• Journal of the Korean Chemical Society
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• v.38 no.1
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• pp.1-7
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• 1994

Semiempirical MNDO calculations are employed to study ionicity of OH groups and stability in $T_1-OH-T_2bridges(T_1$ = Al, B and $T_2$ = P, Si) such as found in aluminophosphate family($AlPO_4-5$, BAPO-5, and SAPO-5) molecular sieves. Dimeric model clusters of Al-OH-P, B-OH-P and Al-OH-Si bridges were considered. It is shown that the elongation of the T-O bond, upon replacement of Al by B, occurs preferentially by a local deformation of the Al-O-P bridge. But the elongation of the T-O bond occurs preferentially by a rotation of Al-O-Si bridge upon substitution P for Si. Also, the ionicity of OH groups and stability increase in order to B-OH-P < Al-OH-P < Al-OH-Si bridge.

• Bulletin of the Korean Chemical Society
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• v.35 no.5
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• pp.1523-1528
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• 2014

Silicon quantum dots (Si QDs) were synthesized by etching silicon nanopowder with aqueous hydrofluoric acid (HF) and nitric acid ($HNO_3$). Then, the hydride-terminated Si QDs (H-Si QDs) were functionalized by 1- octadecene (ODE). By only controlling the etching time, the maximum luminescence peak of octadecylterminated Si QDs (ODE-Si QDs) was tuned from 404 nm to 507 nm. The average optical gap was increased from 2.60 eV (ODE-Si QDs-5 min) for 5 min of etching to 3.20 eV (ODE-Si QDs-15 min) for 15 min of etching, and to 3.40 eV (ODE-Si QDs-30 min) for 30 min of etching. The electron affinities (EA), ionization potentials (IP), and quasi-particle gap (${\varepsilon}^{qp}_{gap}$) of the Si QDs were determined by cyclic voltammetry (CV). The quasi-particle gaps obtained from the CV were in good agreement with the average optical gap values from UV-vis absorption. In the case of the ODE-Si QDs-30 min sample, the difference between the quasi-particle gap and the average optical gap gives the electron-hole Coulombic interaction energy. The additional electronic levels of the ODE-Si QDs-30 min and ODE-Si QDs-15 min samples determined by the CV results are interpreted to have originated from the Si=O bond terminating Si QD.

• The Korean Journal of Ceramics
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• v.5 no.3
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• pp.224-229
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• 1999

The preparation and toughening of SiC-AIN solid solution from powder mixtures of $\beta$-SiC, AIN and $\alpha$-SiC by hot-pressing were studied in the 1870 to $2030^{\circ}C$ temperature range. The reaction of AIN and $\beta$-SiC(3C) powders causing transformation to the 2H(wurtzite) structure appeared to depend on hot-pressing temperatures and an additive of $\alpha$-SiC. For the composition of 49wt% SiC with 2 wt% $\alpha$-SiC and 47.5 wt% AIN47.5wt% SiC with 5 wt % $\alpha$-SiC at 203$0^{\circ}C$ for 1 h, th complete solid solutions with a single phase of 2H could be obtained. The appreciable amount of $\alpha$-SiC could develop the columnar inter-grains of 4H phase and the stable 2H phase with the relatively uniform composition and grain size distributions. The effect of $\alpha$-SiC on the phases present and compositional microstructures with columnar inter-grains was invetigated using X-ray diffraction, scanning electron microscopy and transmission electron microscopy. The fracture toughness and Vickers hardness of the hot-pressed solid solutions wre examined by the indentation-fracture-test method.

• Journal of Sensor Science and Technology
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• v.2 no.1
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• pp.29-34
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• 1993

a-Si : H photodiodes for image sensor have been fabricated and characterized. Photosensitivity of a ITO/a-Si : H/Al photodiode without blocking layer was 0.7 under the applied voltage of 5 V and peak spectral sensitivity in visible region was found at 620 nm. Dark current of ITO/a-SiN : H/a-Si : H/p-a-Si : H/Al photodiode was suppressed by hole blocking layer and electron blocking layer at the value of lower than 1.5 pA to the applied voltage of 10 V. Also maximum photosensitivity was about 1 under the applied voltage of 3 V and peak spectral sensitivity was found at 540 nm.

• Korean Journal of Materials Research
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• v.32 no.10
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• pp.403-407
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• 2022

This research investigated the effect of Si addition on the microstructure, mechanical properties, electric and thermal conductivity of as-extruded Al 6013 alloys. As the content of Si increased, the area fraction of the second phase increased. As the Si content increased, the average grain size decreased remarkably, from 182 (no Si addition) to 142 (1.5Si), 78 (3.0Si) and 77 ㎛ (4.5Si) due to dynamic recrystallization by the dispersed second particles in the aluminum matrix during the hot extrusion. As the Si content increased, the yield strength and ultimate tensile strength increased. The maximum values of yield strength and ultimate tensile strength were 224 MPa and 103 MPa for the 6013-4.5Si alloy. As the amount of Si added increased, the electrical and thermal conductivity decreased. The electrical and thermal conductivity of the Al6013-4.5Si alloy were 44.0 % IACS and 165.0 W/mK, respectively. The addition of Si to Al 6013 alloy had a significant effect on its thermal conductivity and mechanical properties.

