• Title/Summary/Keyword: Plasma emission

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Gallium nitride nanoparticle synthesis using nonthermal plasma with gallium vapor

  • You, K.H.;Kim, J.H.;You, S.J.;Lee, H.C.;Ruh, H.;Seong, D.J.
    • Current Applied Physics
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    • v.18 no.12
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    • pp.1553-1557
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    • 2018
  • Gallium nitride (GaN) nanoparticles are synthesized by the gallium particle trapping effect in a $N_2$ nonthermal plasma with metallic Ga vapor. A proposed method has an advantage of synthesized GaN nanoparticle purity because the gallium vapor from the inductively heated tungsten boat does not contain any impurity source. The synthesized particle size can be controlled by the amount of Ga vapor, which is adjusted using the plasma emission ratio of nitrogen to gallium, owing to the particle trapping effect. The synthesized nanoparticles are investigated by electron microscopy studies. High-resolution transmission electron microscopy (HRTEM) studies confirm that the synthesized GaN nanoparticles (10-40 nm) crystallize in a single-phase wurtzite structure. Room-temperature photoluminescence (PL) measurements indicate the band-edge emission of GaN at around 378 nm without yellow emission, which implies that the synthesized GaN nanoparticles have high crystallinity.

Characteristics of Plasma Plume with a Cylindrical Syringe Plasma Jet Device (원통형 바늘 구조의 플라즈마 제트 방출 특성)

  • Lim, H.K.;Jin, D.J.;Kim, J.H.;Han, S.H.;Cho, G.S.
    • Journal of the Korean Vacuum Society
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    • v.20 no.1
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    • pp.14-21
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    • 2011
  • The plasma emission characteristics are investigated in cylindrical syringe plasma jet device. Cylindrical syringe electrode is applied AC power using inverter. In the center of syringe is injected into a inert gas and plasma jet occurs. If there is no ground electrode, firing voltage is 3 kV and plasma column length is 10 mm. According to high firing voltage and large current, the plasma column length control is difficult. The case of an internal ground electrode, firing voltage is 1 kV. Because of the losing current from internal ground, even if a higher input voltage, plasma emission does not occur. The case of an external ground electrode, the plasma column can be controlled between 0~10 mm with change the applied voltage from 1 to 2 kV, and the discharging current changed from 1 to 4 mA.

Dry etching of tin oxide thin films using an atmospheric pressure cold plasma (대기압 저온 플라스마에 의한 산화 주석 박막의 식각)

  • 이봉주;히데오미코이누마
    • Journal of the Korean Vacuum Society
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    • v.10 no.4
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    • pp.411-415
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    • 2001
  • Using the plasma that we developed to generate a low-temperature plasma at atmospheric pressure, we have investigated the etching possibility of tin oxide $(SnO_2)$ thin films. Hydrogen and methane radicals generated from the plasma were observed and their intensity was found to be dependent on the cathode material by an analysis with optical emission spectroscopy as well as by the plasma impedance. The etching ability of this plasma was evaluated by an emission intensity as well as by the evaluation of impedance using a plasma I-V curve.

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Analysis of First Wafer Effect for Si Etch Rate with Plasma Information Based Virtual Metrology (플라즈마 정보인자 기반 가상계측을 통한 Si 식각률의 첫 장 효과 분석)

  • Ryu, Sangwon;Kwon, Ji-Won
    • Journal of the Semiconductor & Display Technology
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    • v.20 no.4
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    • pp.146-150
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    • 2021
  • Plasma information based virtual metrology (PI-VM) that predicts wafer-to-wafer etch rate variation after wet cleaning of plasma facing parts was developed. As input parameters, plasma information (PI) variables such as electron temperature, fluorine density and hydrogen density were extracted from optical emission spectroscopy (OES) data for etch plasma. The PI-VM model was trained by stepwise variable selection method and multi-linear regression method. The expected etch rate by PI-VM showed high correlation coefficient with measured etch rate from SEM image analysis. The PI-VM model revealed that the root cause of etch rate variation after the wet cleaning was desorption of hydrogen from the cleaned parts as hydrogen combined with fluorine and decreased etchant density and etch rate.

Influences of degradation in MgO protective layer and phosphors on ion-induced secondary electron emission coefficient and static margins in alternating current plasma display panels

  • Jeong, H.S.;Lim, J.E.;Park, W.B.;Jung, K.B.;Choi, E.H.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2004.08a
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    • pp.518-521
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    • 2004
  • The degradation characteristics of MgO protective layer and phosphors have been investigated in terms of the ion-induced secondary electron emission coefficient ${\gamma}$ and static margin of discharge voltages, respectively, in this experiment. The ion-induced secondary electron emission coefficients ${\gamma}$ for the degraded MgO protective layer and phosphors have been studied by ${\gamma}$ -focused ion beam system. The energy of Ne+ ions used is from 80 eV to 200 eV in this experiment. The degraded MgO and phosphor layers are found to have higher ${\gamma}$ than that of normal ones without degradations or aged one. Also, the static margin of discharge voltages for test panels with degraded MgO protective layer and phosphors been found to be seriously decreased in comparison with those of normal ones without degradations.

