• 제목/요약/키워드: Oxygen-plasma treatment

검색결과 332건 처리시간 0.023초

플라즈마 후처리 시간에 따른 저유전율 SiOF 박막의 특성 (Characteristics of Low Dielectric Constant SiOF Thin Films with Post Plasma Treatment Time)

  • 이석형;박종완
    • 한국진공학회지
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    • 제7권3호
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    • pp.267-267
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    • 1998
  • ECR plasma CVD를 이용한 SiOF박막은 낮은 유전상수를 가지고 있으며, 기존의 공정과의 정합성이 우수해 다층배선 공정에 채용이 유망한 재료이지만 수분의 흡수로 인한 유전율의 상승과 후속공정의 안정성이 문제점으로 부각되고 있다. 따라서 본 연구에서는 SiOF박막의 내흡습성과 후속공정에서의 안정성을 향상시키기 위하여 SiOF박막을 증착한 후 후속 산소 플라즈마 처리를 행하였다. SiOF박막은 산소 플라즈마 처리를 수행함으로써 SiOF박막의 밀도가 증가하고, 수분과의 친화력이 강한 Si-F 결합이 감소하는 것이 주요한 원인으로 사료된다. 하지만 플라즈마 처리 시간이 5분 이상으로 증가하면 유전율의 증가가 일어난다. 따라서 본 실험에서는 산소 플라즈마 처리조건이 마이크로파 전력이 700W, 공정 압력이 3mTorr, 기판온도가 300℃일 경우 플라즈마 처리시간은 3분이 적당한 것으로 생각 된다.봉?향상시키기 위하여 SiOF박막을 증착한 후 후속 산소 플라즈마 처리를 행하였다. SiOF박막은 산소 플라즈마 처리를 수행함으로써 SiOF박막의 밀도가 증가하고, 수분과의 친화력이 강한 Si-F 결합이 감소하는 것이 주요한 원인으로 사료된다. 하지만 플라즈마 처리 시간이 5분 이상으로 증가하면 유전율의 증가가 일어난다. 따라서 본 실험에서는 산소 플라즈마 처리조건이 마이크로파 전력이 700W, 공정 압력이 3mTorr, 기판온도가 300℃일 경우 플라즈마 처리시간은 3분이 적당한 것으로 생각된다.

폴리아닐린/나일론 6 복합직물의 전기 전도도 향상 연구 (Conductivity Improvement of Polyaniline/Nylon 6 Fabrics)

  • 오경화;성재환;김성훈
    • 폴리머
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    • 제24권5호
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    • pp.673-681
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    • 2000
  • 플라즈마 처리가 나일론 6 직물의 표면 특성과 폴리아닐린/나일론 6 복합직물의 전도도에 미치는 영향을 연구하였다. 산소 플라즈마로 처리한 나일론 6 직물의 표면을 XPS 분석을 통해 확인한 결과 C-O, C-OH 등의 관능기가 도입되었으며, 이는 직물과 폴리아닐린의 결합력을 향상시켜 전기 전도도와 폴리아닐린 부착량을 증가시켰다. 또한 산소 플라즈마로 처리된 폴리아닐린/나일론 6 복합직물은 세탁과 마모에서도 우수한 안정성을 나타내었다. 초음파 처리는 매질에 발생된 cavitation과 진동에 의해 직물 내부로 아닐린을 확산시키는데 효과적이었으며, 이는 폴리아닐린/나일론 6 복합직물의 전기 전도도를 크게 향상시켰다. 아닐린의 농도와 중합욕에 침지 휫수가 증가함에 따라 전기 전도도와 복합직물의 형태안정성에 대한 영향을 살펴보았는데, 단량체 농도는 0.5M 까지는 증가함에 따라 전도도가 향상되었으며, 침지 횟수가 증가함에 따라서도 전도도가 향상되었다.

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코로나 방전 플라즈마 처리수에 의한 어류 병원체 소독 효과 (Disinfection effect of corona discharged plasma water on fish pathogens)

  • 유진호;이지현;문성희;권세련;박태섭;권준영
    • 한국어병학회지
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    • 제33권1호
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    • pp.63-69
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    • 2020
  • Fish culture is constantly threatened by various infectious diseases which are largely transmitted by water. Plasma technology is being used to sterilize polluted water in many industries. In this study, two bacterial pathogens Aeromonas salmonicida and Streptococcus iniae, and a virus (viral hemorrhagic septicemia virus, VHSV) were subjected to plasma water that was produced by a corona discharge system. Growth of A. salmonicida was greatly inhibited from 105.61 CFU/ml in positive control to 103.51 CFU/ml in treated group by only 60 sec contact with plasma water. Similarly, S. iniae was inhibited from 105.85 CFU/ml to 103.40 CFU/ml. VHSV titer also decreased from 104.1 TCID50/ml to 101.45 TCID50/ml by the same treatment. Activation of water by the plasma was confirmed by the existence of ozone in the plasma water. These results suggest that plasma water could efficiently disinfect fish pathogens, possibly by the action of reactive oxygen species contained in the plasma water.

