• Journal of the Society of Naval Architects of Korea
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• v.35 no.4
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• pp.1-10
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• 1998

This paper presents a vorticity-based numerical method for analyzing an incompressible Newtonian viscous flow around an impulsively started cylinder. The Navier-Stockes equations have a natural Helmholtz decomposition. The vorticity transport equation and the pressure equation are derived from this decoupled form. The associated boundary conditions are dynamic for the vorticity and pressure variables representing the coupling relation between them and the force balance on the wall. The various numerical treatments for solving the governing equations are introduced. According to Wu et al.(1994), the boundary conditions are decoupled, keeping the dynamic relation between vorticity and pressure. The vorticity transport equation is formulated by FVM and TVD(Total Variation Diminishing) scheme is used for the convection term. An integral approach similar to the panel method is used to obtain the velocity field for a given vorticity field and the pressure field, instead of the conventional differential approaches. In the numerical process, the structured grid is generated. The results are compared to existing numerical and analytic results for the validity of the present method.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.30 no.4B
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• pp.162-169
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• 2005

Network traffic measurements show that the data traffic on packet switched networks has the self-similar features which is different from the traditional traffic models such as Poisson distribution or Markovian process model. Most of the call admission control researches have been done on the performance analysis of a single network switch. It is necessary to consider the performance analysis of the proposed admission control scheme under interconnected switch environment because the data traffic transmits through switches in networks. From the simulation results, it is shown that the call admission control scheme may not operate properly on the interconnected switch even though the scheme works well on a single switch. In this parer, we analyze the cell loss probability, utilization and self-similarity of output ports of the interconnected networks switch by using shared buffer memory management schemes and propose the new call admission control scheme considering the interconnected network switches under self-similar traffic environments.

• The KIPS Transactions:PartD
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• v.8D no.6
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• pp.835-842
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• 2001

We propose a software-reliability growth model incoporating the amount of testing effort expended during the software testing phase. The time-dependent behavior of testing effort expenditures is described by a Weibull curve. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, a software-reliability growth model is formulated by a nonhomogeneous Poisson process. Using this model the method of data analysis for software reliability measurement is developed. After defining a software reliability, we discuss the relations between testing time and reliability and between duration following failure fixing and reliability are studied in this paper. The release time making the testing cost to be minimum is determined through studying the cost for each condition. Also, the release time is determined depending on the conditions of the specified reliability. The optimum release time is determined by simultaneously studying optimum release time issue that determines both the cost related time and the specified reliability related time.

• Journal of KIISE:Computer Systems and Theory
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• v.36 no.4
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• pp.239-246
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• 2009

In this study, we analyze the mean waiting time on the nested open queueing network, where the population within each subnetwork is controlled by a semaphore queue. The queueing network can be transformed into a simpler queueing network in terms of customers waiting time. A major characteristic of this model is that the lower layer flow is halted by the state of higher layer. Since this type of queueing network does not have exact solutions for performance measure, the lower bound and upper bound on the mean waiting time are checked by comparing them with the mean waiting time in the transformed nested queueing network. Simulation estimates are obtained assuming Poisson arrivals and other phase-type arrival process, i.e., Erlang and hyper-exponential distributions. The bounds obtained can be applied to get more close approximation using the suitable approach.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2006.05a
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• pp.865-868
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• 2006

In this paper, the subthreshold swing has been analyzed for double gate FinFET under channel length of 20nm. The analytical current model has been developed, including thermionic current and tunneling current models. The potential distribution by Poisson equation and carrier distribution by Maxwell-Boltzman statistics are used to calculate thermionic emission current, and WKB(Wentzel-Framers-Brillouin) approximation to tunneling current. The cutoff current is obtained by simple adding two currents since two current is independent. The subthreshold swings by this model are compared with those by two dimensional simulation and two values are good agreement. Since the tunneling current increases especially under channel length of 10nm, the characteristics of subthreshold swing is degraded. The channel and gate oxide thickness have to be fabricated as thin as possible to decrease this short channel effects and this process has to be developed. The subthreshold swings as a function of channel doping concentrations are obtained.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2006.05a
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• pp.869-872
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• 2006

In this paper, the threshold voltage roll-off been analyzed for nano structure double gate FinFET. The analytical current model has been developed , including thermionic current and tunneling current models. The potential distribution by Poisson equation and carrier distribution by Maxwell-Boltzman statistics are used to calculate thermionic emission current, and WKB(Wentzel- framers-Brillouin) approximation to tunneling current. The threshold voltage roll-offs are obtained by simple adding two currents since two current is independent. The threshold voltage roll-off by this model are compared with those by two dimensional simulation and two values are good agreement. Since the tunneling current increases especially under channel length of 10nm, the threshold voltage roll-off Is very large. The channel and gate oxide thickness have to be fabricated as thin as possible to decrease this short channel effects and this process has to be developed.

