• 제목/요약/키워드: Production Tool Fabrication

검색결과 33건 처리시간 0.029초

금속사출성형을 이용한 STS 316L 밸브피팅 제작에 대한 연구 (A Study of STS 316L Threaded Elbow Fitting Fabrication by Metal Injection Molding)

  • 김재영;김성조;정성택;안석영
    • 소성∙가공
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    • 제24권2호
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    • pp.121-129
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    • 2015
  • A net-shape forming of small and complex-shaped metal parts by metal injection molding (MIM) has economic advantages in mass production, especially for STS 316L valve fitting. STS 316L offers excellent corrosion resistance, but it has poor machinability, which is a limitation in using it for a cost-effective production where both forging and machining are employed. Simulation and experimental analysis were performed to develop a MIM STS 316L 90° elbow fitting minimizing trial and error. A Taguchi method was used to determine which input parameter was the most sensitive to possible defects (e.g. sink mark depth) during the injection molding. The final prototype was successfully built. The results indicate that the simulation tool can be used during the design process to minimize trial and error, but the final adjustment of parameters based on field experience is essential.

Photo Polymer 마스크와 미세입자분사가공을 이용한 미세구조물 제작 (Fabrication of Micro Structure Using Photo Polymer Mask and Micro Abrasive Jet Machining)

  • 고태조;박동진;이인환;김희술
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2005년도 춘계학술대회 논문집
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    • pp.1175-1178
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    • 2005
  • Brittle materials, especially single-crystal silicon wafer, are widely used for sensors, IC industry, and MEMS applications. e general machining process of crack easy materials is by chemical agents, but it is hazardous and time consuming. Also, it is difficult to get high aspect ratio micro structure. As an alternative tool, an AJM(Abrasive jet machining) is promising method in terms of high aspect ratio and production cost. In this study, to get more precise detail compared to general AJM, photo polymer mask, SU-8, used in photolithography was applied in AJM. Process parameters such as abrasive diameter, air pressure, nozzle diameter, flow rate of abrasive in AJM and a variety of conditions in spin coating were decided. Finally, micro channel and mixer was fabricated to see the efficiency of the AJM with photo polymer mask.

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S/H Life Time에 따른 WSix의 특성 변화에 관한 연구 (A Study on the Characteristics change of WSix Thin Films by S/H Life Time)

  • 정양희;강성준
    • 한국정보통신학회논문지
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    • 제6권5호
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    • pp.689-695
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    • 2002
  • 막질의 조성은 공정 개발과 고품질 생산 적용을 위한 반도체 소자의 제조에 있어서 풍요한 요소의 하나 이다. 막의 표면과 계면의 조성은 기본적으로 AES측 통하여 알 수 있다. 본 연구에서는 온도, DCS post flow, shower head life time 등과 같은 공정조건으로 LPCVD법을 이용한 tungsten suicide 박막을 증착하고 이들의 구조적, 전기적 특성과 조성비를 측정하며 WSix박막을 해석하였고 이로부터 Si/W의 조성비를 비교하였다. Si와 W의 조성비는 DCS post flow에 의하여 WSix박막의 표면에서 증가하였으며, 폴리실리콘과 tungsten silicide 계면에서는 온도의 증가에 따라 조성비가 증가함을 알 수 있었다. 이 결과는 메모리 소자 제조의 WSix 박막 증착의 공정조건 최적화에 적용될 수 있다.

금속분말 강화수지를 이용한 쾌속금형 제작 (Rapid Tooling by Using Metal Powder Reinforced Resin)

  • 김범수;정해도;배원병
    • 대한기계학회논문집A
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    • 제24권1호
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    • pp.1-6
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    • 2000
  • As dies and molds have become more and more complicated in the recent years, the demand for lower cost and shorter production time is also growing stronger. Rapid prototyping and Tooling technologies are expected to be used for more rapid and lower cost tool fabrication. However the rapid tooling methods have not yet reached the level of application to the manufacturing of metallic dies and molds which require high dimensional accuracy. As the rapid tooling technology, there are the slurry casting, the powder casting, the direct laser sintering, and so on. Generally, in the slurry casting, the alumina powder and the water soluble phenol were mainly used. However, the mechanical properties of the phenol were not good enough to apply to molds directly. In this study, pure epoxy and two types of aluminium powder reinforced resin are applied to the slurry casting. The mechanical and thermal properties are better than phenol because the epoxy is the thermosetting resin. And mechanical characteristics such as shrinkage rate, hardness, surface roughness are measured for the sake of comparison. Metal powder reinforced resin molds are better than the resin tool form the viewpoint of shrinkage rate and hardness. Finally, it has been shown that the application possibility of this process is high, because the manufacturing time and cost savings are significant.

