• 제목/요약/키워드: Radio-Frequency (rf) Magnetron Sputtering

검색결과 158건 처리시간 0.027초

Growth Mechanism of Self-Catalytic Ga2O3 Nano-Burr Grown by RF Sputtering

  • Park, Sin-Yeong;Choe, Gwang-Hyeon;Gang, Hyeon-Cheol
    • Proceedings of the Korean Vacuum Society Conference
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    • 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
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    • pp.462-462
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    • 2013
  • Gallium Oxide (Ga2O3) has been widely investigated for the optoelectronic applications due to its wide bandgap and the optical transparency. Recently, with the development of fabrication techniques in nanometer scale semiconductor materials, there have been an increasing number of extensive reports on the synthesis and characterization of Ga2O3 nano-structures such as nano-wires, nanobelts, and nano-dots. In contrast to typical vaporliquid-solid growth mode with metal catalysts to synthesis 1-dimensional nano-wires, there are several difficulties in fabricating the nanostructures by using sputtering techniques. This is attributed to the fact that relatively low growth temperatures and higher growth rate compared with chemical vapor deposition method. In this study, Ga2O3 chestnut burr were synthesized by using radio-frequency magnetron sputtering method. In contrast to typical sputtering method with sintered ceramic target, a Ga2O3 powder (99.99% purity) was used as a sputtering target. Several samples were prepared with varying the growth parameters, especially he growth time and the growth temperature to investigate the growth mechanism. Samples were characterized by using XRD, SEM, and PL measurements. In this presentation, the details of fabrication process and physical properties of Ga2O3 nano chestnut burr will be reported.

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Study on the Electrical Properties of Amorphous HfInZnO TFTs Depending on Sputtering Power (비정질 하프늄인듐징크옥사이드 산화물 반도체의 공정 파워에 따른 트랜지스터의 전기적 특성 연구)

  • Yoo, Dong-Youn;Chong, Eu-Gene;Kim, Do-Hyung;Ju, Byeong-Kwon;Lee, Sang-Yeol
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • 제24권8호
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    • pp.674-677
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    • 2011
  • The dependency of sputtering power on the electrical performances in amorphous HIZO-TFT (hafnium-indium-zinc-oxide thin film transistors) has been investigated. The HIZO channel layers were prepared by using radio frequency (RF) magnetron sputtering method with different sputtering power at room temperature. TOF-SIMS (time of flight secondary ion mass spectrometry) was performed to confirm doping of hafnium atom in IZO film. The field effect mobility (${\mu}FE$) increased and threshold voltage ($V_{th}$) shifted to negative direction with increasing sputtering power. This result can be attributed to the high energy particles knocking-out oxygen atoms. As a result, oxygen vacancies generated in HIZO channel layer with increasing sputtering power resulted in negative shift in Vth and increase in on-current.

Effects of Rapid Thermal Annealing on the Properties of AZO Thin Films Grown by Radio-frequency Magnetron Sputtering (라디오파 마그네트론 스퍼터링으로 증착된 AZO 박막의 특성에 대한 급속 열처리 효과)

  • Cho, Shin-Ho
    • Journal of the Korean Vacuum Society
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    • 제18권5호
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    • pp.377-383
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    • 2009
  • Aluminum-doped zinc oxide (AZO) thin films were deposited on sapphire substrate by using radio-frequency magnetron sputtering and were performed in the temperature range of $600-900^{\circ}C$ by rapid thermal annealing (RTA). The crystallographic structure and the surface morphology were investigated by using X-ray diffraction and scanning electron microscopy, respectively. The crystallinity of the films was improved with increasing the annealing temperature and the average size of crystalline grains was found to be 50 nm. All the thin films showed an average transmittance of 92% in the wavelength range of 400-1100 nm. As the annealing temperature was increased, the bandgap energy was decreased and the violet photoluminescence (PL) signal at 400 nm replaced the ultraviolet PL signal. The electrical properties of the thin films showed a significant dependence on the annealing temperature.

