• 제목/요약/키워드: Reversal device

검색결과 35건 처리시간 0.042초

An Analysis of Design Factors for Developing Opuntia Humifusa Spines Removal Device

  • Jang, Ik Joo;Ha, Yu Shin
    • Journal of Biosystems Engineering
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    • 제38권3호
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    • pp.215-221
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    • 2013
  • Purpose: Opuntia Humifusa has been used in the food and beauty industry after removing spines and glochids clearly. This study compared the methods used in removing spines and analyzed the design factors for developing a spine removal device. Method: This study compared the spine removal ratios in accordance with the length of brush, water spray pressure, the number of water spray, and the size of Opuntia Humifusa in a rotating brush device and a water spray device. In addition, this study compared the reversal ratios according to the inclination angle of a conveyor, the drop height of Opuntia Humifusa, and the speed of the conveyor to analyze the reversal factors. Results: The spines were not removed clearly in the rotating brush method, and the glochids were nailed deeply. The spine removal ratio was 96.9% with the water spray pressure of 20 $kgf/cm^2$ and the conveyor speed of 10 cm/s in the water spray method. The number of water spray was correlated with the spine removal ratio, and the average spine removal ratio was 95.6% with three cycles of water spray. The reversal ratio was 97% with the inclination angle of the conveyor $20^{\circ}$, the drop height of 380 mm, and the conveyor speed of 10 cm/s. Conclusions: In order to develop a Opuntia humifusa spine removing device, this study compared the rotating brush and water spray methods. As a result, each spine removal performance of the rotating brush and water spray methods was 96.9% and 95.6%, respectively. Although the performance of the rotating brush method was slightly higher than that of the water spray method, the water spray method was suitable for removing spines from stem because the epidermis of stem was damaged and the glochids were nail deeply in the rotating brush method. Further studies on appropriate arrangement of spray nozzles, maintaining the optimal water spray pressure, the speed and angle control of the feeding conveyor, and devices for inducing the stem to the center will be needed in combining the water spray device and the reversal device.

WLAN 적용을 위한 위상 반전 장치를 갖는 슬롯 배열 안테나 (Slot Array Antenna with Phase Reversal Device for WLAN Application)

  • 박성일;정진우
    • 한국전자통신학회논문지
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    • 제13권4호
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    • pp.745-750
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    • 2018
  • WLAN 통신 기술 적용을 위한 위상 반전 장치를 갖는 슬롯 배열 안테나가 제안되었다. 제안된 안테나 설계를 위해 배열 안테나의 Array Factor와 방사 특성을 분석하였고 실질적인 적용이 가능한 방사 패턴을 위해, 위상 반전 장치를 사용하였다. 제안된 안테나는 $30mm{\times}96mm{\times}0.2mm$의 유전 기판의 양면에 구현되었다. 제안된 안테나의 측정 결과, 임피던스 대역폭은 156 MHz (2.392-2.548 GHz)이고, 최대 이득은 8.31 dBi이다.

Magnetization reversal process of the nanosized elliptical permalloy magnetic dots with various aspect ratios

  • Lee, J. H.;K. H. Oh;Kim, K. Y.
    • 한국자기학회:학술대회 개요집
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    • 한국자기학회 2002년도 동계연구발표회 논문개요집
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    • pp.186-187
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    • 2002
  • Recently, there has been much interest in magnetic thin film patterned in submicron scale because of possible ultrahigh density storage media or logical device applications [1-3]. Various geometries such as rectangle, circle, ring and ellipse type dots have been studied to find the shape showing stable switching behavior from repeated cycles. However, rectangle and circle types may not be suitable for device applications because they have two uncontrollable different magnetization reversal modes: C state and S state, resulting in different coercivity and irreproducible switching[4]. (omitted)

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굴삭기를 이용한 돌쌓기 장치 개발 (Development of Stone Piling-up Device for an Excavator)

  • 권순광;김용석;이동영;이창돈;양순용
    • 유공압시스템학회논문집
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    • 제5권3호
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    • pp.9-14
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    • 2008
  • The application of an excavator can be expanded to various works through change of end-effector. In this paper, a gripper, which can pick up and rotate a fixed formal stone, was developed. The device was designed and produced to pick up and rotate a stone for an excavator. The maximum weight of stone was computed to prevent from reversal in according to each displacement of attachments. The necessary force of a hydraulic cylinder to grip a stone was obtained by simulation.

