• Journal of the Korean Society for Precision Engineering
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• v.26 no.4
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• pp.128-133
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• 2009

Focused-ion-beam (FIB) system is capable of both machining and measuring in nano-scale; hence nano-scale focusing quality is important. This paper investigates design parameters of two electrostatic lenses in order to achieve the best ion beam focusing performance. Commercial SIMION simulator is used to optimize the dimensions of the condenser and objective lenses and investigate the influence of assembly error on focusing quality The simulation results show that the beam focusing quality is not influenced by angle deviation within ${\pm}0.02\;deg$ and geometrical eccentricity within ${\pm}50$ micrometers.

• 대한치주과학회:학술대회논문집
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• 2003.11a
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• pp.9-10
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• 2003

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2005.05a
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• pp.30-34
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• 2005

This paper describes the design and manufacturing of a focused-ion-beam machining system which can make small features of nano size. We use a SIMION simulator in order to obtain the design data of an ion column. The simulation result shows that the focal length of ion beam decreases as the applied voltage of object lens increases. Finally, we obtained the good images of a mesh of 50 micrometers by using the adjustment of applied voltage, acceleration power, and dimension of each elements.

• The Journal of Korean Institute of Information Technology
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• v.16 no.11
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• pp.43-49
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• 2018

Computer simulation was performed using the SIMION program to develop an electron gun for MCP cleaning. The target, MCP, is located 180mm from the source of the electron gun, and the diameter of the MCP is approximately 20mm. Therefore, we tried to find the condition that the beam diameter of electrons reaching the MCP is to be 20mm using four variables such as E, ${\phi}$, d1, d2, where the E is the energy of the electron reaching the MCP, the ${\phi}$ is the diameter of the extractor, and the d1 and the d2 are the distance from the electron source to the end of the extractor tube, and to the wall of chamber, respectively. As a result of simulation, we figuried out that the E and the d2 have little effect on the beam diameter. On the other hand, we also found that the beam diameters were very sensitive to the d1 and varied relatively large with respect to the ${\phi}$, and the d1 was the secondary order function of the ${\phi}$. Therefore we found that this function will allow us to design electron guns that are suitable for the purposes of this study.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.08a
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• pp.183.1-183.1
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• 2013

70 MeV 사이클로트론의 인젝션 빔 라인은 Multi-CUSP 이온원에서 인출된 H- 빔을 펄스 또는 번칭하여 인플렉터를 통해 사이클로트론의 가속영역인 Dee로 전송하는 역할을 한다. 이 때, 빔을 번칭 시킴으로써 가속효율을 높이고, 손실을 줄여 높은 전류의 빔을 공급할 수 있도록 해야한다. 인젝션 시스템은 einzel lens, chopper, buncher, solenoid 등으로 구성된다. Einzel lens는 빔을 buncher의 중심으로 집속시켜 buncher의 번칭 효율을 높이고, buncher는 전기장을 이용하여 빔을 진행방향으로 집속시키는 기능을 갖는다. Chopper는 번칭된 빔을 일정 주기로 편향을 시켜 펄스 빔의 형태로 전송하는 역할을 한다. 솔레노이드는 적절한 자기장을 이용하여 빔을 집속시켜 인플렉터로 전송한다. 본 연구에서는 사이클로트론의 고전류 인젝션 시스템을 구축하고 각각의 구성요소에서 빔 envelope를 계산하고 비교하였다. SIMION code는 user가 지정한 특성을 가진 개별 입자의 궤도를 추적하는 프로그램으로 인젝션 시스템을 구성하는 각각의 컴포넌트에서의 입자의 진행모습과 buncher를 이용하여 빔의 전송 밀도가 향상됨을 확인하였다. 아울러 TRANSPORT 및 TURTLE 프로그램을 이용하여 SIMION을 통해 계산된 빔의 envelope과 비교하였다.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2004.04a
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• pp.500-503
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• 2004