Physical and Chemical Investigation of Substrate Temperature Dependence of Zirconium Oxide Films on Si(100)

  • Chun, Mi-Sun;Moon, Myung-Jun;Park, Ju-Yun;Kang, Yong-Cheol
    • Bulletin of the Korean Chemical Society
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    • 제30권11호
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    • pp.2729-2734
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    • 2009
  • We report here the surface behavior of zirconium oxide deposited on Si(100) substrate depending on the different substrate temperatures. The zirconium oxide thin films were successfully deposited on the Si(100) surfaces applying radio-frequency (RF) magnetron sputtering process. The obtained zirconium oxide films were characterized by X-ray photoelectron spectroscopy (XPS) for study about the chemical environment of the elements, X-ray diffraction (XRD) for check the crystallinity of the films, spectroscopic ellipsometry (SE) technique for measuring the thickness of the films, and the morphology of the films were investigated by atomic force microscope (AFM). We found that the oxidation states of zirconium were changed from zirconium suboxides ($ZrO_{x,y}$, x,y < 2) (x; higher and y; lower oxidation state of zirconium) to zirconia ($ZrO_2$), and the surface was smoothed as the substrate temperature increased.

Fabrication of IZO thin films for flexible organic light emitting diodes by RF magnetron sputtering

  • Jun, D.G.;Cho, H.H.;Jo, D.B.;Lee, K.M.
    • Journal of Ceramic Processing Research
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    • 제13권spc2호
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    • pp.260-264
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    • 2012
  • We have investigated the effect of ambient gases on the structural, electrical, and optical characteristics of IZO thin films intended for use as anode contacts in the organic light emitting diodes (OLED) devices. These IZO thin films were deposited on the PES film by radio frequency (RF) magnetron sputtering under different ambient gases (Ar, Ar + O2, and Ar + H2) at room temperature. In order to investigate the influences of the ambient gases, the flow rate of oxygen and hydrogen in argon has been changed from 0.1 sccm to 0.5 sccm, respectively. All the IZO thin film has an (222) preferential orientation regardless of ambient gases. The electrical resistivity of the IZO film increased with increasing O2 flow rate, whereas the electrical resistivity decreased sharply under an Ar + H2 atmosphere and was nearly similar regardless of the H2 flow rate. The change of electrical resistivity with changes in the ambient gas composition was mainly interpreted in terms of the charge carrier concentration rather than the charge carrier mobility. All the films showed the average transmittance over 85% in the visible range. The OLED device was fabricated with different IZO substrates made with the configuration of IZO/α-NPD/DPVB/Alq3/LiF/Al in order to elucidate the performance of the IZO substrate. The current density and the luminance of OLED devices with IZO thin films deposited in 0.5 sccm H2 ambient gas are the highest amongst all other films.

Effects of the Sputtering Thickness and the Incident Angle of Pt Film Deposition as a Counter Electrode for Dye-sensitized Solar Cells (염료감응형 태양전지의 상대전극 Pt 필름 두께와 증착 각도가 효율에 미치는 영향에 관한 연구)

  • Kim, Hee-Je;Yeo, Tae-Bin;Park, Sung-Joon;Kim, Whi-Young;Seo, Hyun-Woong;Son, Min-Kyu;Chae, Won-Yong;Lee, Kyoung-Jun
    • The Transactions of The Korean Institute of Electrical Engineers
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    • 제59권3호
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    • pp.588-593
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    • 2010
  • Sputter deposition on a Pt counter electrode was studied using radio frequency (RF) plasma as the improvement of incident photon to current conversion efficiency (IPCE) for dye-sensitized solar cells (DSCs). Effects of the sputtering thickness and the incident angle on a Pt counter electrode for DSCs were investigated. Experiments to get the optimal sputtering time for the performance of the DSCs were carried out. And it is found that the optimized sputtering time was 120 seconds, in addition, the incident angles of the substrate was adjusted from $0^{\circ}$ to $60^{\circ}$. The maximum efficiency of 5.37% was obtained at the incident angle of $40^{\circ}$ with an active cell area of $1cm^2$.

Influence of the Ag interlayer on the structural, optical, and electrical properties of ZTO/Ag/ ZTO films

  • Gong, Tae-Kyung;Moon, Hyun-Joo;Kim, Daeil
    • Transactions on Electrical and Electronic Materials
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    • 제17권2호
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    • pp.121-124
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    • 2016
  • ZnSnO3 (ZTO)/Ag/ ZnSnO3 (ZTO) trilayer films were prepared on glass substrates by radio frequency (RF) and direct current (DC) magnetron sputtering. The electrical resistivity and optical transmittance of the films were investigated as a function of the Ag interlayer thickness. ZTO films with a 15 nm thick Ag interlayer show the highest average visible transmittance (83.2%) in the visible range. In this study, the highest figure of merit (2.1×10−2 Ω cm) is obtained with the ZTO 50 nm/Ag 15 nm/ZTO 50 nm films. The enhanced optical and electrical properties of ZTO films with a 15 nm thick Ag interlayer are attributed to the crystallization of the Ag interlayer, as supported by the distinct XRD pattern of the Ag (111) peaks. From the observed results, higher optical and electrical performance of the ZTO film with a 15 nm thick Ag interlayer seems to make a promising alternative to conventional transparent conductive ITO films.

