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http://dx.doi.org/10.11627/jksie.2021.44.4.128

A Case Study for Estimating the Defect Rate of PLC Using Sampling Inspection and Improving the Cause of Defects  

Moon, In-Sun (Department of Industrial & Management Engineering, Hanbat National University)
Lee, Dong-Hyung (Department of Industrial & Management Engineering, Hanbat National University)
Publication Information
Journal of Korean Society of Industrial and Systems Engineering / v.44, no.4, 2021 , pp. 128-135 More about this Journal
Abstract
WDM(Wavelength Division Multiplexing) is called a wavelength division multiplexing optical transmission method and is a next-generation optical transmission technology. Case company F has recently developed and sold PLC(Planar Lightwave Circuit), a key element necessary for WDM system production. Although Chinese processing companies are being used as a global outsourcing strategy to increase price competitiveness by lowering manufacturing unit prices, the average defect rate of products manufactured by Chinese processing companies is more than 50%, causing many problems. However, Chinese processing companies are trying to avoid responsibility, saying that the cause of the defect is the defective PLC Wafer provided by Company F. Therefore, in this study, the responsibility of the PLC defect is clearly identified through estimating the defect rate of PLC using the sampling inspection method, and the improvement plan for each cause of the PLC defect for PLC yeild improvement is proposed. The result of this research will greatly contribute to eliminating the controversy over providing the cause of defects between global outsourcing companies and the head office. In addition, it is expected to form a partnership with Company F and a Chinese processing company, which will serve as a cornerstone for successful global outsourcing. In the future, it is necessary to increase the reliability of the PLC yield calculation by extracting more precisely the number of defects.
Keywords
WDM(Wavelength Division Multiplexing); Sampling Inspection; PLC(Planar Lightwave Circuit); Defective Wafer; Global Outsourcing Strategy;
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