• 제목/요약/키워드: SEM (scanning electron microscope)

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Positron Annihilation Study of Vacancy Type Defects in Ti, Si, and BaSrFBr:Eu

  • Lee, Chong Yong
    • Applied Science and Convergence Technology
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    • v.25 no.5
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    • pp.85-87
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    • 2016
  • Coincidence Doppler broadening and positron lifetime methods in positron annihilation spectroscopy has been used to analyze defect structures in metal, semiconductor and polycrystal, respectively. The S parameter and the lifetime (${\tau}$) value show that the defects were strongly related with vacancies. A positive relationship existed between the scanning electron microscope (SEM) images and the positron annihilation spectroscopy (PAS). According to the SEM images and PAS results, measurements of the defects with PAS indicate that it was more affected by the defect than the purity.

Characterization of $ZrO_2$ thin films fabricated by glancing angle deposition

  • Sobahan, K.M.A;Park, Yong-Jun;HwangBo, Chang-Kwon
    • Proceedings of the Optical Society of Korea Conference
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    • 2008.02a
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    • pp.281-282
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    • 2008
  • The glancing angle deposition (GLAD) technique was used to fabricate $ZrO_2$ thin films by electron-beam evaporation. The crystal structure, cross-sectional structure, surface morphology and optical properties are characterized by X-ray diffraction meter (XRD, Rigaku, Cu $K{\alpha}$ - radiation), scanning electron microscope (SEM), and spectrophotometer, respectively.

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A Study on Electrode Construction of Compact Fluorescent Lamp (콤팩트 형광램프의 전극구조에 대한 고찰)

  • Shin, Sang-Wuk;Lee, Se-Hyun;Cho, Mee-Ryoung;Hwang, Myung-Keun
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 2004.05a
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    • pp.149-154
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    • 2004
  • In this paper, we observed an electrode structure that is an important element that decide life of compact fluorescent lamp. We measured winding and application type of electron emission material and electrode damage with SEM(Scanning Electron Microscope). From now on, we need to measure rather several difference aging-time sample than analyze a relation electrode between life

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Nondestructive measurement of surface resistance of indium tin oxide(ITO) films by using a near-field scanning microwave microscope (근접장 마이크로파 현미경을 이용한 ITO 박막의 표면저항의 비파괴 관측 특성 연구)

  • Yun, Soon-Il;Na, Sung-Wuk;You, Hyun-Jun;Lee, Yeong-Joo;Kim, Hyun-Jung;Lee, Kie-Jin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.05a
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    • pp.137-141
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    • 2004
  • 저항특성이 다른 ITO박막의 구조특성과 표면특성을 XRD와 AFM(atomic force microscopy), SEM(scanning electron microscopy)을 이용하여 관측하였다. 접촉방식인 4단자 법을 사용하여 ITO박막의 표면전기저항을 측정하였다. 관측된 구조 및 표면특성을 바탕으로 비파괴 비접촉방식을 이용한 근접장 마이크로파 현미경을 이용하여 얻은 ITO박막의 표면저항특성과 비교 연구하였다.

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Characteristics of attach of biomass on PE substratum under anaerobic condition (폴리에틸렌 담체에 부착된 혐기성 생물막 부착 특성)

  • 이승란;김도한;나영수;이창한;박영식;윤태경;송승구
    • Journal of Environmental Science International
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    • v.11 no.4
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    • pp.327-332
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    • 2002
  • Optical microscope, SEM (Scanning Electron Microscopy) and fluorescent microscope were used for qualitative and morphological studies of the attached biomass on PE (polyethylene) substratum under anaerobic condition. It was shown by the observation of optical microscope that the initial attachment of biomass began in crevices of the surface of PE. The shape and structure of the attached biofilm could be observed by SEM photographs, but species of bacteria were and methanogens were not classified. A large number of methanogenic bacteria were identified on the surface of PE substratum by fluorescence under 480nm of radiation. It was estimated that methanogenic bacteria was also related to initial attachment of biomass under anaerobic condition.

Ultra-structural Observations of Colletotrichum orbiculare on Cucumber Leaves Pre-treated with Chlorella fusca (Chlorella fusca를 전처리한 오이 잎에서 오이탄저병균의 초미세 감염구조 관찰)

  • Lee, Yun Ju;Kim, Su Jeong;Jeun, Yong Chull
    • Research in Plant Disease
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    • v.23 no.1
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    • pp.42-48
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    • 2017
  • Chlorella is one of the microorganisms which can live autotrophically by their own photosynthesis. It was previously revealed that pre-treatment of Chlorella fusca caused a suppression of appressorium formation on the cucumber leaves after inoculation with Colletothrichum orbiculare. In this study, the ultrastructures of C. orbiculare on the cucumber leaves pretreated with C. fusca were observed using both scanning electron microscope (SEM) and transmission electron microscope (TEM). The SEM images revealed that most fungal conidia and hyphae were attached with lots of C. fusca cells. Also, the conidia could germinate but not form appressorium, which is necessary to penetrate into host tissue. These observations suggested that C. fusca adjoined to the fungus may play a role in suppression of the appressorium formation. On the other hand, the observations of TEM showed no remarkable cytological differences on the ultrastructures of the intracellular hyphae between in the pre-treated and untreated leaves. It seemed that the fungus could grow in the pre-treated plant tissues as in the untreated one. Based on these observations, it is suggested that the suppression of appressorium on the leaf surfaces by the C. fusca cells may be a main cause of the reduction of the anthracnose disease.

