• 제목/요약/키워드: Partial Test

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유사 조합 회로로의 변환에 기초한 부분 스캔 기법을 이용한 디지털 순차 회로의 테스트 기법 연구 (Test Generation of Sequential Circuits Using A Partial Scan Based on Conversion to Pseudo-Combinational Circuits)

  • Min, Hyoung-Bok
    • 대한전기학회논문지
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    • 제43권3호
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    • pp.504-514
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    • 1994
  • Combinational automatic test pattern generators (CATPG) have already been commercialized because their algorithms are well known and practical, while sequential automatic test pattern generators(SATPG) have been regarded as impractical because they are computationally complex. A technique to use CATPG instead of SATPG for test generation of sequential circuits is proposed. Redesign of seauential circuits such as Level Sensitive Scan Design (LSSD) is inevitable to use CATPG. Various partial scan techniques has been proposed to avoid full scan such as LSSD. It ha sbeen reported that SATPG is required to use partial scan techniques. We propose a technique to use CATPG for a new partial scan technique, and propose a new CATPG algorithm for the partially scanned circuits. The partial scan technique can be another choice of design for testability because it is computationally advantageous.

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충돌 증후군과 회전근 개 파열을 위한 이학적 검사들의 진단적 가치에 대한 분석 (Diagnostic Accuracy of Physical Examinations in Impingement Syndrome and Rotator Cuff Tear)

  • 이영수;김진용;조덕연;김영호;김세현
    • Clinics in Shoulder and Elbow
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    • 제4권2호
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    • pp.186-190
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    • 2001
  • Purpose: The aim of this study was to investigate the diagnostic accuracy of Neer, Hawkins provocative tests and supraspinatus manual muscle test for the assessment of impingement syndrome, partial tear and small complete tear of De rotator cuff. Materials and Methods: Seventy-one female and 115 male patients were included in the study. Patients were divided into four groups of no impingement, impingement without tear, partial tear and small complete tear of the rotator cuff, which were confirmed by sonogram, magnetic resonance imaging and surgery. Neer and Hawkins provocative tests and supraspinatus manual muscle test were performed respectively. SAS 6.12 version was used in statistical analysis. Results: We found that Neer test had 94% sensitivity, 54% specificity for impingement without tear and 89% sensitivity, 78% specificity for partial tear and 96% sensitivity, 23% specificity for small tear. Hawkins test revealed 95% sensitivity, 54% specificity for impingement without tear and 93% sensitivity, 78% specificity for partial tear and 100% sensitivity, 23% specificity for small tear. Supraspinatus manual muscle test revealed 27% sensitivity, 94% specificity for impingement without tear and 29% sensitivity, 82% specificity for partial tear and 48% sensitivity, 82% specificity for small tear. Conclusion: Neer and Hawkins tests have high sensitivity, low specificity for impingement syndrome, partial and small tear. Supraspinatus manual muscle test had low sensitivity and high specificity. However this test was not effective to differentiate the partial and small rotator cuff tear. We thought that more effective provocative test should be designed to detect the partial and small rotator cuff tear.

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대규모 집적회로 설계를 위한 무고정 부분 스캔 테스트 방법 (No-Holding Partial Scan Test Mmethod for Large VLSI Designs)

  • 노현철;이동호
    • 전자공학회논문지C
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    • 제35C권3호
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    • pp.1-15
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    • 1998
  • In this paper, we propose a partial scan test method which can be applied to large VLSI designs. In this method, it is not necessary to hold neither scanned nor unscanned flip-flops during scan in, test application,or scan out. This test method requires almost identical design for testability modification and test wave form when compared to the full scan test method, and the method is applicable to large VLSI chips. The well known FAN algorithm has been modified to devise to sequential ATPG algorithm which is effective for the proposed test method. In addition, a partial scan algorithm which is effective for the proposed test method. In addition, a partial algorithm determined a maximal set of flip-flops which gives high fault coverage when they are unselected. The experimental resutls show that the proposed method allow as large as 20% flip-flops to remain unscanned without much decrease in the full scan fault coverage.

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XLPE 케이블의 PD 검출 필터 시험 (Filter Test for Detecting Partial Discharge in XLPE Cable)

  • 조재철;최용성
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2008년도 추계학술대회 논문집 전기설비전문위원
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    • pp.218-221
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    • 2008
  • Due to a variable noises in the field underground lines, clear technology of noises is very important in the diagnosis technology of partial discharge. Therefore we progressed filter test to improve the measuring test of partial discharge in a field. We applied to field test after making W-LC filter for partial discharge measurement, and then designed experimental environment such as under- ground distribution lines of field. Measuring sensor for test was UHF sensor. And we analysed those using the Lemke Probe and oscilloscope (TDS-3054, Tektro- nix). Finally, we obtained excellent data of noise decrement in the joint box of 22.9[kV] distribution lines from above experiment.

