• 제어로봇시스템학회논문지
• /
• 제10권8호
• /
• pp.711-717
• /
• 2004

We propose a path planning method to improve the productivity of SMT (surface mount technology) inspection machines with an area camera. A unified method is newly proposed to determine the FOV clusters and camera sequence simultaneously. The proposed method is implemented by a hybrid genetic algorithm to increase the convergence speed. Comparative simulation results are then presented to verify the usefulness of the proposed algorithm.

• 한국지능시스템학회논문지
• /
• 제13권4호
• /
• pp.480-485
• /
• 2003

인쇄회로기판을 조립하는 SMT (surface mount technology) 라인의 AOI (automatic optical inspection) 형 검사기를 대상으로, 검사시간 단축을 위한 경로계획 방법을 제안한다. 기판에 존재하는 검사 윈도우들은 카메라의 FOV (field-of-view) 크기를 고려하여 클러스터링 되어야 하며, 전체 검사시간의 단축을 위하여 클러스터의 수를 최소화하는 것이 바람직하다. 주어진 기판에 대한 클러스터의 수를 최소화하기 위한 유전자 알고리즘을 새로이 제안하며, 이를 사용한 효과적 경로계획 방법을 제시한다. 상용 검사기를 대강으로 시뮬레이션을 수행하며, 비교 평가를 통하여 제안된 방법의 유용성을 검증한다.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 2003년도 하계학술대회 논문집 D
• /
• pp.2453-2455
• /
• 2003

We propose a path planning method to reduce the inspection time of AOI (automatic optical inspection) machines in SMT (surface mount technology) in-line system. Inspection windows of board should be clustered to consider the FOV (field-of-view) of camera. The number of clusters is desirable to be minimized in order to reduce the overall inspection time. We newly propose a genetic algorithm to minimize the number of clusters for a given board. Comparative simulation results are presented to verify the usefulness of proposed algorithm.

• 제어로봇시스템학회논문지
• /
• 제21권8호
• /
• pp.788-793
• /
• 2015

This paper proposes a path planning algorithm to reduce the inspection time of AOI (Automatic Optical Inspection) machines for SMT (Surface Mount Technology) in-line system. Since the field-of-view of the camera attached at the machine is much less than the entire inspection region of board, the inspection region should be clustered to many groups. The image acquisition time depends on the number of groups, and camera moving time depends on the sequence of visiting the groups. The acquired image is processed while the camera moves to the next position, but it may be delayed if the group includes many components to be inspected. The inspection delay has influence on the overall job time of the machine. In this paper, we newly considers the inspection delay time for path planning of the inspection machine. The unified approach using genetic algorithm is applied to generates the groups and visiting sequence simultaneously. The chromosome, crossover operator, and mutation operator is proposed to develop the genetic algorithm. The experimental results are presented to verify the usefulness of the proposed method.

• 제어로봇시스템학회논문지
• /
• 제21권10호
• /
• pp.982-987
• /
• 2015

The inspection machine in SMT (Surface Mount Technology) line detects the assembly defects such as missing, misalignment, loosing, or tombstone. We propose a new method to classify the defect types of chip components by processing the image of PCB. Two original images are obtained from horizontal lighting and vertical lighting. The image of the component is divided into two soldering regions and one packaging region. The features are extracted by appling the PCA (Principle Component Analysis) to each region. The MLP (Multilayer Perceptron) and SVM (Support Vector Machine) are then used to classify the defect types by learning. The experimental results are presented to show the usefulness of the proposed method.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 2007년도 제38회 하계학술대회
• /
• pp.1758-1759
• /
• 2007

본 논문에서는 표면실장기판을 위한 자동 광학 검사 시스템에서 사용되는 데이터 산출방법에 대한 알고리즘을 제안 한다. 제안된 새로운 부품검사 알고리즘은 검사영역을 분할해 템플릿에서의 매칭률이 가장 높은 부분만을 세밀하게 재검사하는 방법을 사용하여 기존의 방법들보다 시간이 단축 될 뿐만 아니라 많은 양의 메모리를 필요로 하는 템플릿의 패턴들의 메모리 용량상의 문제점을 해결할 수 있다. 실험 결과를 제시하여 제안된 검사 알고리즘을 검증한다.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 2007년도 심포지엄 논문집 정보 및 제어부문
• /
• pp.333-334
• /
• 2007

We propose a path planning method to decrease a inspection lead time of line scan camera in SMT(surface mount technology) in-line system. The inspection window area of printed circuit board should be minimized to consider the FOV(field of view) of line scan camera so that line scan inspector is going to find a optimal solution of path planning. We propose one of the hierarchical clustrering algorithm for a given board. Comparative simulation results are presented to verify the usefulness of proposed method.