• Journal of Information Technology Application
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• v.3 no.3
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• pp.91-106
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• 2001

We propose a software-reliability growth model incoporating the amount of uniform and Weibull testing efforts during the software testing phase in this paper. The time-dependent behavior of testing effort is described by uniform and Weibull curves. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, the model is formulated by a nonhomogeneous Poisson process. Using this model the method the data analysis for software reliability measurement is developed. The optimum release time is determined by considering how the initial reliability R($\chi$ 0) would be. The conditions are ($R\chi$ 0)＞$R_{o}$ , $P_{o}$ ＞R($\chi$ 0)＞ $R_{o}$ $^{d}$ and R($\chi$ 0)＜$R_{o}$ $^{d}$ for uniform testing efforts. deal case is $P_{o}$ ＞($R\chi$ 0)＞ $R_{o}$ $^{d}$ Likewise, it is ($R\chi$ 0)$\geq$$R_{o}$ , $R_{o}$ ＞($R\chi$ 0)＞R(eqation omitted) and ($R\chi$ 0)＜R(eqation omitted)for Weibull testing efforts. Ideal case is $R_{o}$ ＞ R($\chi$ 0)＞ R(eqation omitted).

• Journal of the Korea Institute of Information and Communication Engineering
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• v.11 no.4
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• pp.760-765
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• 2007

In this paper, the threshold voltage roll-off and drain induced barrier lowering(DIBL) have been analyzed for nano structure double gate FinFET. The analytical current model has been developed, including thermionic current and tunneling current models. The potential distribution by Poisson equation and carrier distribution by Maxwell-Boltzman statistics were used to calculate thermionic omission current, and WKB(Wentzel- Kramers-Brillouin) approximation to tunneling current. The threshold voltage roll-offs are obtained by simple adding two currents since two current is independent. The threshold voltage roll-off by this model are compared with those by two dimensional simulation and two values are good agreement. Since the tunneling current increases especially under channel length of 10nm, the threshold voltage roll-off and DIBL are very large. The channel and gate oxide thickness have to be fabricated as thin as possible to decrease this short channel effects, and this process has to be developed.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.12 no.1
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• pp.1-9
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• 2008

The Logistic cone is studied as a most desirable for the software testing effort. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, a software-reliability growth model is formulated by a nonhomogeneous Poisson process. Using this model the method of data analysis for software reliability measurement is developed. After defining a software reliability, This paper discusses the relations between testing time and reliability and between duration following failure fixing and reliability are studied SRGM in several literatures has used the exponential curve, Railleigh curve or Weibull cure as an amount of testing effort during software testing phase. However, it might not be appropriate to represent the consumption curve for testing effort by one of already proposed curves in some software development environments. Therefore, this paper shows that a logistic testing- effort function can be adequately expressed as a software development/testing effort curve and that it gives a good predictive capability based on real failure data.

• Structural Engineering and Mechanics
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• v.19 no.4
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• pp.425-440
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• 2005

In this paper, the behavior of a crack between two half-planes of functionally graded materials subjected to arbitrary tractions is resolved using a somewhat different approach, named the Schmidt method. To make the analysis tractable, it is assumed that the Poisson's ratios of the mediums are constants and the shear modulus vary exponentially with coordinate parallel to the crack. By use of the Fourier transform, the problem can be solved with the help of two pairs of dual integral equations in which the unknown variables are the jumps of the displacements across the crack surfaces. To solve the dual integral equations, the jumps of the displacements across the crack surfaces are expanded in a series of Jacobi polynomials. This process is quite different from those adopted in previous works. Numerical examples are provided to show the effect of the crack length and the parameters describing the functionally graded materials upon the stress intensity factor of the crack. It can be shown that the results of the present paper are the same as ones of the same problem that was solved by the singular integral equation method. As a special case, when the material properties are not continuous through the crack line, an approximate solution of the interface crack problem is also given under the assumption that the effect of the crack surface interference very near the crack tips is negligible. It is found that the stress singularities of the present interface crack solution are the same as ones of the ordinary crack in homogenous materials.