An Investigation of the Current Squeezing Effect through Measurement and Calculation of the Approach Curve in Scanning Ion Conductivity Microscopy (Scanning Ion Conductivity Microscopy의 Approach Curve에 대한 측정 및 계산을 통한 Current Squeezing 효과의 고찰)
-
- Journal of the Microelectronics and Packaging Society
- /
- v.31 no.2
- /
- pp.54-62
- /
- 2024