Evaluation of a Dielectric Barrier Discharge Plasma System for Inactivating Pathogens on Cheese Slices

  • Lee, Hyun-Jung;Jung, Samooel;Jung, Hee-Soo;Park, Sang-Hoo;Choe, Won-Ho;Ham, Jun-Sang;Jo, Cheorun
    • Journal of Animal Science and Technology
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    • 제54권3호
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    • pp.191-198
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    • 2012
  • The objective of this study was to evaluate the potential use of a dielectric barrier discharge (DBD) plasma system to improve microbial safety of sliced cheese. The atmospheric pressure plasma (APP) effect on visual appearance and a sensory evaluation were also carried out. The number of Escherichia coli inoculated on cheese slices decreased by 0.09, 0.47, 1.16 and 1.47 log cycles with helium (4 liters/min [lpm]) and 0.05, 0.87, 1.89 and 1.98 log cycles with He/$O_2$ mixture (4 lpm/15 standard cubic centimeters per minute), after being treated with plasma for 1, 5, 10, and 15 min, respectively. Significant reductions were also observed in Staphylococcus aureus inoculated onto cheese slices ranging from 0.05 to 0.45 log cycles with He and from 0.08 to 0.91 log cycles with He/$O_2$-treated samples, respectively. Adding oxygen resulted in a significant increase in inactivation of both pathogens. No visible change in the plasma-treated cheese slices was observed even though the instrumental analysis showed a significant decrease in the $L^*$-value and an increase in the $b^*$-value. The cheese slices were damaged after 10 and 15 min of plasma treatment. In addition, significant reductions in sensory quality including flavor, odor, and acceptability of plasma-treated cheese slices were observed. The results indicate that the DBD plasma system has potential for use in sanitizing food products, although the effect was limited. Further development of the APP system is necessary for industrial use.

플라즈마를 이용한 상수원 이취미 및 독성물질 분해 연구 (Degradation of Taste-and-Odor Compounds and Toxins in Water Supply Source Using Plasma)

  • 조진오;김상돈;임병진;현영진;목영선
    • 공업화학
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    • 제24권5호
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    • pp.518-524
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    • 2013
  • 본 연구에서는 유전체 배리어 방전 플라즈마를 이용한 상수원의 이취미 및 독성물질 분해에 대하여 조사하였다. 이취미 물질로 지오스민(geosmin)과 2-methyl isoborneol (2-MIB)을 사용하였고, 독성물질로는 microcystin-LR (MC-LR), microcystin-RR (MC-RR), microcystin-YR (MC-YR), 그리고 anatoxin-a를 사용하였다. 플라즈마 반응기의 유입기체에 따른 분해 효율(반응시간 150 s 기준)은 지오스민의 경우 산소(100%) > 건조공기(96%) > 질소(5%) 순이었으며, 2-MIB의 경우에도 산소(100%) > 건조공기(94%) > 질소(2%) 순이었다. 이 결과는 이취미 물질이 주로 플라즈마 방전에 의해 생성된 산화성 성분, 특히 수명이 긴 오존에 의해 분해된다는 것을 나타낸다. 산소를 사용했을 때 지오스민과 2-MIB는 150 s 이내, microcystin류는 10 s 이내, anatoxin-a는 30 s 이내에 모두 분해되었다. 실제 호소수를 사용한 경우 증류수에서보다 이취미 및 독성물질의 분해효율보다 높게 나타났다.

RF Bias Effect of ITO Thin Films Reactively Sputtered on PET Substrates at Room Temperature

  • Kim, Hyun-Hoo;Shin, Sung-Ho
    • Transactions on Electrical and Electronic Materials
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    • 제5권3호
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    • pp.122-125
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    • 2004
  • ITO films were deposited on polyethylene terephthalate substrate by a dc reactive magnetron sputtering using rf bias without substrate heater and post-deposition thermal treatment. The dependency of rf substrate bias on plasma sputter processing was investigated to control energetic particles and improve ITO film properties. The substrate was applied negative rf bias voltage from 0 to -80 V. The composition of indium, tin, and oxygen atoms is strongly depended on the rf substrate bias. Oxygen deficiency is the highest at rf bias of -20 V. The electrical and optical properties of ITO films also are dominated obviously by negative rf bias.