• Korean Journal of Materials Research
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• v.7 no.10
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• pp.845-850
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• 1997

수직형 FHD증착법을 사용하여 SiO$_{2}$, SiO$_{2}$-P$_{2}$O$_{5}$, SiO$_{2}$P$_{2}$O$_{5}$-B$_{2}$O$_{3}$-GeO$_{2}$계 실리카 유리미립자를 형성하였으며, SEM, ICP-AES, XRD, TGA-DSC을 사용하여 그 특성을 분석하였다. XRD측정을 통해, 미립자 형성시 사용된 화염온도(130$0^{\circ}C$-150$0^{\circ}C$)와 기판온도(-20$0^{\circ}C$)가 SiO$_{2}$-P$_{2}$O$_{5}$계 미립자를 비정질상태로 형성하였으며, SiO$_{2}$P$_{2}$O$_{5}$-B$_{2}$O$_{3}$와 SiO$_{2}$P$_{2}$O$_{5}$-B$_{2}$O$_{3}$-GeO$_{2}$계 미립자에서는 B$_{2}$O$_{3}$, BPO$_{4}$, GeO$_{2}$의 결정성피크들을 관찰하였다. TGA-DSC 열분석을 통해, SiO$_{2}$와 SiO$_{2}$-P$_{2}$O$_{5}$는 온도변화에 따른 질량변화가 없었으며, SiO$_{2}$P$_{2}$O$_{5}$-B$_{2}$O$_{3}$-GeO$_{2}$계의 경우 질량감소를 동반한 유리전이에 따른 분자이완현상 및 결정화나 회복반응을 나타내고 있다. 질량감소는 미립자가 결정상태일때 가속되는 경향을 나타냈으며, DSC열분석을 통해 SiO$_{2}$, SiO$_{2}$-P$_{2}$O$_{5}$, SiO$_{2}$P$_{2}$O$_{5}$-B$_{2}$O$_{3}$-GeO$_{2}$계 유리미립자들의 고밀화가 시작되는 온도를 각각 1224$^{\circ}C$, 1151$^{\circ}C$, 953$^{\circ}C$, 113$0^{\circ}C$에서 관찰하였다.

• Journal of the Korean Electrochemical Society
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• v.9 no.1
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• pp.34-39
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• 2006

Electrochemical properties of Cu foil current collector with a $Li_{0.5}La_{0.5}TiO_3$ Cu a Si thin film deposited by r.f sputtering as an anode for Li free battery were evaluated. The Cu foil current collectors were lied in and out of plasma during sputtering process. The X-ray diffraction results indicated that the as-deposited Si and $Li_{0.5}La_{0.5}TiO_3$ thin films in and out of plasma did not show any crystalline difference. The $Li_{0.5}La_{0.5}TiO_3$ film in plasma and Si film out of plasma showed better cyclability since crystalline $Li_{0.5}La_{0.5}TiO_3$ has much higher ionic conductivity and crystalline Si film is much sensitive far volume change during charge-discharge process. These results suggested that the deposition of amorphous Si on Cu foil current collector is much better for fabrication of Li free battery and it can be useful for the unique battery with a cycling number constraint of below 10.

• JSTS:Journal of Semiconductor Technology and Science
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• v.5 no.2
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• pp.136-147
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• 2005

A theoretical design evaluation based on a hydrodynamic transport simulation of strained Si-SiGe on insulator (SSOI) type nMOSFETs is reported. Although, the net performance improvement is quite limited by the short channel effects, simulation results clearly show that the strained Si-SiGe type nMOSFETs are well-suited for gate lengths down to 20 nm. Simulation results show that the improvement in the transconductance with decreasing gate length is limited by the long-range Coulomb scattering. An influence of lateral and vertical diffusion of shallow dopants in the source/drain extension regions on the device performance (i.e., threshold voltage shift, subthreshold slope, current drivability and transconductance) is quantitatively assessed. An optimum layer thickness ($t_{si}$ of 5 and $t_{sg}$ of 10 nm) with shallow Junction depth (5-10 nm) and controlled lateral diffusion with steep doping gradient is needed to realize the sub-50 nm gate strained Si-SiGe type nMOSFETs.

• Journal of Korea Foundry Society
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• v.10 no.3
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• pp.225-234
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• 1990

Spheroidal graphite cast irons which are Fe-3%C-(4－6)%Si-(0－0.5)%Mo were studied to improve not only heat resistance but also mechanical properties. With increasing Mo content, the graphitization was decreased and carbide volume fraction was increased. The graphite spheroidization ratio was not decreased in Fe-3%C-6%Si-Mo system cast iron with increasing Mo content, but that was decreased in Fe-3%C-4%Si-Mo system and Fe-3%C-5%Si-Mo system cast irons. Hardness was increased with the Si and Mo contents. At constant Si content, tensile strength was increased with increasing Mo content, but that was decreased at 6%Si. In the experiment of oxidation, weight gain was decreased as the Si and/or Mo content increased, but increased at 1.5%Mo content.

• Journal of the Korean institute of surface engineering
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• v.49 no.5
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• pp.467-471
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• 2016

In order to investigate the Na gettering, PSG/$SiO_2$/Al-1%Si multilevel thin films were fabricated. DC magnetron sputter techniques and APCVD (atmosphere pressure chemical vapor deposition) were utilized for the deposition of Al-1%Si thin films and PSG/$SiO_2$ passivations, respectively. Heat treatment was carried out at $300^{\circ}C$ for 5 h in air. SIMS (secondary ion mass spectrometry) depth profiling and XPS (X-ray Photoelectron Spectroscopy) analysis were used to determine the distribution and binding energies of Na, Al, Si, O, P and other elements throughout the PSG/$SiO_2$/Al-1%Si multilevel thin films. Na peaks were mainly observed at the the PSG/$SiO_2$ interface and at the $SiO_2$/Al-1%Si interfaces. Na impurity gettering in PSG/$SiO_2$/Al-1%Si multilevel thin films is considered to be caused by a segregation type of gettering. The chemical state of Si and O elements in PSG passivation appears to be $SiO_2$.