Phase Change Characteristics of SnXSe100-X Thin Films by RF-magnetron Sputtering

  • Kim, Sang-Kyun;Choi, Se-Young
    • Korean Journal of Materials Research
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    • 제19권4호
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    • pp.203-206
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    • 2009
  • $Sn_XSe_{100-X}$ (15|X|30) alloys have been studied to explore their suitability as phase change materials for nonvolatile memory applications. The phase change characteristics of thin films prepared by a Radio Frequency (RF) magnetron co-sputtering system were analyzed by an X-ray diffractometer and 4-point probe measurement. A phase change static tester was also used to determine their crystallization under the pulsed laser irradiation. X-ray diffraction measurements show that the transition in sheet resistance is accompanied by crystallization. The amorphous state showed sheet resistances five orders of magnitude higher than that of the crystalline state in $Sn_XSe_{100-X}$ (x = 15, 20, 25, 30) films. In the optimum composition, the minimum time of $Sn_XSe_{100-X}$ alloys for crystallization was 160, 140, 150, and 30ns at 15mW, respectively. The crystallization temperature and the minimum time for crystallization of thin films were increased by increasing the amount of Sn, which is correlated with the activation energy for crystallization.

Effect of Indium Zinc Oxide Transparent Electrode on Power Conversion Efficiency of Flexible Dye-Sensitized Solar Cells (플렉시블 염료 감응형 솔라셀의 효율에 미치는 Indium Zinc Oxide 투명전극의 영향)

  • Lee, Do Young;Chung, Chee Won
    • Korean Chemical Engineering Research
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    • 제47권1호
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    • pp.105-110
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    • 2009
  • IZO thin films have been deposited on poly(ethylene terephthalate) flexible substrate under varying radio frequency (rf) power, process pressure and thickness of IZO films using rf magnetron sputtering under $Ar/O_2$ gas mix. As the process pressure increased, the deposition rate was slightly increased and the transmittance showed little change, but the resistivity was increased. With increasing rf power, the great increase in deposition rate was observed but the transmittance showed a slight change only, and the resistivity was decreased. In addition, an attempt was made to find the optimal thickness of IZO films under varying the thickness of IZO films at the process conditions of 1 mTorr pressure and 90 W rf power, which showed lowest resistivity. IZO thin films with the thickness of $1,500{\AA}$ showed lowest resistivity and also showed highest transmittance around the wavelength zone of the maximum absorption. The power conversion efficiency of solar cells fabricated using various transparent electrodes with different thicknesses were measured and the solar cell with IZO electrode of $1,500{\AA}$ showed the maximum conversion-efficiency of 2.88 %.

Fabrication of $Er^{3+}/Yb_3$ co-doped Soda-lime Glass Thin Films using Radio Frequency Magnetron Sputtering Method and Optical Property Characterization (RF 마그네트론 스퍼터에 의해 제조된 $Er^{3+}/Yb_3$ 도핑된 소다 라임 유리 박막의 제조 및 광학적 특성평가)

  • 임종모;김미옥;이병택;문종하;김진혁
    • Proceedings of the Optical Society of Korea Conference
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    • 한국광학회 2002년도 하계학술발표회
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    • pp.42-43
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    • 2002
  • 고상 소결법으로 715iO$_2$+11$Na_2$O+10CaO+3Er$_2$O$_3$+5Yb$_2$O$_3$(all wt%) 조성의 스퍼터용 유리 타겟을 제조하여, RF 마그네트론 스퍼터에 의해 희토류 원소가 첨가된 광증폭기용 다성분계 sodium calcium silicate 유리박막을 제조하였다. 최적의 공정조건을 얻기 위해 RF-power, 공정압력, 기판온도를 변화시키면서 박막을 제조하여 RF-power 150W, 공정압력 4mtorr, 기판온도 50$0^{\circ}C$, 타겟-기판 거리 6cm에서 타겟의 손상이 심하지 않으면서, 1.4$mu extrm{m}$/h의 최고 증착율을 가지는 양질의 박막을 제조하였다. (중략)

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