CCP and ICP Combination Impedance Matching Device for Uniformity Improvement of Semiconductor Plasma Etching System (반도체 플라즈마 식각 시스템의 균일도 향상을 위한 CCP와 ICP 결합 임피던스정합 장치)
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- The Transactions of the Korean Institute of Power Electronics
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- v.15 no.4
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- pp.274-281
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- 2010