• Proceedings of the IEEK Conference
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• 1999.11a
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• pp.392-395
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• 1999

The state assignment for a finite state machine greatly affects the delay, area, and testabilities of the sequential circuits. In order to minimize the dependencies among state variables, therefore possibly to reduce the length and number of feedback cycles, a new state assignment technique based on m-block partition is introduced in this paper. After the completion of state assignment and logic synthesis, partial scan design is performed to choose minimal number of scan flip-flops. Experiment shows drastic improvement in testabilities while preserving low area and delay overhead.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.11
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• pp.11-20
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• 1998

Testability analysis computes controllabilities and observabilities of all lines of a circuit and then evaluates fault coverage. The values of controllability and observability as well as fault coverage produced by testability analysis are used for applications of testability analysis. ITEM was evaluated as a fault coverage tool. But the values of controllability and observability at all lines of circuits must be estimated as a performance measure of testability tools for another application such as partial scan. In this paper, partial scan method based on sensitivity analysis which estimates relative improvement of detectability of circuits after scanning a flip-flop is used for performance evaluation of ITEM. Performance of ITEM, with respect to testability values on each net, has been measured by comparing ITEM and STAFAN. Partial scan performance achieved by ITEM is very similar to that of STAFAN, but ITEM takes less CPU time. Therefore ITEM is very efficient for partial scan application because ITEM runs faster for very large circuits in which execution time is critical.

• KIPS Transactions on Software and Data Engineering
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• v.12 no.5
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• pp.229-236
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• 2023

Since 3D printed medical implant parts usually have surface defects, it is necessary to inspect the surface after manufacturing. In order to automate the surface inspection, it is effective to 3D scan the implant and reconstruct it as a scan model such as a point cloud. When constructing a scan model, the characteristics of the shape and material of the implant must be considered because it has characteristics different from those of general 3D printed parts. In this paper, we present a method to reconstruct the 3D scan model of a 3D printed metal bone-plate that is one kind of medical implant parts. Multiple partial scan data are produced by multi-view 3D scan, and then, we reconstruct a scan model by alignment and merging of partial data. We also present the process of the scan model reconstruction through experiments.

• The Transactions of the Korea Information Processing Society
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• v.3 no.3
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• pp.572-580
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• 1996

This paper describes a test generation method for sequential circuits which improves the application limits of the IPMT method by applying the partial scan design to the IPMT method. To solve the problem that the IPMT method requires enormous computation time in image computation, and generates test patterns after the partialscan design is introduced to reduce test complexity. Scan flip-flops are selected for the partial scan design according to the node size of the state functions of a sequential circuit in their binary decision diagram representations. Experimental results on ISCAS'95 benchmark circuits show that a test generator based on our method has achieved 100% fault coverage by use of either 20% scan FFs for s344, s349, and s420 or 80% scan FFs for sl423. However, test gener-ators based on the previous IPM method have not achieved 100% fault coverage for those circuits.

• The Journal of Korean Academy of Prosthodontics
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• v.30 no.4
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• pp.565-573
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• 1992

This clinical study was to analyze occlusal contacts in maximum intercuspation on distal extension partial denture and to compare tooth contact state between the denture teeth and abutment teeth by time mode and force mode using the T-scan system. The subjects ware twenty-one adult patients with upper natural teeth and lower distal extension partial denture. Conclusion : 1. The patient with simultaneous occlusal contacts both denture tooth and abutment and bilaterally in Kennedy Class I cases was one-sixth, but there was no one with symmetric occlusal and equal force among bilateral denture teeth and abutments. 2. The five-fifteenth of Kennedy Class I case patients resulted in simultaeous occlusal contacts bet-ween denture teeth and abutments but no one has the symmetric occlusal contacts and unifarm force between denture teeth and abutment teeth.

