• 제목/요약/키워드: Phase Measuring Technique

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High-speed, High-resolution Phase Measuring Technique for Heterodyne Displacement Measuring Interferometers. (헤테로다인 변위 측정 간섭계의 고속, 고분해능 위상 측정)

  • 김승우;김민석
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 한국정밀공학회 2002년도 춘계학술대회 논문집
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    • pp.203-206
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    • 2002
  • One of the ever-increasing demands on the performances of heterodyne interferometers is to improve the measurement resolution, of which current state-of-the-art reaches the region of sub-nanometers. We propose a new scheme of phase-measuring electronics that reduces the measurement resolution without further increase in clock speed. Our scheme adopts a super-heterodyne technique that lowers the original beat frequency to a level of 1 MHz by mixing it with electrically generated reference signal. The technique enables us to measure the phase of Doppler shift with a resolution of 1.58 nanometer at a sampling rate of 1 MHz. To avoid the undesirable decrease in the maximum measurable speed caused by the lowered beat frequency, a special from of frequency up-down counting technique is combined with the super-heterodyning. This alloys performing required phase unwrapping simply by using programmable digital gates without 2$\pi$ ambiguities up to the maximum velocity of 2.35 m/s.

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High-speed, High-resolution Phase Measuring Technique for Heterodyne Displacement Measuring Interferometers (헤테로다인 변위 측정 간섭계의 고속, 고분해능 위상 측정)

  • Kim, Min-Seok;Kim, Seung-Woo
    • Journal of the Korean Society for Precision Engineering
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    • 제19권9호
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    • pp.172-178
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    • 2002
  • One of the ever-increasing demands on the performances of heterodyne interferometers is to improve the measurement resolution, of which current state -of-the-art reaches the region of sub-nanometers. So far, the demand has been met by increasing the clock speed that drives the electronics involved fur the phase measurement of the Doppler shift, but its further advance is being hampered by the technological limit of modem electronics. To cope with the problem, in this investigation, we propose a new scheme of phase -measuring electronics that reduces the measurement resolution without further increase in clock speed. Our scheme adopts a super-heterodyne technique that lowers the original beat frequency to a level of 1 MHz by mixing it with a stable reference signal generated from a special phase- locked-loop. The technique enables us to measure the phase of Doppler shift with a resolution of 1.58 nanometer at a sampling rate of 1 MHz. To avoid the undesirable decrease in the maximum measurable speed caused by the lowered beat frequency, a special form of frequency up-down counting technique is combined with the super-heterodyning. This allows performing required phase unwrapping simply by using programmable digital gates without 2n ambiguities up to the maximum velocity guaranteed by the original beat frequency.

Separation of Isochromatics and Isoclinics from Photoelastic Fringes in a Circular Disk by Phase Measuring Technique

  • Baek, Tae-Hyun;Kim, Myung-Soo;Yoshihau Morimoto;Motoharu Fujigaki
    • Journal of Mechanical Science and Technology
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    • 제16권2호
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    • pp.175-181
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    • 2002
  • A new polariscope system involving two rotating optical elements and a digital camera for whole field fringe analysis allows automated data to be acquired quickly and efficiently. The developed phase measuring technique that uses eight images through a circular polariscope is presented for the digital measurement of isochromatics and isoclinics, respectively, from photoelastic fringes in a circular disk under diametric compression. Isochromatics can directly be obtained using wrapped isoclinic phases calculated by the arc tangent operator which is the four-quadrant operator from -$\pi$ to $\pi$. It is not required to unwrap isoclinic phases for the calculations of isochromatics. Unwrapped isoclinics are directly determined from isochromatic parameters. Distributions of digitally determined isoclinics are in close agreement to manual measurements. The errors which would appear in unwrapping process of isoclinics can be avoided in the determination of isochromatics.

A study on the nonlinear error correction of the phase measuring profilometry (PMP 형상 측정법에서 비선형 오차보정에 관한 연구)

  • 황용선;강영준;박낙규;백성훈
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 한국정밀공학회 2003년도 춘계학술대회 논문집
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    • pp.513-516
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    • 2003
  • Phase Measuring Profilometry(PMP) has been developed as one of three dimensional 3-D shape measuring methods. The 3-D profile of an object was calculated from the phase data obtained by the sinusoidal patterns projected on the object. However, in some cases the approximation includes considerable errors. In this paper, the effect on the errors caused by the optical geometry and the calibration procedure in PMP technique are discussed. The errors which occured in the process of calculating the 3-D profile from the phase distribution are investigated theoritically and experimentally.

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An Analysis Technique of Ultrasonic Pulse Signal for Measuring Ship's Draught (선박의 홀수 측정을 위한 초음파 펄스 신호의 해석기법)

  • 이은방;이상집
    • Journal of the Korean Institute of Navigation
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    • 제19권4호
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    • pp.1-8
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    • 1995
  • Although ship's draught information onboard is substantial for both the safety of navigation and the estimation of loaded cargoes, its accuracy depends, in conventional surveying method, on the skillfulness of observers and the condition of the sea surface round the vessel. To obtain more accurate information accessibly, measuring instruments with sophisticated sensors such as mechanical, electronic and ultrasonic transducers have been developed. However, they have still limitation in accuracy and in making up a system due to the complexity of processing signal. In this paper, we propose a new technique for analyzing ultrasonic pulse signal, in order to improve the measurement accuracy and simplify a remote sensing system of draught by ultrasonic waves. In this technique, pulse signal is translated into phase curve which is composed of the phase value defined in time domain. Then, the time interval between two signals different in waveform, is waveform, is analytically determined by calculating average time difference on phase curves. Also, analytical procedure can be carried out in real time with the successive five data sampled at T/4, for high speed digital processing with computer and A/D converter. This technique is useful for measuring draught under the influence of sea condition and for interfacing its data briefly to the integrated bridge system.

