• Title/Summary/Keyword: Polymer passivation

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Waveguiding Effect in Electroabsorption Modulators: Passivation Layers and Their Impact on Extinction Ratios

  • Shin, Dong-Soo
    • ETRI Journal
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    • v.27 no.1
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    • pp.95-101
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    • 2005
  • Waveguide structures of the stand-alone electroabsorption (EA) modulator and the electroabsorption modulated laser (EML) are investigated using the 3D beam propagation method. The EA waveguide structures with InP-based passivation layers show saturation in the extinction ratio (ER) due to the stray light traveling through the passivation layers. This paper demonstrates that narrower passivation layers suppress stray-light excitation in the EA waveguide, increasing the ER. A taper structure in the isolation section of the EML waveguide can reduce the mode mismatch and suppress the excitation of the stray light, increasing the ER further. Low-index-polymer passivation layers can confine the mode more tightly in the active waveguide, yielding an even higher ER.

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Effect of Diamond-Like Carbon Passivation on Physical and Electrical Properties of Plasma Polymer (플라즈마 폴리머의 물리적, 전기적 특성에서 다이아몬드상 탄소 패시베시션이 미치는 영향)

  • Park, Y.S.;Cho, S.J.;Boo, J.H.
    • Journal of the Korean Vacuum Society
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    • v.21 no.4
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    • pp.193-198
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    • 2012
  • In this study, we have fabricated the polymer insulator and diamond-like carbon (DLC) thin films by using plasma enhanced chemical vapor deposition methods. we fabricated the DLC films with various thicknesses as the passivation layer on plasma polymer and investigated the structural, physical, and electrical properties of DLC/plasma polymer films. The plasma polymer synthesized in this work had the low leakage current and low dielectric constant. The values of hardness and elastic modulus in DLC/plasma polymer films are increased, and the value of rms surface roughness is decreased, and contact angle value is increased with increasing DLC film thickness. In the electrical properties of DLC/plasma polymer, the value of the dielectric constant is increased, however the leakage current property of the DLC/plasma polymer is improved than that of plasma polymer film with increasing DLC film thickness.

Characterization of the Polymer-based Organic Light Emitting Diode having Inorganic Thin Film Passivation Layer (무기 박막형 보호층을 이용한 고분자 유기발광 다이오드의 특성 평가)

  • Kim, Hoon;Kim, Kwang-Ho;Kim, Jae-Kyung;Lee, Yun-Hi;Han, Jeong-In;Do, Lee-Mi;Ju, Byeong-Kwon
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.16 no.1
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    • pp.60-64
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    • 2003
  • In this study, the inorganic thin-film passivation layer was newly adopted to protect the organic layer from moisture and oxygen. Using the electron beam evaporation system, the various kinds of inorganic thin-films were deposited onto the organic layer and their interface properties between organic and inorganic layer were investigated. In this investigation, the MgO layer showed the most suitable properties, and based on this result, the time dependent emission properties were estimated for the OLED with and without passivation layer. In this experiment, we can see that the time-dependent emission properties of MgO passivated OLED had longer life-time compared to non-passivated OLED. Therefore, we can consider that the MgO thin film is one of the most suitable candidates for the thin-film passivation layer of OLED.

Electrical Properties and Reliability of the Photo-conductive CdS Thin Films for Flexible Opto-electronic Device Applications (유연성 광전도 CdS 박막의 증착조건에 따른 전기적 특성 및 신뢰성 평가 연구)

  • Hur, Sung-Gi;Cho, Hyun-Jin;Park, Kyoung-Woo;Ahn, Jun-Ku;Yoon, Soon-Gil
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.22 no.12
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    • pp.1023-1027
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    • 2009
  • Cadmium sulfide (CdS) thin film for flexible optical device applications were prepared at $H_2/(Ar+H_2)$ flow ratios on polyethersulfon (PES) flexible polymer substrates at room temperature by radio frequency magnetron sputtering technique. The CdS thin films deposited at room temperature showed a (002) preferred orientation and the smooth surface morphologies. Films deposited at a hydrogen flow ratio of 25% exhibited a photo- and dark-sheet resistance of about 50 and $2.7\;{\times}\;10^5\;{\Omega}/square$, respectively. From the result of the bending test, CdS films exhibit a strong adhesion with the PES polymer substrates and the $Al_2O_3$ passivation layer deposited on the CdS films only shows an increase of the resistance of 8.4% after exposure for 120 h in air atmosphere.

Electrochemistry of Conductive Polymers 46. Polymer Films as Overcharge Inhibitors for Lithium-Ion Rechargeable Batteries

  • Choi, Shin-Jung;Park, Su-Moon
    • Journal of Electrochemical Science and Technology
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    • v.1 no.1
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    • pp.1-9
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    • 2010
  • Conducting polymer films grown from various aromatic compounds have been evaluated as overcharge protecting additives for lithium ion rechargeable batteries. The polymer films were grown electrochemically under the conditions similar to those encountered during the overcharging processes of lithium batteries and subsequently characterized by potentiodynamic, electrochemical quartz crystal microbalance, electrochemical impedance spectroscopic, and scanning electron microscopic experiments. Results indicate that bicyclic and polycyclic aromatic hydrocarbons would be poor candidates for inhibitors, while biphenyl, terphenyl, and benzene derivatives displayed excellent performances. Mixed polymer films grown from o-terphenyl and p-xylene show the best performance among the candidates.

