1 |
Hazel, J. L. and Tsukruk, V. V., 1999, "Spring Constants of Composite Ceramic/gold Cantilevers for Scanning Probe Microscopy," Thin Solid Films Vol. 339, pp. 249-257.
DOI
ScienceOn
|
2 |
Sarid, D., 1991, Scanning Force Microscopy: with applicarions to electric, Magnetic, and Atomic forces, New York Oxford University Press.
|
3 |
Binning, G. and Quate, C. F., 1986, "Atomic Force Microscope," Phys. Rev. Lett., Vol. 56(9), pp. 930-933.
DOI
ScienceOn
|
4 |
Lee, D., Ono, W. T. and Esashi, M., 2000, "Cantilever with Integrated Resonator for Application of Scanning Probe Microscope," Sensors and Actuators A: Physical, Vol. 83, pp. 11-16.
DOI
ScienceOn
|
5 |
Lee, M., McdDaniel, E. B. and J. W. P. Hsu, 1996, "An Impedance Based Non-contact Feedback Control System for Scanning Probe Microscopes," American Institute of Physics, Rev. Sci. Instrum. 67.
|
6 |
Cozzens, R., 2002, CATIA Version 5: Release 8 & 9, Schroff Development Co.
|
7 |
2000, User's Guide to Autoprobe M5, TM Microscopes
|
8 |
Park, S. K., Kim, Y. H. and Ha, S. K, 2002, "Analysis of Dynamic Behavior of Piezoelectric Atomic Force Microscope Cantilever," Journal of the Korean Society for Noise and Vibration Engineering, Vol. 12, No. 3, pp. 187-194.
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DOI
ScienceOn
|
9 |
Chang, W. S., Shin, B. S. and Whang, K. H., 2003, "Nanoprobe Application Technologies," Journal of the Korean Society of Precision Engineering, Vol. 20, No. 3, pp. 5-14.
|
10 |
Park, S., Hong, I. J. and Nho, Y., 2003, "Scanning probe microscopy," http://www.psia.co.kr.
|