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A study on the phase calibration of the phase measuring profilometry (PMP 형상 측정법의 위상보정에 관한 연구)

  • 이연태;강영준;황용선
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 한국정밀공학회 2002년도 추계학술대회 논문집
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    • pp.421-424
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    • 2002
  • The 3-D measurement using a sinusoidal grating pattern projection is very attractive because of its high measuring speed and high sensitivity. When a sinusoidal amplitude grating was projected on an object, the surface-height distribution of the object is translated into a phase distribution of the deformed grating image. The phase-acquisition algorithms are so sufficiently simple that high-resolution phase maps using a CCD camera can be generated in a short time. The PMP technique is discussed, and the analysis of the systematic errors, the calibration procedure designed to determined the optimal setting of the measurement parameters is illustrated. Results of measurements and calibrations on the measurement plane objects are described.

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Gain and Phase Mismatch Calibration Technique in Image-Reject RF Receiver

  • Lee, Mi-Young;Yoo, Chang-Sik
    • Journal of electromagnetic engineering and science
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    • 제10권1호
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    • pp.25-27
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    • 2010
  • This paper presents a gain and phase mismatch calibration technique for an image-reject RF receiver. The gain mismatch is calibrated by directly measuring the output signal amplitudes of two signal paths. The phase mismatch is calibrated by measuring the output amplitude of the final IF output at the image band. The calibration of the gain and phase mismatch is performed at power-up, and the normal operation of the RF receiver does not interfere with the mismatch calibration circuit. To verify the proposed technique, a 2.4-GHz Weaver image-reject receiver with the gain and phase mismatch calibration circuit is implemented in a 0.18-${\mu}m$ CMOS technology. The overall receiver achieves a voltage gain of 45 dB and a noise figure of 4.8 dB. The image rejection ratio(IRR) is improved from 31 dB to 59.76 dB even with 1 dB and $5^{\circ}$ mismatch in gain and phase, respectively.

Non-Contacted Strain Analysis by Dual-beam Shearography (변형 해석을 위한 Dual-beam Shearography)

  • 김경석;정성욱;장호섭;최태호
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 한국정밀공학회 2002년도 추계학술대회 논문집
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    • pp.400-403
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    • 2002
  • This paper presents a shearographic technique for measuring in-plane strains. During the measurement, the test object is illuminated alternately with two laser beams, symmetrically with respect to the viewing direction. Employing a phase shift technique, the phase distributions due to object deformation for each beam are obtained separately. The difference of the two phase distributions depicts the derivative of in-plane surface displacements. The technique is equivalent to a system of many strain gages.

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Thickness Measurement of a Transparent Thin Film Using Phase Change in White-Light Phase-Shift Interferometry

  • Kim, Jaeho;Kim, Kwangrak;Pahk, Heui Jae
    • Current Optics and Photonics
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    • 제1권5호
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    • pp.505-513
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    • 2017
  • Measuring the thickness of thin films is strongly required in the display industry. In recent years, as the size of a pattern has become smaller, the substrate has become larger. Consequently, measuring the thickness of the thin film over a wide area with low spatial sampling size has become a key technique of manufacturing-yield management. Interferometry is a well-known metrology technique that offers low spatial sampling size and the ability to measure a wide area; however, there are some limitations in measuring the thickness of the thin film. This paper proposes a method to calculate the thickness of the thin film in the following two steps: first, pre-estimation of the thickness with the phase at the peak position of the interferogram at the bottom surface of the thin film, using white-light phase-shift interferometry; second, accurate correction of the measurement by fitting the interferogram with the theoretical pattern through the estimated thickness. Feasibility and accuracy of the method has been verified by comparing measured values of photoresist pattern samples, manufactured with the halftone display process, to those measured by AFM. As a result, an area of $880{\times}640$ pixels could be measured in 3 seconds, with a measurement error of less than 12%.

A Study on the Phase Transition of DPPC Organic Films (DPPC 유기박막의 상전이에 관한 연구)

  • 김동관;이순형;최영일;최충석;장희동;이경섭
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 한국전기전자재료학회 2000년도 하계학술대회 논문집
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    • pp.491-494
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    • 2000
  • Conductive Langmuir-Blodgett(LB) films have recently attracted much interest from the viewpoint of ultrathin film conductors at the molecular level. The result shows that the Maxwell-displacement-current(MDC) measuring technique is useful in the detection of phase-transition over the entire range of molecule areas. At the liquid-solid phase transition, a striking feature in the present current measurement was observed; the I-A isotherm for a DPPC monolayer has sharp bend. Dynamic behavior of monolayers in the presence of an external field was also investigated using the current-measuring technique. Dynamic behavier of DPPC monolayer was measured by displacement current when the molecules are stimulated by pressure velocity. As result, it is known that current is generated of higher current pe마 as compression velocity become faster. Also, in order to clarify the reorganization of the lipid monolayers, it is instructive to plot the relationship between I and 1/$A^2$.

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