• ETRI Journal
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• v.27 no.1
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• pp.122-125
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• 2005

A polymer-based planar-lightwave-circuit-type variable optical attenuator (VOA) was fabricated using a hot embossing process. With an optimized one-step embossing process, forty micro-channels for the guidance of light were defined on a polymer thin film with an accuracy of ${\pm}0.5{\mu}m$. The fabricated polymeric thermo-optic VOA shows 30 dB attenuation with 110 mW electrical input power at $1.55{\mu}m$. The rise and fall times are less than 5 ms.

• Journal of the Microelectronics and Packaging Society
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• v.22 no.4
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• pp.25-29
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• 2015

Demand for a low-cost, high-throughput, and high-resolution patterning method for fabricating devices continues to increase. The roll-to-roll (R2R) imprint lithography technique has received a great deal of attention as a means of fabricating next-generation devices. In this paper, we propose a fabrication method for polymeric planar lightwave circuit (PLC) devices that uses R2R imprint lithography. The proposed technique uses an elastomeric polydimethylsiloxane (PDMS) mold. A Si wafer with micro patterns is used as the Si master. The PDMS mold is then replicated from the Si master. By applying a precise web tension and at a given web speed, we fabricated a micro-patterned PLC device. The insertion losses were 4.0 dB for a $1{\times}2$ optical splitter. As such, the proposed method of fabricating a PLC device by the R2R process was shown to be an effective solution.

• Journal of the Optical Society of Korea
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• v.12 no.3
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• pp.162-165
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• 2008

A novel planar lightwave circuit(PLC) triplexer using a three-waveguide interferometer(TWI) is proposed and examined using the transfer matrix and the beam propagation methods. The proposed triplexer consists of two three-waveguide couplers and three waveguides connecting the couplers. Simulation for the TWI triplexer shows the excess losses of 0.03 dB and 0.94 dB with the crosstalks of -22.3 dB and -14.5 dB in reception, respectively, for the wavelength of 1490- and 1550-nm, while showing the excess loss of 1.75 dB in transmission for the wavelength of 1310 nm. The proposed design shows compact feature as short as 11.5 mm for the refractive-index contrast of 0.45%.

• ETRI Journal
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• v.29 no.4
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• pp.452-456
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• 2007

Very compact 4-channel 200-GHz-spacing external cavity lasers (ECLs) were fabricated by hybrid integration of reflection gratings and superluminescent laser diodes on a planar lightwave circuit chip. The fifth-order gratings as reflection gratings were formed using a conventional contact-mask photo-lithography process to achieve low-cost fabrication. The lasing wavelength of the fabricated ECLs matched the ITU grid with an accuracy of ${\pm}0.1$ nm, and optical powers were more than 0.4 mW at the injection current of 80 mA for all channels. The ECLs showed single mode operations with more than 30 dB side lobe suppression.

• Proceedings of the Optical Society of Korea Conference
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• 2008.07a
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• pp.265-266
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• 2008

The environmental and mechanical reliability of planar lightwave circuit (PLC)-type optical splitter modules is investigated with references [1, 3]. The module is composed of Y-branching silica-based waveguides on Si connected to optical fiber with UV-curable adhesives and is packaged in a metal case which is filled with humidity-resistant resin. High optical performance such as low loss, low reflection, and thermal stability are obtained through the use of this fiber connection technique. Ten reliability tests including long-term environmental and mechanical and ALT test were carried out for more then ten $1{\times}32$ channel PLC splitter modules.

• Journal of the Korean Ceramic Society
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• v.41 no.11
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• pp.826-833
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• 2004

In this study, photosensitivity dynamics in SiO$_2$ glass with the composition similar to that of silica Planar Lightwave Circuit (PLC) devices was investigated as a fundamental study prior to the device fabrication. Silica bulk glasses with similar composition to the core layer of PLC devices were prepared with variable composition of B$_2$O$_3$. The photosensitivity in boron and germanium co-doped SiO$_2$ glass yields refractive index change $\Delta$n as high as 10$\^$-3/. However such index modulation disappeared after annealing. From the result of annealing experiment and W absorption / Raman spectra, we conclude the compaction model is applicable to our glass system.

• Korean Journal of Optics and Photonics
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• v.24 no.5
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• pp.251-255
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• 2013

In this paper, the characteristics of a humidity sensor implemented by Mach Zehnder Interferometer (MZI) in a Planar Lightwave Circuit (PLC) have been designed and demonstrated. The humidity outside is detected with polyvinylpyrrolidone (PVP) coated on the etched arm of the MZI. The length of the etched arm is 10 mm and the PVP was coated by dip-coating into the etched region. As the refractive index of the PVP changes with the surrounding humidity, the PVP-coated humidity sensor presented changes in the interferogram depending on RH (Relative Humidity) around the PLC. The measured results show that the proposed humidity sensor works successfully in the range of 30% to 80% of RH.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.06a
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• pp.390-390
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• 2008

In this paper, we have designed and fabricated optical waveguides based on the Mach-Zehnder Interferometer (MZI) for application to sensor. The evanecent-wave sensor based on the MZI principle has sufficiently high sensitivity to measure the change of the refractive index on surface of a waveguide. The waveguides were optimized at a wavelength of 1550 nm and fabricated according to the design rule of 0.45 delta%, which is the difference of refractive index between the core and clad. The fabrication of MZI optical waveguides was performed by a conventional Planar Lightwave Circuit (PLC) fabrication process. The fabricated MZI optical waveguide device was measured. According to the measurement result, the insertion loss of MZI optical waveguide device was below 3.5 dB and the polarization dependent loss (PDL) was within 0.1dB. In addition, we analyzed optical properties of MZI sensor according to the refractive index change of the sensor arm.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.44 no.4
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• pp.128-135
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• 2021

WDM(Wavelength Division Multiplexing) is called a wavelength division multiplexing optical transmission method and is a next-generation optical transmission technology. Case company F has recently developed and sold PLC(Planar Lightwave Circuit), a key element necessary for WDM system production. Although Chinese processing companies are being used as a global outsourcing strategy to increase price competitiveness by lowering manufacturing unit prices, the average defect rate of products manufactured by Chinese processing companies is more than 50%, causing many problems. However, Chinese processing companies are trying to avoid responsibility, saying that the cause of the defect is the defective PLC Wafer provided by Company F. Therefore, in this study, the responsibility of the PLC defect is clearly identified through estimating the defect rate of PLC using the sampling inspection method, and the improvement plan for each cause of the PLC defect for PLC yeild improvement is proposed. The result of this research will greatly contribute to eliminating the controversy over providing the cause of defects between global outsourcing companies and the head office. In addition, it is expected to form a partnership with Company F and a Chinese processing company, which will serve as a cornerstone for successful global outsourcing. In the future, it is necessary to increase the reliability of the PLC yield calculation by extracting more precisely the number of defects.

• Korean Journal of Optics and Photonics
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• v.16 no.3
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• pp.196-200
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• 2005

A 40 channel arrayed-waveguide grating (AWG) filter operating in C-band and L-band wavelength regions has been fabricated using PLC (Planar Lightwave Circuit) processes with 0.75 refractive index difference. Its design was optimized for matching the center wavelength with the ITU-recommended wavelength. The characteristics of the fabricated C-band AWG are as follows; average insertion loss < 2.5 dB, polarization-dependent loss < 0.3 dB, non-adjacent crosstalk >35dB, and the loss uniformity of 0.8 dB. In the L-band AWG, wavelength accuracy is below 0.02nm.