Effect of Plasma Treatment with O2, Ar, and N2 Gas on Porous TiO2 for Improving Energy Conversion Efficiency of DSSC (Dye Sensitized Solar Cell)

  • 강고루;심섭;차덕준;김진태;윤주영
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제43회 하계 정기 학술대회 초록집
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    • pp.202-202
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    • 2012
  • 염료감응태양전지(DSSC)의 광변환 효율을 향상시키기 위하여 진공챔버에서 450도 고온에서 O2, Ar, and N2 혼합가스를 주입하여 다양한 plasma로 TiO2 박막을 처리하면서 소성시켰다. TiO2 표면을 cleaning하고 활성화함으로서 염료의 결합력을 향상시키는 것 외에 TiO2 내부의 oxygen vacancy를 변화를 관찰하였다. 실험에 사용한 박막은 glass 위에 FTO 박막을 입히고, 다공성 TiO2 나노입자 박막을 코팅하여 제조하였다(porous TiO2 나노입자(${\sim}12{\mu}m$)/FTO(Fluorine doped Tin oxide; $1{\mu}m$)/glass). 완성된 광전극에 대해서 XRD, XPS, EIS, FE-SEM 등을 이용하여 분석하였다. 또한 이렇게 전처리된 광전극을 사용한 DSSC를 제작하였다. 그리고 Solar-simulator를 통해 그 효율을 측정하여 '플라즈마환경에서 소성된 광전극에 대한 DSSC의 광변환효율에 미치는 효과'을 고찰하였다.

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에폭시 복합재료의 계면특성 향상에 관한 연구 (A Study on the Improvement of Interfacial Properties of Epoxy Composites)

  • 임경범;이상희;유도현;육재호;황명환;김윤선;이덕출
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2002년도 추계학술대회 논문집 전기물성,응용부문
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    • pp.124-126
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    • 2002
  • In this study, composite materials were put to dry interfacial treatment by use of plasma technology. It has been presented that the optimum parameters for the best wettability of the samples at the time of generation of plasma were oxygen atmosphere, 0.1 torr of system pressure, 100 W of discharge power, and 3 minutes of discharge time. Also, the surface resistance rate, dielectric property and tensile strength were improved.

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Effects of Growth Ambient, Process Pressure, and Heat Treatments on the Properties of RF Magnetron Sputtered GaMgZnO UV-Range Transparent Conductive Films

  • Patil, Vijay;Lee, Chesin;Lee, Byung-Teak
    • 한국재료학회지
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    • 제31권6호
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    • pp.320-324
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    • 2021
  • Effects of growth variables and post-growth annealing on the optical, structural and electrical properties of magnetron-sputtered Ga0.04Mg0.10Zn0.86O films are characterized in detail. It is observed that films grown from pure oxygen plasma showed high resistivity, ~102 Ω·cm, whereas films grown in Ar plasma showed much lower resistivity, 2.0 × 10-2 ~ 1.0 × 10-1 Ω·cm. Post-growth annealing significantly improved the electrical resistivity, to 4.3 ~ 9.0 × 10-3 Ω·cm for the vacuum annealed samples and to 1.3 ~ 3.0 × 10-3 Ω·cm for the films annealed in Zn vapor. It is proposed that these phenomena may be attributed to the improved crystalline quality and to changes in the defect chemistry. It is suggested that growth within oxygen environments leads to suppression of oxygen vacancy (Vo) donors and formation of Zn vacancy (VZn) acceptors, resulting in highly resistive films. After annealing treatment, the activation of Ga donors is enhanced, Vo donors are annihilated, and crystalline quality is improved, increasing the electron mobility and the concentration. After annealing in Zn vapor, Zn interstitial donors are introduced, further increasing the electron concentration.

Effect of Hydrogen Treatment on Electrical Properties of Hafnium Oxide for Gate Dielectric Application

  • Park, Kyu-Jeong;Shin, Woong-Chul;Yoon, Soon-Gil
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제1권2호
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    • pp.95-102
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    • 2001
  • Hafnium oxide thin films for gate dielectric were deposited at $300^{\circ}C$ on p-type Si (100) substrates by plasma enhanced chemical vapor deposition (PECVD) and annealed in $O_2$ and $N_2$ ambient at various temperatures. The effect of hydrogen treatment in 4% $H_2$ at $350^{\circ}C$ for 30 min on the electrical properties of $HfO_2$for gate dielectric was investigated. The flat-band voltage shifts of $HfO_2$capacitors annealed in $O_2$ambient are larger than those in $N_2$ambient because samples annealed in high oxygen partial pressure produces the effective negative charges in films. The oxygen loss in $HfO_2$films was expected in forming gas annealed samples and decreased the excessive oxygen contents in films as-deposited and annealed in $O_2$ or $N_2$ambient. The CET of films after hydrogen forming gas anneal almost did not vary compared with that before hydrogen gas anneal. Hysteresis of $HfO_2$films abruptly decreased by hydrogen forming gas anneal because hysteresis in C-V characteristics depends on the bulk effect rather than $HfO_2$/Si interface. The lower trap densities of films annealed in $O_2$ambient than those in $N_2$were due to the composition of interfacial layer becoming closer to $SiO_2$with increasing oxygen partial pressure. Hydrogen forming gas anneal at $350^{\circ}C$ for samples annealed at various temperatures in $O_2$and $N_2$ambient plays critical role in decreasing interface trap densities at the Si/$SiO_2$ interface. However, effect of forming gas anneal was almost disappeared for samples annealed at high temperature (about $800^{\circ}C$) in $O_2$ or $N_2$ambient.

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