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Measurement of secondary electron emission coefficient(${\gamma}$) with oblique low energy ion and work function ${\phi}_{\omega}$ of theMgO thin film in AC-PDPs

  • Park, W.B.;Lim, J.Y.;Oh, J.S.;Jeong, H.S.;Jung, K.B.;Jeon, W.;Cho, G.S.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2004.08a
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    • pp.507-510
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    • 2004
  • Oblique ion-induced secondary electron emission coefficient(${\gamma}$) with low energy ..and work function ${\phi}_{\omega}$(${\theta}$ = 0 and ${\theta}$ = 20) of the MgO thin film in AC-PDPs has been measured by ${\gamma}$-FIB system. The MgO thin film has been deposited from sintered material under electron beam evaporation method. The energy of $He^+$ ions used has been ranged from 50eV to 150eV. Oblique ion beam has been chosen to be 10 degree, 20 degree and 30 degree. It is found that the higher secondary electron emission coefficient(${\gamma}$) has been achieved by the higher oblique ion beam up to inclination angle of 30 degree than the perpendicular incident ion beam.

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Influence of the Density Gradient on the Current of the Electrode Immersed in the Non-uniform Plasma (플라즈마 삽입전극의 전류에 미치는 밀도 구배의 영향)

  • Hwang, Hui-Dong;Gu, Chi-Wuk;Chung, Kyung-Jae;Choe, Jae-Myung;Kim, Gon-Ho;Ko, Kwang-Cheol
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.24 no.6
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    • pp.504-509
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    • 2011
  • The conducting current of non-uniform plasma immersed electrode consists of ion current and secondary electron emission current caused by the impinging ion current. The ion current is determined by the ion dose passing through the sheath in front of electrode and the ion distribution in front of the electrode plays an important role in the secondary electron emission. The investigation of the distributed plasma and secondary electron effect on electrode ion current was carried out as the stainless steel electrode plugged with quartz tube was immersed in the inductively coupled Ar plasma using the antenna powered by 1 kw and the density profile was measured. After that, the negative voltage was applied by 1 kV~6 kV to measure the conduction current for the analysis of ion current.

Precise correction of the copper emission spectra from the pulsed plasma jet (펄스 플라즈마 제트내에 있는 구리원자의 발광 스펙트럼 정밀 보정)

  • 김종욱;고동섭;오승묵
    • Korean Journal of Optics and Photonics
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    • v.12 no.2
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    • pp.115-120
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    • 2001
  • In the present study, we described in detail a precise correction method of the copper emission spectra obtained from a highpressure and high-temperature pulsed plasma-jet. The pulsed plasma-jet is initiated from an electro-thermal capillary discharge through a small orifice, and expanded rapidly into an atmosphere. In order to characterize the plasma, fundamental measurements such as the plasma excitation temperature or electron number density are essential. However those spectral lines which are directly related to the excitation temperature or electron number density may be distorted by the spectral response of the optical instruments used. Therefore, in this paper, we discuss some efforts to derive precise correction methods of the copper emission spectra obtained from the pulsed plasma-jet. a-jet.

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The Field Emission Properties of Density Controlled Carbon Nanotubes

  • Lee, Tae-Young;Kim, Do-Yoon;Yoo, Ji-Beom;Park, Chong-Yun
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.845-848
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    • 2003
  • We investigated a field emission property of CNTs grown on pre-treated substrates by $H_{2}$ plasma etching method in vacuum chamber (<${10^{-7}}$ Torr). To improve the emission characteristics, various catalysts and buffer layers were used. The morphology and density of catalyst layer was controlled by the different plasma pre-treatment conditions, resulting in the control of the growth characteristics of CNTs.

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Field Emission Characteristics and Growth Analysis of Carbon Nanotubes by Plasma-enhanced Chemical Vapor Deposition (플라즈마 화학 기상 증착법을 이용한 탄소나노튜브의 성장 분석 및 전계방출 특성)

  • 오정근;주병권;김남수
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.16 no.12S
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    • pp.1248-1254
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    • 2003
  • Carbon nanotubes(CNTs) are grown by using Co catalyst metal. CNTs fabricated by PECVD(plasma enhanced chemical vapor deposition) method are studied in terms of surface reaction and surface structure by TEM and Raman analysing method and ate analysed in its electrical field emission characteristics with variation of space between anode and cathode. Acetylene(C$_2$H$_2$) gas is used as the carbon source, while ammonia and hydrogen gas are used as catalyst and dilution gas. The CNTs grown by hydrogen(H$_2$) gas plasma indicates better vortical alignment, lower temperature process, and longer tip, compared to that grown by ammonia(NH$_3$) gas plasma. The CNTs fabricated with Co(cobalt) catalyst metal and PECVD method show the multiwall structure in mid-circle type in tip-end and the inner vacancy of 10nm. Emission properties of CNTs indicate the turn-on field to be 2.6 V/${\mu}{\textrm}{m}$ We suggest that CNTs can be possibly applied to the emitter tip of FEDs and high brightness flat lamp because of low temperature CNTs growth, low turn-on field.