• Journal of Periodontal and Implant Science
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• v.48 no.4
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• pp.202-212
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• 2018

Purpose: Bone-to-implant contact (BIC) is difficult to measure on micro-computed tomography (CT) because of artifacts that hinder accurate differentiation of the bone and implant. This study presents an advanced algorithm for measuring BIC in micro-CT acquisitions using a spiral scanning technique, with improved differentiation of bone and implant materials. Methods: Five sandblasted, large-grit, acid-etched implants were used. Three implants were subjected to surface analysis, and 2 were inserted into a New Zealand white rabbit, with each tibia receiving 1 implant. The rabbit was sacrificed after 28 days. The en bloc specimens were subjected to spiral (SkyScan 1275, Bruker) and round (SkyScan 1172, SkyScan 1275) micro-CT scanning to evaluate differences in the images resulting from the different scanning techniques. The partial volume effect (PVE) was optimized as much as possible. BIC was measured with both round and spiral scanning on the SkyScan 1275, and the results were compared. Results: Compared with the round micro-CT scanning, the spiral scanning showed much clearer images. In addition, the PVE was optimized, which allowed accurate BIC measurements to be made. Round scanning on the SkyScan 1275 resulted in higher BIC measurements than spiral scanning on the same machine; however, the higher measurements on round scanning were confirmed to be false, and were found to be the result of artifacts in the void, rather than bone. Conclusions: The results of this study indicate that spiral scanning can reduce metal artifacts, thereby allowing clear differentiation of bone and implant. Moreover, the PVE, which is a factor that inevitably hinders accurate BIC measurements, was optimized through an advanced algorithm.

• Journal of KIISE:Software and Applications
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• v.32 no.10
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• pp.949-955
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• 2005

In this Paper, we propose fast block matching algorithm by dividing complex areas based on complexity order of reference block and square sub-block to reduce an amount of computation of full starch(FS) algorithm for fast motion estimation, while keeping the same prediction quality compared with the full search algorithm. By using the fact that matching error is proportional to the gradient of reference block, we reduced unnecessary computations with square sub-block adaptive matching scan based image complexity instead of conventional sequential matching scan and row/column based matching scan. Our algorithm reduces about $30\%$ of computations for block matching error compared with the conventional partial distortion elimination(PDE) algorithm without any prediction quality, and our algorithm will be useful in real-time video coding applications using MPEG-4 AVC or MPEG-2.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.37 no.11
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• pp.67-73
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• 2000

The state assignment for a finite state machine greatly affects the delay, area, and testabilities of the sequential circuits. In order to minimize the dependencies among groups of state variables, therefore possibly to reduce the length and number of feedback cycles, a new state assignment technique based on m-block partition is introduced in this paper. After the completion of proposed state assignment and logic synthesis, partial scan design is performed to choose minimal number of scan flip-flops. Experiment shows drastic improvement in testabilities while preserving low area and delay overhead.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.4
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• pp.30-37
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• 1998

In this paper, we propose a test generation method for large scale sequential circuits based on circuit partitioning to increase the size of circuits that the implicit product machine traversal (IPMT) method can handle. Our method paratitions a circuit under test into subset circuits with only single output, and performs a partial scan design using the state transtition cost that represents a degree of the connectivity of the subset circuit. The IPMT method is applied to the partitioned partial scan circuits in test generation. Experimental results for ISCAS89 benchmark circuits with more thatn 50 flip-flops show that our method has generated test patterns with almost 100% fault coverage at high speed by use of 34%-73% scanned flip-flops.

• Proceedings of the Korea Institute of Applied Superconductivity and Cryogenics Conference
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• 2002.02a
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• pp.119-122
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• 2002

The NiO buffer layers for YBCO coated conductor were prepared on textured Ni substrates by MOCVD method and the degree of texturizing and the surface roughness were analyzed X-ray pole figure and AFM and SEM. Processing variables were oxygen partial pressure and substrate temperature. (200) textured NiO layer was formed at 450~$470^{\circ}C$ and oxygen partial pressure of 1.67 Torr. Out-of-plane($\omega$-scan) and in-plane($\Phi$-scan) texture were $10.34^{\circ}$ and $10.00^{\circ}$ respectively. The surface roughness estimated by atomic force microscopy was in the range of 3.1~4.6 nm.