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타원궤적 절삭기의 가진주파수에 따른 절삭 날 회전 진동 특성 (Characteristics of Rotational Vibration of Cutting Edge in Elliptical Vibration Cutting by Modulation of Excitation Frequency)

  • 노병국;김기대
    • 한국소음진동공학회논문집
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    • 제21권3호
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    • pp.258-263
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    • 2011
  • The direction of the cutting tool plays a critical role in elliptical vibration cutting(EVC) where the cutting tool cuts workpiece in a trochoidal motion. In this study, EVC cutting device was developed using two parallel piezoelectric materials and it was observed that the rotation direction of the tool reverses as the EVC device undergoes resonance at which either flexural(cutting direction) or longitudinal( thrust direction) mode shapes occurs. To analytically explain reversal of the rotation direction, kinematic motion analysis of the tool was modified to incorporate amplification of the vibration amplitude and phase introduced by resonance. It successfully demonstrated, through Matlab simulation, reversal of the rotation direction of the cutting tool as the excitation frequency increases beyond resonance frequencies at which either flexural or longitudinal vibration occurs.

강유전성 폴리(비닐리덴 플로라이드-트리플로로에틸렌) 박막의 항전계의 주파수 특성 분석 (Frequency Characteristics of Coercive Field in Ferroelectric Poly(Vinylidene Fluoride-Trifluoroethylene) Thin Film)

  • 장정;라흐만 셰이크 압둘;칸 세나와르 알리;이광만;김우영
    • 한국응용과학기술학회지
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    • 제35권4호
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    • pp.1206-1212
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    • 2018
  • 본 연구에서는 강유전성 고분자를 이용하여 제작된 100 nm 이하 두께를 가지는 박막형 커페시터의 측정 주파수에 따른 분극 반전 특성을 측정, 분석하였다. 고정된 박막 두께에 대해, 인가되는 최고 전기장의 세기가 증가할수록 더 높은 항전계에서 분극 반전이 발생되었다. 고정된 최고 전기장에 대해, 박막의 두께에 무관하게 같은 항전계에서 분극 반전이 발생되었다. 모든 측정에서 로그스케일 전기장 및 로그스케일 주파수의 관계에서 약 $0.12{\pm}0.01$의 비례 상수를 보였다. 결과적으로, 강유전체 고분자 커페시터가 40 nm 두께까지는 size effect 없이 일정한 분극 반전 특성을 보였다. 본 연구는 저전압 동작 고분자 메모리 소자의 동작 예측에 유용할 것이므로 저전압에서 동작 가능한 고분자 메모리 소자의 가능성을 보여준다.

펠티어 소자를 사용한 Low Drift Flux Meter의 기초연구 (A Basic Study on the Low Drift Flux Meter by Using a Peltier Device)

  • 김철한;허진;신광호;사공건
    • 한국전기전자재료학회논문지
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    • 제14권11호
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    • pp.912-916
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    • 2001
  • Fluxmeter is a measuring instrument the magnetic flux intensity by means of an integration of the voltage induced to a search coil to unit time. It also is required to a precise integrator since the voltage induced to a search coil has a differential value of the flux ${\Phi}$ to unit time. In this study, a bias current which is a main problem of the integrator in a drift troublesome depending on the temperature of a FET is investigated. We have confirmed that the temperature dependence of both the bias current of a integrator using the FET and the reversal saturated current of the minor carrier in a P-N junction of a semiconductor were the same. The property of a commercial integrator goes rapidly down with increasing temperature. The bias current of a FET is increased twice as much with 10$^{\circ}C$ increment. As a result, the low drift integrator could be developed by setting the lower temperature up with a pottier device.

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서브미크론 진직도 측정장치 개발 (Development of a Submicron Order Straightness Measuring Device)

  • 박천홍;정재훈;김수태;이후상
    • 한국정밀공학회지
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    • 제17권5호
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    • pp.124-130
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    • 2000
  • For measuring out the submicron order straightness, a precision measuring device is developed in this paper. The device is constructed with a hydrostatic feed table and a capacitive type sensor which is mounted to the feed table. Straightness is acquired as substracting the motion error of feed table from the measured profile with probe. Motion error of feed table is simultaneously compensated upto 0.120${\mu}{\textrm}{m}$ of linear motion error and 0.20arcsec of angular motion error using the active controlled capillary. Reversal method and strai호t-edge is used fur estimating the measuring accuracy and from the experimental result, it is verified that the device has the measuring accuracy 0.030m. Also, through the practical application on the measurement of ground surface, it is confirmed that the device is very effective to measure the submicron order straightness.

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