• Journal of the Optical Society of Korea
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• 제14권2호
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• pp.131-136
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• 2010

Modification of the phase gradient formulation is proposed in order to make phase retrieval less susceptible to noise. The modified formulation is derived from separation of the phase terms and the intensity modulation terms of interferograms, and subsequent differentiation to reduce the noise-induced error of the phase gradient vector. Its performance is evaluated and compared to that of the conventional formulation, and noise-robust nature is confirmed.

• Journal of the Optical Society of Korea
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• 제17권5호
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• pp.415-422
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• 2013

White-light phase-shifting interferometry (WLPSI) is widely recognized as a standard method to measure shapes with high resolution over a long distance. In practical applications, WLPSI, however, is associated with some degree of ambiguity of its phase, which occurs due to a phase delay, which is the offset between the phase of the fringes and the fringe envelope peak position. In this paper, a new algorithm is proposed for the determination of a fringe order suitable for samples in which the phase delay mainly occurs due to noise, diffraction and a steep angle. The concepts of the decouple factor and the connectivity are introduced and a method for calculating the decouple factor and the connectivity is developed. With the phase-unwrapping procedure which considers these values, it is demonstrated that our algorithm determines the correct fringe order. To verify the performance of the algorithm, a simulation was performed with the virtual step height under noise. Some specimens such as step height standard and a column spacer with a steep angle are also measured with a Mirau interference microscope, after which the algorithm is shown to be effective and robust.

• Journal of the Optical Society of Korea
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• 제16권4호
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• pp.354-364
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• 2012

In this paper, a new 2-step quadrature phase-shifting digital holographic optical encryption method using orthogonal polarization is proposed and tolerance errors for this method are analyzed. Unlike the conventional technique using a PZT mirror, the proposed optical setup comprises two input and output polarizers, and one ${\lambda}$/4-plate retarder. This method makes it easier to get a phase shift of ${\pi}$/2 without using a mechanically driven PZT device for phase-shifting and it simplifies the 2-step phase-shifting Mach-Zehnder interferometer setup for optical encryption. The decryption performance and tolerance error analysis for the proposed method are presented. Computer experiments show that the proposed method is an alternate candidate for 2-step quadrature phase-shifting digital holographic optical encryption applications.

• 한국정밀공학회지
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• 제15권11호
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• pp.121-129
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• 1998

In-plane ESPI(Electronic Speckle Pattern Interferometry) was devised to measure in-plane deformations and rotation of a specimen with laser in this study. ESPI is a optical measuring method to be able to measure the deformations of engineering components and materials in industrial fields. The conventional measuring methods of surface deformations such as the strain gauge have many demerits because they are contact and point-to-point measuring ones. But that ESPI is noncontact, nondestructive and whole field measuring method can overcome previous disadvantages. We used ESPI which is sensitive to in-plane displacement for measuring in-plane deformations of a disk. And the 4-frame phase shifting method was used for the quantitative analysis. First of all, the system calibration was done due to an in-plane rotation before getting deformations of a disk. Finally we showed good agreement between the experiment results and those of the FEA(Finite Element Analysis).

• 한국정밀공학회지
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• 제24권11호
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• pp.37-43
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• 2007

• 한국정밀공학회지
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• 제23권4호
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• pp.22-28
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• 2006

• International Journal of Precision Engineering and Manufacturing
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• 제4권5호
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• pp.41-46
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• 2003

Electronic Speckle Pattern Interferometry (ESPI) has been recently developed and widely used because it has the advantage of being able to measure surface deformations of engineering components and materials in industrial areas without contact. The speckle patterns formed with interference and scattering phenomena can measure not only the out-of-plane but also the in-plane deformations. Digital image equipment processes the information included in the speckle patterns and displays the consequent interferogram on a computer monitor. In this study, the experimental results of a canti-levered plate using ESPI were compared with those obtained from the simple beam theory. The ESPI results of the canti-levered plate, analyzed by 4-step phase shifting method, are close to the theoretical expectation. Similarly, out-of-plane displacements of a spot welded canti-levered plate were also measured by ESPI with 4-step phase shifting technique. The phase map of the spot welded canti-levered plate is quite different from that of the canti-levered plate without spot welding.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 1997년도 춘계학술대회 논문집
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• pp.91-95
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• 1997

ESPI(Electronic Speckle Pattern Interferometry) is new optical measuring method to be able to measure the surface deformations of engineering components and materials in industrial areas. Conventional measuring method of surface deformation such as the strain gauge have many demerits because it is contact and point-to-point measuring one. But ESPI that is non-contact, whole field measuring method can overcome previous disadvantages. The speckle pattern to be formed with interference phenomena of scattering light from rough surfaces illuminated by laser light have phase information of surface In this study we used this interference phenomena and the phase shifting method to measure the in- plane deformation, together with the use of digital equipment to process the information contained in the speckle pattern and to display consequent inter ferograms. Finally we obtained good agreement between the experimenta results and those of FEM..

• 한국생산제조학회지
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• 제8권6호
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• pp.78-83
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• 1999

This study discusses a non-contact optical technique, electronic speckle pattern interformetry(ESPI), that is well suited for in-plane and out-of-plane deformation measurement. However, the existing ESPI methods that are based on dual-exposure, real-time and time-average method have difficulties for accurate measurement of structure, due to irregular intensity and shake of phase. Therefore, phase shifting method has been proposed in order to solve this problem. About the method, the path of reference light in interferometry is shifted and added to least square fitting method to make the improvement in distinction and precision. This proposed method is applied to measure in -plane displacement that is compared with the previous method. Also, Used as specimen AS4/PE따 [30/=30/90]s was analyzed by ESPI based on real-time to determine the characteristics of vibration under no-load and tension. These results are quantitatively compared with those of FEM analysis inmode shapes.

• Journal of the Optical Society of Korea
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• 제15권3호
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• pp.244-251
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• 2011

We propose a new 2-step phase-shifting digital holographic optical encryption technique and analyze tolerance error for this cipher system. 2-step phase-shifting digital holograms are acquired by moving the PZT mirror with phase step of 0 or ${\pi}$/2 in the reference beam path of the Mach-Zehnder type interferometer. Digital hologram with the encrypted information is Fourier transform hologram and is recorded on CCD camera with 256 gray-level quantized intensities. The decryption performance of binary bit data and image data is analyzed by considering error factors. One of the most important errors is quantization error in detecting the digital hologram intensity on CCD. The more the number of quantization error pixels and the variation of gray-level increase, the more the number of error bits increases for decryption. Computer experiments show the results to be carried out encryption and decryption with the proposed method and the graph to analyze the tolerance of the quantization error in the system.