Plasma polymer passivated organic light emitting diodes

  • Cho, Dae-Yong;Kim, Min-Su;Jung, Dong-Geun
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.893-896
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    • 2003
  • Plasma polymerized para-xylene (PPpX) thin films deposited by plasma enhanced chemical vapor deposition (PECVD) were used to passivate the organic light emitting diodes (OLEDs). For OLEDs, indium tin oxide (ITO), N,N'-diphenyl-N,N'-bis(3-methylphenyl)-1,1'-diphenyl-4,4'-diamine (TPD), tris(8-hydroxyquinoline) aluminum $(Alq_{3})$ and aluminum (Al) were used as the anode, the hole transport layer (HTL), the emitting layer (EML) and the cathode, respectively. The OLED device with the PPpX passivation film (passivated device) showed similar electrical and optical characteristics to those of the OLED device without the PPpX passivation film (control device), indicating that the PECVD process did not degrade the performance of the OLEDs notably. The lifetime of the passivated device was two times longer than that of the control device. Passivation of OLEDs with PPpX films also suppressed the growth of dark spots. The density and size of dark spots of the passivated device were much smaller than those of the control device.

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A Study on pricess characteristics of $ZrO_2$ films prepared on poly-ethlene naphthalate by using Facing tagets sputtering system (대향타겟식 스퍼터링 방법에 의해 PEN 기판위에 성막된 $ZrO_2$ 박막의 공정 특성에 관한 연구)

  • Cho, Do-Hyun;Kwon, Oh-Jung;Wang, Tae-Hyun;Kim, Ji-Hwan;Park, Sung-Hwan;Hong, Woo-Pyo;Kim, Hwa-Min;Kim, Jong-Jae
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.06a
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    • pp.423-424
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    • 2008
  • A facing target sputtering (FTS) equiment is fabricated and its process characteristics are investigated to search for the possibility of applications to film passivation system for organic light emitting diodes (OLEDs). We report that the FTS system can prepare a high quality $ZrO_2$ films with a dense micro structure and an excellent uniformity less than 5% and a high transmittance over an average 80% in the visible range. We suggest that the FTS is one of the suitable deposition techniques for the thin film passivation layer of OLEDs and the gas barrier layer of polymer substrate.

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Effects of Gas Chemistries on Poly-Si Plasma Etching with I-Line and DUV Resist (I-Line과 DUV Resist에서 Poly-Si 플라즈마 식각시 미치는 개스의 영향)

  • 신기수;김재영
    • Journal of the Korean Vacuum Society
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    • v.7 no.2
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    • pp.155-160
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    • 1998
  • It is necessary to use Arc layer and DUV resist to define 0.25 $\mu \textrm{m}$ line and space for 256 MDRAM devices. Poly-Si etching with Arc layer and different resists has been performed in a TCP-9408 etcher with variation of gas chemistries; $Cl_2/O_2, Cl_2/N_2, Cl_2$/HBr . DUV resist causes more positive etch profile and CD gain compared to I-line resist because the sidewall passivation is more stimulated by increasing polymerization through the loss of resist. When Arc layer is applied, CD hain also increases due to the polymeric mask formed after thching Arc layer. From the point of gas chemistry effects, the etch profile and CD gain is not improved using $Cl_2/O_2$ gas, since polymerization is accelerated in this gas. however, the vertical profile and less CD gain is obtained using $Cl_2$/HBr gas. Furthermore, HBr gas is very effective to suppress the difference of profile and CD variation between dense pattern and isolated pattern by minimizing non-uniformity of side wall passivation with pattern density.

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Effective Interfacial Trap Passivation with Organic Dye Molecule to Enhance Efficiency and Light Soaking Stability in Polymer Solar Cells

  • Rasool, Shafket;Zhou, Haoran;Vu, Doan Van;Haris, Muhammad;Song, Chang Eun;Kim, Hwan Kyu;Shin, Won Suk
    • Current Photovoltaic Research
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    • v.9 no.4
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    • pp.145-159
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    • 2021
  • Light soaking (LS) stability in polymer solar cells (PSCs) has always been a challenge to achieve due to unstable photoactive layer-electrode interface. Especially, the electron transport layer (ETL) and photoactive layer interface limits the LS stability of PSCs. Herein, we have modified the most commonly used and robust zinc oxide (ZnO) ETL-interface using an organic dye molecule and a co-adsorbent. Power conversion efficiencies have been slightly improved but when these PSCs were subjected to long term LS stability chamber, equipped with heat and humidity (45℃ and 85% relative humidity), an outstanding stability in the case of ZnO/dye+co-adsorbent ETL containing devices have been achieved. The enhanced LS stability occurred due to the suppressed interfacial defects and robust contact between the ZnO and photoactive layer. Current density as well as fill factors have been retained after LS with the modified ETL as compared to un-modified ETL, owing to their higher charge collection efficiencies which originated from higher electron mobilities. Moreover, the existence of less traps (as observed from light intensity-open circuit voltage measurements and dark currents at -2V) are also found to be one of the reasons for enhanced LS stability in the current study. We conclude that the mitigation ETL-surface traps using an organic dye with a co-adsorbent is an effective and robust approach to enhance the LS stability in PSCs.