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XLPE 케이블의 PD 검출 필터 시험 (Filter Test for Detecting Partial Discharge in XLPE Cable)

  • 김대열;윤주호;최용성;박대희;이경섭
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2007년도 춘계학술대회 논문집 전기설비전문위원
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    • pp.72-74
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    • 2007
  • Due to a variable noises in the field underground lines, clear technology of noises is very important in the diagnosis technology of partial discharge. Therefore we progressed filter test to improve the measuring test of partial discharge in a field. We applied to field test after making W-LC filter for partial discharge measurement, and then designed experimental environment such as underground distribution lines of field. Measuring sensor for test was UHF sensor. And we analysed those using the Lemke Probe and oscilloscope (TDS-3054, Tektronix). Finally, we obtained excellent data of noise decrement in the joint box of 22.9[kV] distribution lines from above experiment.

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22.9kV XLPE 케이블 PD 검출용 필터 시험 (Filter Test for Detecting Partial Discharge in 22.9kV XLPE Cable)

  • 이용성;김정윤;김석종;이경용;최용성;박대희
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2005년도 제36회 하계학술대회 논문집 C
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    • pp.2277-2279
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    • 2005
  • Due to a variable noises in the field underground lines, clear technology of noises is very important in the diagnosis technology of partial discharge. Therefore we progressed filter test to improve the measuring test of partial discharge in a field. We applied to field test after making W-LC filter for partial discharge measurement, and then designed experimental environment such as under-ground distribution lines of field. Measuring sensor for test was UHF sensor. And we analysed those using the Lemke Probe and oscilloscope (TDS-3054, Tektronix). Finally, we obtained excellent data of noise decrement in the joint box of 22.9[kV] distribution lines from above experiment.

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발플라스트 레진 주입 시 발생되는 의치상의 두께변화에 관한 연구 (Research for Thickness Change of Denture Base in Flask when Injecting Valplast Flexible Partial Denture Resin)

  • 장완영;김부섭;정인성
    • 대한치과기공학회지
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    • 제30권2호
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    • pp.47-56
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    • 2008
  • This is a research for thickness change of denture base according to the shape of sprue & investment position of denture base in flask when injecting polyamid base resin for flexible partial denture as a part of study for Valplast among the flexible partial denture with a nylon base. It has been introduced several kinds of flexible partial denture product with a nylon base, but Valplast is the most widely used product among them. Valplast has been the most generally used material today since developed in 1950s in the United States as a material for flexible partial denture. Valplast is much more aesthetic than general metal-acrylic partial denture due to its translucent pink color and biocompatibility in terms of material characteristic. It keeps its flexibility for a long time after production, imposes a less burden on the teeth used as abutment, and it can be easily insert and remove due to its particular suppleness. Moreover, it is felt like real teeth more than metal-acrylic partial denture when being put in and takes alveolar bone under good protection since it receives occlusal force equally under the denture base. The most outstanding feature of Valplast is flexibility. The extent of its flexibility is determined by width & thickness of denture base. Considering general working procedure of Valplast, it can be seen that the thickness of denture base formed out of wax is increasing by the pressure while injecting resin. This research is to decide and test on the thickness increasing of Valplast by injecting pressure and the hypothesis upon that and is to prepare the basis estimating the increasing extent of thickness of denture base on the basis of the test result. In this test, it is expected occlusal malposition & thickness increasing of denture base by injecting pressure according to 4 kinds of test data which are to select 3 types of sprue method settling the forefront position at which the test material of fixed standard can be invested and to position the test material at the rearmost part keeping the minimum distance to set sprue. For 4 kinds of injecting test by investment position & sprue type, 20 test materials, 5 for each test were produced and a pressure of 1,180Kg was given with automatic injector of air cylinder type. The results are as follows: 1. For the amount of thickness increasing of denture base by investment position, the thickness of front investment is less increasing than the one of rear investment. 2. For the amount of thickness increasing of denture base by sprue type, the thickness of straight decompression sprue type which can absorb the injecting pressure after injecting polyamide base resin is less increasing than the other sprue types.

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무고정 부분 스캔 테스트 방법을 위한 스캔 선택 알고리즘 (Scan Selection Algorithms for No Holding Partial Scan Test Method)

  • 이동호
    • 전자공학회논문지C
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    • 제35C권12호
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    • pp.49-58
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    • 1998
  • 본 논문에서는 무고정 부분 스캔 테스트 방법을 위한 새로운 스캔 선택 알고리즘에 대하여 논한다. 무고정 부분 스캔 테스트 방법은 모든 플립-플롭을 스캔하지 않는다는 점을 제외하면 완전 스캔과 동일한 테스트 방법이다. 이 테스트 방법은 테스트 벡터를 입력, 인가, 혹은 적용 등, 어느 때에도 스캔, 비스캔 중 어느 플립-플롭의 데이터 값도 고정하지 않는다. 제안된 스캔 선택 알고리즘은 무고정 부분 스캔 테스트 방법에서 완전 스캔 고장 검출율을 거의 유지하면서 많은 플립-플롭을 스캔하지 않게 한다.

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