Analysis of Properties Variation of Thermal Deteriorated 600V Grade Hest-Resistant Polyvinyl Chloride Insulated Wires (열열화된 600V 2종 비닐절연전선의 특성변화 분석)

  • Choe, Chung-Seok;Lee, Gyeong-Seop;Lee, Deok-Chul
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.49 no.1
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    • pp.8-12
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    • 2000
  • The properties variation by deterioration of the 600V grade heat-resistant polyvinyl chloride insulated wire(HIV) was analyzed. The weight variation of the thermal deteriorated HIV was about 42% at 80$0^{\circ}C$ and over. From the analysis result of the metallurgical microscope photographs it shows that the sorface of normal wire showed the elongated structures. However the elongated structures did not appear at $900^{\circ} and over and we could observe that particles were grown. The grown oxidized substances in the thermally deteriorated electric wire were observed by SEM. The CuL, CuK, $CuK_b$, OK and CIK spectra of the thermally deteriorated HIV at $300^{\circ}C$ were uniform regardless of the scanning length, but the spectra of CIK could not found at above $700^{\circ}. At the DTA analysis, the endothermic reactions were occurred around $3006{\circ}C\; and\; 400^{\circ}C$ and the exothermic reactions were occurred around $470^{\circ}, respectively.

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Conductivity changes of copper(II)-phthalocyanie thin films due to annealing time of grain growing measuring microwave reflection coefficients (마이크로파 반사계수 측정을 통한 Copper(II)-phthalocyanine 박말의 결정 성장 시간에 따른 전기전도도 특성 변화 연구)

  • Park, Mie-Hwa;Yoo, Hyun-Jun;Lim, Eun-Ju;Na, Seung-Wook;Lee, Kie-Jin;Cha, Deok-Joon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07b
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    • pp.1074-1078
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    • 2004
  • 열 중착 방법을 이용하여 copper(II)-phthalocyanine(CuPc) 박막을 glass 기판 위에 제작하였다. 박막은 열처리를 하지 않은 경우와 열처리 조건을 $150^{\circ}C$ 로 후열(annealing) 처리 하는 방식으로 하였으며 후열 처리한 경우 $150^{\circ}C$에서의 열처리 지속 시간을 각각 2시간, 3시간, 4시간으로 달리하였다. 제작된 박막의 전기전도도를 평가하기 위해 마이크로파의 근접장 효과를 이용한 근접장 현미경(near-field scanning microwave microscope)을 이용하여 비파괴적인 방식으로 CuPc 박막의 반사계수(reflection coefficient)를 측정하였다. CuPc 박막의 전기전도도 특성을 UV 흡수도를 통한 HOMO(highest occupied molecular orbital), LUMO(lowest unoccupied molecular orbital) 준위의 밴드갭의 shift 현상과 관련지어 설명하였다. 박막 표면 특성은 SEM(scanning microscope microscopy)을 통해 관측하였다. 열처리 지속 시간에 따른 CuPc 박막의 전기전도도 특성은 2시간으로 지속한 경우의 박막의 경우 가장 좋았으며 그 보다 더 오랜 시간 동안 열처리를 지속한 경우에는 전기 전도 특성이 오히려 나빠짐을 알 수 있었다.

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Nano Visual Servoing Loop Using SEM Image (전자현미경 영상을 이용한 나노 비주얼 서보잉)

  • Choi, Jin-Ho;Ahn, Sang-Jung;Park, Byong-Chon;Lyou, Joon
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.57 no.10
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    • pp.1876-1882
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    • 2008
  • Nano manipulator is used to manufacture Carbon NanoTube(CNT) tips. Using nano manipulator, operator attaches a CNT at the apex of Atomic Force Microscope(AFM) tip, which requires a mastery of mechanics and long manufacture time. Nano manipulator is installed inside a Scanning Electron Microscope(SEM) chamber to observe the operation. This paper presents a control scheme for horizontal axes of nano manipulator via processing SEM image. Edges of AFM tip and CNT are first detected, and the position information so obtained is fed to control horizontal axes of nano manipulator. That is, a visual servoing loop is realized to control the axes more precisely in nano scale.