Virtual Metrology for predicting $SiO_2$ Etch Rate Using Optical Emission Spectroscopy Data

  • Kim, Boom-Soo;Kang, Tae-Yoon;Chun, Sang-Hyun;Son, Seung-Nam;Hong, Sang-Jeen
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2009년도 제38회 동계학술대회 초록집
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    • pp.464-464
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    • 2010
  • A few years ago, for maintaining high stability and production yield of production equipment in a semiconductor fab, on-line monitoring of wafers is required, so that semiconductor manufacturers are investigating a software based process controlling scheme known as virtual metrology (VM). As semiconductor technology develops, the cost of fabrication tool/facility has reached its budget limit, and reducing metrology cost can obviously help to keep semiconductor manufacturing cost. By virtue of prediction, VM enables wafer-level control (or even down to site level), reduces within-lot variability, and increases process capability, $C_{pk}$. In this research, we have practiced VM on $SiO_2$ etch rate with optical emission spectroscopy(OES) data acquired in-situ while the process parameters are simultaneously correlated. To build process model of $SiO_2$ via, we first performed a series of etch runs according to the statistically designed experiment, called design of experiments (DOE). OES data are automatically logged with etch rate, and some OES spectra that correlated with $SiO_2$ etch rate is selected. Once the feature of OES data is selected, the preprocessed OES spectra is then used for in-situ sensor based VM modeling. ICP-RIE using 葰.56MHz, manufactured by Plasmart, Ltd. is employed in this experiment, and single fiber-optic attached for in-situ OES data acquisition. Before applying statistical feature selection, empirical feature selection of OES data is initially performed in order not to fall in a statistical misleading, which causes from random noise or large variation of insignificantly correlated responses with process itself. The accuracy of the proposed VM is still need to be developed in order to successfully replace the existing metrology, but it is no doubt that VM can support engineering decision of "go or not go" in the consecutive processing step.

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냉간 압연 공정에 의한 두께 $36{\mu}m$ 동극박 제조 공정 해석 (Fabrication of copper thin foils with 36 microns by cold rolling)

  • 이상호;김병민
    • 한국소성가공학회:학술대회논문집
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    • 한국소성가공학회 2007년도 춘계학술대회 논문집
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    • pp.413-416
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    • 2007
  • In general, by means of the electrodepositing technique, a copper foil sample was prepared with a high purity and a high density. But the mechanical properties of the electrodepositing copper foil was lower than it's the rolling copper foil. However, the production of copper foil with approximately 36 microns thick in rolling process was very difficult. This paper describes the outline of the high accuracy cold rolling in 6 high mill which was developed for the purpose of rolling very thin accurate gauge copper foil(36 micron thick), and give several rolling characteristic of 600 mm wide copper foil. a) Large strain can be accumulated pass by pass in industrial multi-pass rolling processing to overcome large critical strain for thickness accuracy through optimization of rolling schedule. b) Also, permissible tension for rolling 0.45 $\sim$ 0.036 mm thick copper strip stably in accordance with the each pass work had been established by FEM simulation results. c) During the plate rolling process, considerable values of the forces of material pressure on the tool occur. These pressures cause the elastic deformation of the roll, thus changing the shape of the deformation region. A numerical simulation of roll deflection during cold rolling is presented in the paper. d) The proposed pass schedule can roll very thin copper foil of 36 micron thickness to a tolerance of ${\pm}1$ microns. The validity of simulated results was verified into rolling experiments on the copper foil.

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Sensitivity Enhancement of RF Plasma Etch Endpoint Detection With K-means Cluster Analysis

  • Lee, Honyoung;Jang, Haegyu;Lee, Hak-Seung;Chae, Heeyeop
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2015년도 제49회 하계 정기학술대회 초록집
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    • pp.142.2-142.2
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    • 2015
  • Plasma etch endpoint detection (EPD) of SiO2 and PR layer is demonstrated by plasma impedance monitoring in this work. Plasma etching process is the core process for making fine pattern devices in semiconductor fabrication, and the etching endpoint detection is one of the essential FDC (Fault Detection and Classification) for yield management and mass production. In general, Optical emission spectrocopy (OES) has been used to detect endpoint because OES can be a simple, non-invasive and real-time plasma monitoring tool. In OES, the trend of a few sensitive wavelengths is traced. However, in case of small-open area etch endpoint detection (ex. contact etch), it is at the boundary of the detection limit because of weak signal intensities of reaction reactants and products. Furthemore, the various materials covering the wafer such as photoresist (PR), dielectric materials, and metals make the analysis of OES signals complicated. In this study, full spectra of optical emission signals were collected and the data were analyzed by a data-mining approach, modified K-means cluster analysis. The K-means cluster analysis is modified suitably to analyze a thousand of wavelength variables from OES. This technique can improve the sensitivity of EPD for small area oxide layer etching processes: about 1.0 % oxide area. This technique is expected to be applied to various plasma monitoring applications including fault detections as well as EPD.

