Jin;Kim, Gi-Beom;Jo, Yong-Hun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.402.1-402.1
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    • 2014
  • Photonic force microscopy (PFM) is an optical tweezers-based scanning probe microscopy, which measures the forces in the range of fN to pN. The low stiffness leads proper to measure single molecular interaction. We introduce a novel photonic force microscopy to stably map various chemical properties as well as topographic information, utilizing weak molecular bond between probe and object's surface. First, we installed stable optical tweezers instrument, where an IR laser with 1064 nm wavelength was used as trapping source to reduce damage to biological sample. To manipulate trapped material, electric driven two-axis mirrors were used for x, y directional probe scanning and a piezo stage for z directional probe scanning. For resolution test, probe scans with vertical direction repeatedly at the same lateral position, where the vertical resolution is ~25 nm. To obtain the topography of surface which is etched glass, trapped bead scans 3-dimensionally and measures the contact position in each cycle. To acquire the chemical mapping, we design the DNA oligonucleotide pairs combining as a zipping structure, where one is attached at the surface of bead and other is arranged on surface. We measured the rupture force of molecular bonding to investigate chemical properties on the surface with various loading rate. We expect this system can realize a high-resolution multi-functional imaging technique able to acquire topographic map of objects and to distinguish difference of chemical properties between these objects simultaneously.

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Study of Refining Effects on Pulp Fibre by Scanning Probe Microscopy(SPM) (Scanning Probe Microscopy를 이용한 고해 효과 연구)

  • ;Keity Roy Wadhams
    • Journal of Korea Technical Association of The Pulp and Paper Industry
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    • v.30 no.4
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    • pp.49-58
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    • 1998
  • The SPM could image the most detailed microstructure of a sample in a wet and dry state by measuring the interaction between the atoms on the sample surface and the extremely sharp probe tip. The refined fibre exhibited large wrinkles formed by fibrillar bundles, the disintegrated fibres extensively showed “scale-like features”. By using the Non-Contact Atomic Force Microscopy (NC-AFM) and Contact Atomic Force Microscopy (C-AFM) including Phase Detection Microscopy (PDM) and Force Modulation Microscopy (FMM), it was possible to investigate surface topography, surface roughness and mechanical property (hardness or visco-elasticity) of fibre surface in detail. The PDM and FMM images showed that the disintegrated only fibre displayed uniform mechanical properties, whereas the refined one did not. The surface roughness of pulp fibres was higher in refined fibres than in disintegrated fibres due to the presence of external fibrils. These SPM images would be used to provide visual evidence of morphological change of a single fibre created during mechanical treatments such as refining, drying, calendering and so on.

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