본 연구에서는 금속 원자를 단열 팽창시켜 클러스터를 만들고, 생성된 클러스터를 이온화시킨 후 집속렌즈 및 electric quadrupole을 이용하여 기판으로 증착 하였다. 집속렌즈의 설계에서는 단일 초점 방식의 렌즈보다 성능을 높이기 위하여 이중 초점과 핀홀을 써서 집속 효과 및 효율을 높였다. 렌즈의 설계는 일반적으로 하전입자의 에너지 손실 없이 집속할수 있는 Einzel 렌즈를 기본으로 하였으며, SIMION software 를 사용하여 시뮬레이션 하였다. 시뮬레이션 후 실제 렌즈계 및 정전압원을 제작하여 금(Au)의 클러스터를 생성하여 렌즈계를 통과한 후 실제 기판위로 증착이 되는 것을 AFM(Atomic force microscopy)과 XPS(X-ray photoemission spectroscopy)를 이용해 조사하여 렌즈계가 실제로 동작함을 확인하였다.

• Journal of the Korean Mathematical Society
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• v.51 no.3
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• pp.443-462
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• 2014

Using a simple recurrence relation, we give a new method to compute the Jones polynomials of closed braids: we find a general expansion formula and a rational generating function for the Jones polynomials. The method is used to estimate the degree of the Jones polynomials for some families of braids and to obtain general qualitative results.

• Journal of the Korean Vacuum Society
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• v.12 no.2
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• pp.105-111
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• 2003

In order to find out whether a reflectron can be used as a mass selector in the gas cluster experiment, computer simulation are performed using the SIMION’ program. flight paths of energetic particles in the reflectron does not depend on their mass but energy. In the case of $(CO_2)n $ gas cluster, however, the position of clusters just after passing through the reflectron are spacially distributed with respect to the mass. The reason that the masses spacially distributes is the E/m ratio of clusters is constant, and it is the key reason that a reflectron can be used as a mass selector. Mass resolution does not depend on the cluster size and incident angle of clusters, and it is proportional to the incident position of clusters. This means that mass resolution can be enhanced by resizing the dimension of a reflectron. Therefore, it is concluded that a reflectron can be used as a mass selector with excellent mass resolution in the gas cluster experiment.

• Journal of the Korean Vacuum Society
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• v.20 no.6
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• pp.403-408
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• 2011

To develop the MFX (Micro-Focus X-ray) tube, the trajectories of electrons emitted from the field emission cathode was simulated using SIMION program. Regardless of starting position of the electron in emitter, we found out the fact that there is the optimum extractor voltage Ve, which can focus the electron beam on one place. Extractor voltage Ve varies depending on the source voltage Vs, but the ratio of two voltages (Ve/Vs) is always constant, its value was 99.4%. When the ratio of two voltages (Ve/Vs) was 99.4%, the beam diameter in the cross-over point was $1.2{\mu}m$. Because the focal spot size in MFXG (Micro-Focus X-ray Generator) can not be less than the cross-over diameter within MFX tube, it is important to find out the conditions that can make a smaller beam diameter. Therefore, the above results is considered to be a very important ones in the development of the MFXG.

• Transactions of the Korean Society of Mechanical Engineers B
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• v.30 no.7 s.250
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• pp.638-645
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• 2006

Recently, we reported that significant ion loss occurred prior to its detection in the conventional single particles mass spectrometry and more seriously the loss is ion-kinetic-energy-dependent. These lead to significant error in the measured chemical composition of nanoparticles. Here we attempted to design a novel ion optics that is capable of 100% detection of ions generated from single nanoparticle. Using a commercial software SIMION, we simulated the trajectories of ions launched at different speeds inside the previous single particle mass spectrometer We tested how affect changes in shape of repelling plate, adding Einzel lens, substitution of tube electrode between extraction and acceleration grids. As a results, we could find a best design by assembling the trials in the present condition.