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반도체 FAB 공정에서의 효율적 흐름제어를 위한 시뮬레이션 (Simulation of Efficient Flow Control for FAB of Semiconductor Manufacturing)

  • 한영신;전동훈
    • 한국멀티미디어학회논문지
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    • 제3권4호
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    • pp.407-415
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    • 2000
  • 설비 집약적이며 복잡한 생산 시스템중의 하나인 반도체 FAB 공정은 제품의 흐름시간과 대기시간, 공정 중 재고를 줄이는 것이 흐름제어의 가장 중요한 목표이다. 이에 본 연구에서는 소품종 다랑 생산 시스템에서 발생하는 비경제성을 줄이고 생산성을 향상시키기 위하여 현재 반도체 양산 회사에서 주로 채택하고 있는 In-Line Layout을 분석하고 새로운 제안 방식인 그룹테크놀로지를 이용한 Job Shop 형태의 Stand Alone Layout과 함께 각각의 모델로 구축하고 시뮬레이션 함으로써 일별 생산 계획상의 회수 변화에 따른 각Layout의 특성을 비교, 분석하였다. 이 때 사용한 시뮬레이션 툴은 모델 구축 및 시뮬레이션이 용이하고 범용적인 (이산형 제조 시스템용) ProSys를 사용하였다. 연구 결과로는 일별 생산 계획상의 회수 초기에는 In-Line Layout이 Stand Alone Layout보다 대체로 생산량 측면에서 우세하지만 일별 생산계획상의 회수가 증가된 14회부터는 Stand Alone Layout이 더 우세한 것으로 나타났다

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Design, Fabrication, and Application of a Microfluidic Device for Investigating Physical Stress-Induced Behavior in Yeast and Microalgae

  • Oh, Soojung;Kim, Jangho;Ryu, Hyun Ryul;Lim, Ki-Taek;Chung, Jong Hoon;Jeon, Noo Li
    • Journal of Biosystems Engineering
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    • 제39권3호
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    • pp.244-252
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    • 2014
  • Purpose: The development of an efficient in vitro cell culture device to process various cells would represent a major milestone in biological science and engineering. However, the current conventional macro-scale in vitro cell culture platforms are limited in their capacity for detailed analysis and determination of cellular behavior in complex environments. This paper describes a microfluidic-based culture device that allows accurate control of parameters of physical cues such as pressure. Methods: A microfluidic device, as a model microbioreactor, was designed and fabricated to culture Saccharomyces cerevisiae and Chlamydomonas reinhardtii under various conditions of physical pressure stimulus. This device was compatible with live-cell imaging and allowed quantitative analysis of physical cue-induced behavior in yeast and microalgae. Results: A simple microfluidic-based in vitro cell culture device containing a cell culture channel and an air channel was developed to investigate physical pressure stress-induced behavior in yeasts and microalgae. The shapes of Saccharomyces cerevisiae and Chlamydomonas reinhardtii could be controlled under compressive stress. The lipid production by Chlamydomonas reinhardtii was significantly enhanced by compressive stress in the microfluidic device when compared to cells cultured without compressive stress. Conclusions: This microfluidic-based in vitro cell culture device can be used as a tool for quantitative analysis of cellular behavior under complex physical and chemical conditions.

An Evaluation of Multiple-input Dual-output Run-to-Run Control Scheme for Semiconductor Manufacturing

  • Fan, Shu-Kai-S.;Lin, Yen
    • Industrial Engineering and Management Systems
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    • 제4권1호
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    • pp.54-67
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    • 2005
  • This paper provides an evaluation of an optimization-based, multiple-input double-output (MIDO) run-to-run (R2R) control scheme for general semiconductor manufacturing processes. The controller in this research, termed adaptive dual response optimizing controller (ADROC), can serve as a process optimizer as well as a recipe regulator between consecutive runs of wafer fabrication. In evaluation, it is assumed that the equipment model could be appropriately described by a pair of second-order polynomial functions in terms of a set of controllable variables. Of practical relevance is to consider a drifting effect in the equipment model since in common semiconductor practice the process tends to drift due to machine aging and tool wearing. We select a typical application of R2R control to chemical mechanical planarization (CMP) in semiconductor manufacturing in this evaluation, and there are five different CMP process scenarios demonstrated, including mean shift, variance increase, and IMA disturbances. For the controller, ADROC, an on-line estimation technique is implemented in a self-tuning (ST) control manner for the adaptation purpose. Subsequently, an ad hoc global optimization algorithm based on the dual response approach, arising from the response surface methodology (RSM) literature, is used to seek the optimum recipe within the acceptability region for the execution of next run. The main components of ADROC are described and its control performance is assessed. It reveals from the evaluation that ADROC can provide excellent control actions for the MIDO R2R situations even though the process exhibits complicated, nonlinear interaction effects between control variables, and the drifting disturbances.